Abstract

An analytical solution of on-axis beam propagation is presented for determining the nonlinear refraction and nonlinear absorption of a thin nonlinear medium accurately, efficiently, and simultaneously by a single Z-scan method. This result is based on the general Huygens–Fresnel principle. When applying our theoretical solution to the case without nonlinear absorption, it converges to the current formula based on the Huygens–Fresnel principle. For the first-order approximation, it agrees with the expression obtained by the Gaussian decomposition method. Because of the nonlinear absorption, the peaks of the Z-scan shape are suppressed, while the variation in the valleys depends on the nonlinear phase parameters.

© 2009 Optical Society of America

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