Abstract

We present a new theoretical method, based on a layer-peeling algorithm, for extracting the spatial distribution of the birefringence parameters of an optical emulator. The method enables one to extract the spatial dependence of both the refractive index difference and the orientation angle of the birefringence axes. The layer-peeling algorithm is designed to minimize the accumulated error, and it enables one to accurately reconstruct the birefringence parameters even when a strong noise is added to the input data.

© 2006 Optical Society of America

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