Abstract

Temperature sensitivity of optical parameters is an important issue in developing optoelectronic devices. It can dramatically affect the optical performance of interferometric devices, such as arrayed waveguides. Applying thermal stress is a promising method to control temperature effects. In this paper, a general method to study thermal-stress effects on the temperature sensitivity of the effective refractive index is developed. The temperature sensitivities of the effective refractive index of planar waveguides and channel waveguides are obtained theoretically. The thermal-stress effects on the central-wavelength shift are discussed. It is shown that the temperature sensitivity of optical waveguides could be controlled by thermal stresses.

© 2003 Optical Society of America

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