Abstract

We describe a simple and robust technique for transmission confocal laser scanning microscopy wherein the detection pinhole is replaced by a thin second-harmonic generation crystal. The advantage of this technique is that self-aligned confocality is achieved without the need for signal descanning. We derive the point-spread function of our instrument and quantify both signal degradation and background rejection when imaging deep within a turbid slab. As an example, we consider a slab whose index of refraction fluctuations exhibit Gaussian statistics. Our model is corroborated by experiment.

© 2004 Optical Society of America

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