Abstract

The excess coincidence rate of hard x rays from a high-brilliance undulator source is considered in two cases. For spontaneously emitted radiation, the predictions of the theory are in agreement with the first definitive experimental results on excess coincidences obtained at the SPring-8 facility in Japan. As the second case, the calculations are extended to applications of coincidence counting techniques with future free-electron lasers at x-ray wavelengths. It is found that two-photon coincidence counting may provide a unique tool for studying the onset of self-amplified spontaneous emission of hard x rays.

© 2004 Optical Society of America

Full Article  |  PDF Article
More Like This
Chirped-beam two-stage free-electron laser for high-power femtosecond x-ray pulse generation

Carl B. Schroeder, Claudio Pellegrini, Sven Reiche, John Arthur, and Paul Emma
J. Opt. Soc. Am. B 19(8) 1782-1789 (2002)

X-ray free-electron lasers—present and future capabilities [Invited]

John N. Galayda, John Arthur, Daniel F. Ratner, and William E. White
J. Opt. Soc. Am. B 27(11) B106-B118 (2010)

Coherence time characterization method for hard X-ray free-electron lasers

Guanqun Zhou, Yi Jiao, Tor O. Raubenheimer, Jiuqing Wang, Aaron J. Holman, Cheng-Ying Tsai, Jerome Y. Wu, Weiwei Wu, Chuan Yang, Moohyun Yoon, and Juhao Wu
Opt. Express 28(8) 10928-10938 (2020)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (26)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription