Abstract
We report the theoretical investigation of the Z-scan technique for characterizing the instantaneous Kerr nonlinearity of an optically thin multiphoton absorber. Based on the Huygens–Fresnel diffraction integral method, we study the characteristics of the closed-aperture Z-scan traces. Most importantly, we present the analytical formulae of the closed-aperture Z-scan transmittance with simultaneous Kerr effect and n-photon absorption. Besides, we demonstrate that the determination of the third-order nonlinear refractive index in multiphoton absorbers becomes timesaving yet unambiguously by the presented theory.
© 2010 Optical Society of America
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