Abstract

We present an in-depth experimental study of frequency-domain (FD) methods for measuring second-harmonic (SH) amplitude and phase spectra of surfaces by use of a 60-nm bandwidth femtosecond source and spectral dispersion of generated SH light. We directly compare FD with conventional scanning approaches, in which a narrowband laser is tuned over resonant features, by applying them to common Si1-xGex, Si1-x-yGexCy, and Si(001)SiO2Cr metal–oxide–semiconductor (MOS) samples. FD methods yield chirp-independent χ(2) amplitude spectra in good agreement with more time-consuming conventionally measured spectra. FD interferometric SH (FDISH) phase spectroscopy avoids the need for an interferometer scan at each frequency and yields detailed, reproducible phase spectra of the MOS capacitor. To validate the measured phase spectra, we reproduce their bias-dependent features in detail with a model of a resonant electric-field-induced SH polarization superposed coherently upon a field-independent background.

© 2003 Optical Society of America

Full Article  |  PDF Article
More Like This
Frequency-domain interferometric second-harmonic spectroscopy

P. T. Wilson, Y. Jiang, O. A. Aktsipetrov, E. D. Mishina, and M. C. Downer
Opt. Lett. 24(7) 496-498 (1999)

Amplitude and phase measurements of femtosecond pulses shaped by use of spectral hole burning in free-base naphthalocyanine-doped films

Sébastien Fraigne, Jean-Pierre Galaup, Jean-Louis Le Gouët, Bruno Bousquet, Lionel Canioni, Manuel Joffre, and Jean-Pierre Likforman
J. Opt. Soc. Am. B 20(7) 1555-1558 (2003)

Phase-sensitive electric-field-induced second-harmonic microscopy of metal-semiconductor junctions

K. Wu, R. Carriles, and M. C. Downer
J. Opt. Soc. Am. B 24(10) 2736-2740 (2007)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (12)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (11)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription