Abstract
The polarization scan of both pumps in a noncollinear second-harmonic experiment is shown to be a powerful tool for identifying the different components of plane misalignment angles in a nonlinear crystal. Here, we report an optical axis misalignment as small as 1°, in a 380 μm thick 4H–SiC sample, by means of 130 fs pulsed laser of 830 nm wavelength. The optical axis misalignment is confirmed by the -ray structural analysis.
© 2013 Optical Society of America
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