Abstract

The use of surface plasmon resonance as a powerful tool for the nonlinear characterization of ultrathin dielectric layers is investigated and experimentally demonstrated. The off-resonant intensity-dependent refractive index of 10–200-nm-thick films of the soluble polycarbazolyldiacetylene 1,6-bis-(3,6-dihexadecyl-N-carbazolyl)-2,4-hexadiyne deposited upon silver was measured at 1064 nm and with picosecond pulses.

© 2003 Optical Society of America

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