Abstract

The weak strain induced by uniaxial strain device is calibrated by strain-induced second-harmonic generation (SISHG) from silicon (111) surface. Dependences of the strain-induced second-harmonic intensity on sample azimuth angle show that the strain leads to increase of SH intensity. The high consistency of the SH-measured strain and the applied strain indicates that weak strain can be accurately calibrated by SISHG. The small applied strain does not greatly affect the 3 m symmetry of silicon (111) surface, but enhances the SH intensity evidently. The bulk inversion symmetry of crystal silicon vanished under applying of uniaxial strain and this also has demonstrated by first-principles simulation. Furthermore, the theoretical relative variation of Si–Si bond length agrees exactly with the applied strain along [111] direction.

© 2013 Optical Society of America

Full Article  |  PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (4)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Tables (1)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (9)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription