Abstract

We studied numerically and experimentally the possibility of the development of a probe based on the fiber Fabry–Perot interferometer with an evanescent light source protruding directly toward the sample. It was shown that such a probe provides a spatial resolution ∼λ/40 for λ=1550  nm. The fabrication process of such a probe is described in detail.

© 2013 Optical Society of America

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  1. D. W. Pohl and W. D. M. Lanz, “Optical stethoscopy: image recording with resolution λ/20,” Appl. Phys. Lett. 44, 651–653 (1984).
    [CrossRef]
  2. U. Duerig, D. W. Pohl, and F. Rohner, “Near-field optical scanning microscopy,” J. Appl. Phys. 59, 3318–3327 (1986).
    [CrossRef]
  3. E. Betzig, M. Isaacson, and A. Lewis, “Collection mode near field scanning optical microscopy,” Appl. Phys. Lett. 51, 2088–2090 (1987).
    [CrossRef]
  4. L. Novotny and B. Hecht, Principles of Nano-Optics (Cambridge University, 2006).
  5. B. Hecht, B. Sick, U. P. Wild, V. Deckert, R. Zenobi, O. J. F. Martin, and D. W. Pohl, “Scanning near-field optical microscopy with aperture probes: fundamentals and applications,” J. Chem. Phys. 112, 7761–7774 (2000).
    [CrossRef]
  6. R. M. Stockle, N. Schaller, V. Deckert, C. Fokas, and R. Zenobi, “Brighter near-field optical probes by means of improving the optical destruction threshold,” J. Microsc. 194, 378–382 (1999).
    [CrossRef]
  7. Y. N. Kulchin, O. B. Vitrik, E. V. Pustovalov, A. A. Kuchmizhak, and A. V. Nepomnyashchiy, “Fiber-optic Fabry–Perot microresonator for near-field optical microscopy systems,” Crystallogr. Rep. 56, 866–870 (2011).
    [CrossRef]
  8. A. Taflove and S. C. Hagness, Computational Electrodynamics: The Finite-Difference Time-Domain Method (Artech House, 2000).
  9. P. B. Johnson and R. W. Christy, “Optical constants of the noble metal,” Phys. Rev. B 6, 4370–4379 (1972).
    [CrossRef]
  10. T. Pangaribuan, K. Yamada, and S. Jiang, “Reproducible fabrication technique of nanometric tip diameter fiber probe for photon scanning tunneling microscope,” Jpn. J. Appl. Phys. 31, 1302–1304 (1992).
    [CrossRef]
  11. R. Stöckle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, “High-quality near-field optical probes by tube etching,” Appl. Phys. Lett. 75, 160–162 (1999).
    [CrossRef]

2011

Y. N. Kulchin, O. B. Vitrik, E. V. Pustovalov, A. A. Kuchmizhak, and A. V. Nepomnyashchiy, “Fiber-optic Fabry–Perot microresonator for near-field optical microscopy systems,” Crystallogr. Rep. 56, 866–870 (2011).
[CrossRef]

2000

B. Hecht, B. Sick, U. P. Wild, V. Deckert, R. Zenobi, O. J. F. Martin, and D. W. Pohl, “Scanning near-field optical microscopy with aperture probes: fundamentals and applications,” J. Chem. Phys. 112, 7761–7774 (2000).
[CrossRef]

1999

R. M. Stockle, N. Schaller, V. Deckert, C. Fokas, and R. Zenobi, “Brighter near-field optical probes by means of improving the optical destruction threshold,” J. Microsc. 194, 378–382 (1999).
[CrossRef]

R. Stöckle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, “High-quality near-field optical probes by tube etching,” Appl. Phys. Lett. 75, 160–162 (1999).
[CrossRef]

1992

T. Pangaribuan, K. Yamada, and S. Jiang, “Reproducible fabrication technique of nanometric tip diameter fiber probe for photon scanning tunneling microscope,” Jpn. J. Appl. Phys. 31, 1302–1304 (1992).
[CrossRef]

1987

E. Betzig, M. Isaacson, and A. Lewis, “Collection mode near field scanning optical microscopy,” Appl. Phys. Lett. 51, 2088–2090 (1987).
[CrossRef]

1986

U. Duerig, D. W. Pohl, and F. Rohner, “Near-field optical scanning microscopy,” J. Appl. Phys. 59, 3318–3327 (1986).
[CrossRef]

1984

D. W. Pohl and W. D. M. Lanz, “Optical stethoscopy: image recording with resolution λ/20,” Appl. Phys. Lett. 44, 651–653 (1984).
[CrossRef]

1972

P. B. Johnson and R. W. Christy, “Optical constants of the noble metal,” Phys. Rev. B 6, 4370–4379 (1972).
[CrossRef]

Betzig, E.

E. Betzig, M. Isaacson, and A. Lewis, “Collection mode near field scanning optical microscopy,” Appl. Phys. Lett. 51, 2088–2090 (1987).
[CrossRef]

Christy, R. W.

P. B. Johnson and R. W. Christy, “Optical constants of the noble metal,” Phys. Rev. B 6, 4370–4379 (1972).
[CrossRef]

Deckert, V.

B. Hecht, B. Sick, U. P. Wild, V. Deckert, R. Zenobi, O. J. F. Martin, and D. W. Pohl, “Scanning near-field optical microscopy with aperture probes: fundamentals and applications,” J. Chem. Phys. 112, 7761–7774 (2000).
[CrossRef]

R. M. Stockle, N. Schaller, V. Deckert, C. Fokas, and R. Zenobi, “Brighter near-field optical probes by means of improving the optical destruction threshold,” J. Microsc. 194, 378–382 (1999).
[CrossRef]

R. Stöckle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, “High-quality near-field optical probes by tube etching,” Appl. Phys. Lett. 75, 160–162 (1999).
[CrossRef]

Duerig, U.

U. Duerig, D. W. Pohl, and F. Rohner, “Near-field optical scanning microscopy,” J. Appl. Phys. 59, 3318–3327 (1986).
[CrossRef]

Fokas, C.

R. M. Stockle, N. Schaller, V. Deckert, C. Fokas, and R. Zenobi, “Brighter near-field optical probes by means of improving the optical destruction threshold,” J. Microsc. 194, 378–382 (1999).
[CrossRef]

R. Stöckle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, “High-quality near-field optical probes by tube etching,” Appl. Phys. Lett. 75, 160–162 (1999).
[CrossRef]

Hagness, S. C.

A. Taflove and S. C. Hagness, Computational Electrodynamics: The Finite-Difference Time-Domain Method (Artech House, 2000).

Hecht, B.

B. Hecht, B. Sick, U. P. Wild, V. Deckert, R. Zenobi, O. J. F. Martin, and D. W. Pohl, “Scanning near-field optical microscopy with aperture probes: fundamentals and applications,” J. Chem. Phys. 112, 7761–7774 (2000).
[CrossRef]

R. Stöckle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, “High-quality near-field optical probes by tube etching,” Appl. Phys. Lett. 75, 160–162 (1999).
[CrossRef]

L. Novotny and B. Hecht, Principles of Nano-Optics (Cambridge University, 2006).

Isaacson, M.

E. Betzig, M. Isaacson, and A. Lewis, “Collection mode near field scanning optical microscopy,” Appl. Phys. Lett. 51, 2088–2090 (1987).
[CrossRef]

Jiang, S.

T. Pangaribuan, K. Yamada, and S. Jiang, “Reproducible fabrication technique of nanometric tip diameter fiber probe for photon scanning tunneling microscope,” Jpn. J. Appl. Phys. 31, 1302–1304 (1992).
[CrossRef]

Johnson, P. B.

P. B. Johnson and R. W. Christy, “Optical constants of the noble metal,” Phys. Rev. B 6, 4370–4379 (1972).
[CrossRef]

Kuchmizhak, A. A.

Y. N. Kulchin, O. B. Vitrik, E. V. Pustovalov, A. A. Kuchmizhak, and A. V. Nepomnyashchiy, “Fiber-optic Fabry–Perot microresonator for near-field optical microscopy systems,” Crystallogr. Rep. 56, 866–870 (2011).
[CrossRef]

Kulchin, Y. N.

Y. N. Kulchin, O. B. Vitrik, E. V. Pustovalov, A. A. Kuchmizhak, and A. V. Nepomnyashchiy, “Fiber-optic Fabry–Perot microresonator for near-field optical microscopy systems,” Crystallogr. Rep. 56, 866–870 (2011).
[CrossRef]

Lanz, W. D. M.

D. W. Pohl and W. D. M. Lanz, “Optical stethoscopy: image recording with resolution λ/20,” Appl. Phys. Lett. 44, 651–653 (1984).
[CrossRef]

Lewis, A.

E. Betzig, M. Isaacson, and A. Lewis, “Collection mode near field scanning optical microscopy,” Appl. Phys. Lett. 51, 2088–2090 (1987).
[CrossRef]

Martin, O. J. F.

B. Hecht, B. Sick, U. P. Wild, V. Deckert, R. Zenobi, O. J. F. Martin, and D. W. Pohl, “Scanning near-field optical microscopy with aperture probes: fundamentals and applications,” J. Chem. Phys. 112, 7761–7774 (2000).
[CrossRef]

Nepomnyashchiy, A. V.

Y. N. Kulchin, O. B. Vitrik, E. V. Pustovalov, A. A. Kuchmizhak, and A. V. Nepomnyashchiy, “Fiber-optic Fabry–Perot microresonator for near-field optical microscopy systems,” Crystallogr. Rep. 56, 866–870 (2011).
[CrossRef]

Novotny, L.

L. Novotny and B. Hecht, Principles of Nano-Optics (Cambridge University, 2006).

Pangaribuan, T.

T. Pangaribuan, K. Yamada, and S. Jiang, “Reproducible fabrication technique of nanometric tip diameter fiber probe for photon scanning tunneling microscope,” Jpn. J. Appl. Phys. 31, 1302–1304 (1992).
[CrossRef]

Pohl, D. W.

B. Hecht, B. Sick, U. P. Wild, V. Deckert, R. Zenobi, O. J. F. Martin, and D. W. Pohl, “Scanning near-field optical microscopy with aperture probes: fundamentals and applications,” J. Chem. Phys. 112, 7761–7774 (2000).
[CrossRef]

U. Duerig, D. W. Pohl, and F. Rohner, “Near-field optical scanning microscopy,” J. Appl. Phys. 59, 3318–3327 (1986).
[CrossRef]

D. W. Pohl and W. D. M. Lanz, “Optical stethoscopy: image recording with resolution λ/20,” Appl. Phys. Lett. 44, 651–653 (1984).
[CrossRef]

Pustovalov, E. V.

Y. N. Kulchin, O. B. Vitrik, E. V. Pustovalov, A. A. Kuchmizhak, and A. V. Nepomnyashchiy, “Fiber-optic Fabry–Perot microresonator for near-field optical microscopy systems,” Crystallogr. Rep. 56, 866–870 (2011).
[CrossRef]

Rohner, F.

U. Duerig, D. W. Pohl, and F. Rohner, “Near-field optical scanning microscopy,” J. Appl. Phys. 59, 3318–3327 (1986).
[CrossRef]

Schaller, N.

R. M. Stockle, N. Schaller, V. Deckert, C. Fokas, and R. Zenobi, “Brighter near-field optical probes by means of improving the optical destruction threshold,” J. Microsc. 194, 378–382 (1999).
[CrossRef]

Sick, B.

B. Hecht, B. Sick, U. P. Wild, V. Deckert, R. Zenobi, O. J. F. Martin, and D. W. Pohl, “Scanning near-field optical microscopy with aperture probes: fundamentals and applications,” J. Chem. Phys. 112, 7761–7774 (2000).
[CrossRef]

R. Stöckle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, “High-quality near-field optical probes by tube etching,” Appl. Phys. Lett. 75, 160–162 (1999).
[CrossRef]

Stockle, R. M.

R. M. Stockle, N. Schaller, V. Deckert, C. Fokas, and R. Zenobi, “Brighter near-field optical probes by means of improving the optical destruction threshold,” J. Microsc. 194, 378–382 (1999).
[CrossRef]

Stöckle, R.

R. Stöckle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, “High-quality near-field optical probes by tube etching,” Appl. Phys. Lett. 75, 160–162 (1999).
[CrossRef]

Taflove, A.

A. Taflove and S. C. Hagness, Computational Electrodynamics: The Finite-Difference Time-Domain Method (Artech House, 2000).

Vitrik, O. B.

Y. N. Kulchin, O. B. Vitrik, E. V. Pustovalov, A. A. Kuchmizhak, and A. V. Nepomnyashchiy, “Fiber-optic Fabry–Perot microresonator for near-field optical microscopy systems,” Crystallogr. Rep. 56, 866–870 (2011).
[CrossRef]

Wild, U. P.

B. Hecht, B. Sick, U. P. Wild, V. Deckert, R. Zenobi, O. J. F. Martin, and D. W. Pohl, “Scanning near-field optical microscopy with aperture probes: fundamentals and applications,” J. Chem. Phys. 112, 7761–7774 (2000).
[CrossRef]

R. Stöckle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, “High-quality near-field optical probes by tube etching,” Appl. Phys. Lett. 75, 160–162 (1999).
[CrossRef]

Yamada, K.

T. Pangaribuan, K. Yamada, and S. Jiang, “Reproducible fabrication technique of nanometric tip diameter fiber probe for photon scanning tunneling microscope,” Jpn. J. Appl. Phys. 31, 1302–1304 (1992).
[CrossRef]

Zenobi, R.

B. Hecht, B. Sick, U. P. Wild, V. Deckert, R. Zenobi, O. J. F. Martin, and D. W. Pohl, “Scanning near-field optical microscopy with aperture probes: fundamentals and applications,” J. Chem. Phys. 112, 7761–7774 (2000).
[CrossRef]

R. M. Stockle, N. Schaller, V. Deckert, C. Fokas, and R. Zenobi, “Brighter near-field optical probes by means of improving the optical destruction threshold,” J. Microsc. 194, 378–382 (1999).
[CrossRef]

R. Stöckle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, “High-quality near-field optical probes by tube etching,” Appl. Phys. Lett. 75, 160–162 (1999).
[CrossRef]

Appl. Phys. Lett.

D. W. Pohl and W. D. M. Lanz, “Optical stethoscopy: image recording with resolution λ/20,” Appl. Phys. Lett. 44, 651–653 (1984).
[CrossRef]

E. Betzig, M. Isaacson, and A. Lewis, “Collection mode near field scanning optical microscopy,” Appl. Phys. Lett. 51, 2088–2090 (1987).
[CrossRef]

R. Stöckle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, “High-quality near-field optical probes by tube etching,” Appl. Phys. Lett. 75, 160–162 (1999).
[CrossRef]

Crystallogr. Rep.

Y. N. Kulchin, O. B. Vitrik, E. V. Pustovalov, A. A. Kuchmizhak, and A. V. Nepomnyashchiy, “Fiber-optic Fabry–Perot microresonator for near-field optical microscopy systems,” Crystallogr. Rep. 56, 866–870 (2011).
[CrossRef]

J. Appl. Phys.

U. Duerig, D. W. Pohl, and F. Rohner, “Near-field optical scanning microscopy,” J. Appl. Phys. 59, 3318–3327 (1986).
[CrossRef]

J. Chem. Phys.

B. Hecht, B. Sick, U. P. Wild, V. Deckert, R. Zenobi, O. J. F. Martin, and D. W. Pohl, “Scanning near-field optical microscopy with aperture probes: fundamentals and applications,” J. Chem. Phys. 112, 7761–7774 (2000).
[CrossRef]

J. Microsc.

R. M. Stockle, N. Schaller, V. Deckert, C. Fokas, and R. Zenobi, “Brighter near-field optical probes by means of improving the optical destruction threshold,” J. Microsc. 194, 378–382 (1999).
[CrossRef]

Jpn. J. Appl. Phys.

T. Pangaribuan, K. Yamada, and S. Jiang, “Reproducible fabrication technique of nanometric tip diameter fiber probe for photon scanning tunneling microscope,” Jpn. J. Appl. Phys. 31, 1302–1304 (1992).
[CrossRef]

Phys. Rev. B

P. B. Johnson and R. W. Christy, “Optical constants of the noble metal,” Phys. Rev. B 6, 4370–4379 (1972).
[CrossRef]

Other

A. Taflove and S. C. Hagness, Computational Electrodynamics: The Finite-Difference Time-Domain Method (Artech House, 2000).

L. Novotny and B. Hecht, Principles of Nano-Optics (Cambridge University, 2006).

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