Abstract

A nondestructive loss-measurement method for active planar waveguides has been developed. It is based on the determination of the longitudinal distribution of fluorescence light along the waveguiding direction, obtained at different excitation wavelengths. First measurements have been performed on a 10μm thick Nd:Sc2O3 waveguiding film, deposited on a sapphire substrate by pulsed laser deposition, and on a 35μm thick diffusion-bonded Nd:YAG waveguide between sapphire layers. Their scattering losses have been determined to be (11.6±0.9) and (6.9±0.9)dBcm, respectively.

© 2007 Optical Society of America

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