Abstract

A new technique of “self-referenced spectral interferometry” is demonstrated based on a self-diffraction effect and applied to the measurement of femtosecond pulses. The reference pulse is the first-order self-diffraction pulse that is generated in a thin bulk medium by the self-diffraction process from the incident pulses. A proof-of-principle experiment succeeded in characterizing a 55fs pulse at 800nm and a sub-10fs pulse at 400nm. The system can be simultaneously used to measure ultrashort pulses by the self-diffraction based on frequency-resolved optical gating.

© 2011 Optical Society of America

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