Abstract

We propose a near-field eclipsing Z-scan technique for the measurement of nonlinear refraction of optical materials. The technique does not require sample displacement as in previous Z-scan and eclipsing Z-scan experiments but preserves the high sensitivity of the eclipsing Z-scan method and the experimental simplicity of the Z-scan technique. As an example of the feasibility of the new technique, the dye solution’s thermal nonlinear refraction is measured with increased sensitivity in comparison with the Z-scan method.

© 1997 Optical Society of America

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1996 (1)

1995 (2)

G. R. Kumar and F. A. Rajgara, “Z-scan studies and optical limiting in a mode-locking dye,” Appl. Phys. Lett. 67, 3871–3873 (1995).

S. V. Kershaw, “Analysis of EZ scan measurement technique,” J. Mod. Opt. 42, 1361–1366 (1995).

1994 (5)

1993 (1)

A. Marcano O., G. Da Costa, and J. A. Castillo, “Geometrical interpretation of a laser-induced thermal lens,” Opt. Eng. 32, 1125–1130 (1993).

1992 (5)

1991 (1)

H. Ma, A. S. L. Gomes, and C. B. de Araujo, “Measurement of nondegenerate optical nonlinearity using a two-color single beam method,” Appl. Phys. Lett. 59, 2666–2668 (1991).

1990 (1)

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).

1974 (1)

Appl. Phys. Lett. (3)

G. R. Kumar and F. A. Rajgara, “Z-scan studies and optical limiting in a mode-locking dye,” Appl. Phys. Lett. 67, 3871–3873 (1995).

H. Ma, A. S. L. Gomes, and C. B. de Araujo, “Measurement of nondegenerate optical nonlinearity using a two-color single beam method,” Appl. Phys. Lett. 59, 2666–2668 (1991).

L. C. Oliveira and S. C. Zilio, “Single-beam time-resolved Z-scan measurements of slow absorbers,” Appl. Phys. Lett. 65, 2121–2123 (1994).

Appl. Spectrosc. (1)

Braz. J. Phys. (1)

A. Marcano O. and J. A. Castillo, “A new approach for a pump-probe photothermal experiment,” Braz. J. Phys. 22, 25–29 (1992).

Chem. Phys. (1)

J. Hein, H. Bergner, M. Lenzner, and S. Rentsch, “Determination of real and imaginary part of χ(3) of thiophene oligomers using the Z-scan technique,” Chem. Phys. 179, 543–548 (1994).

IEEE J. Quantum Electron. (1)

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).

J. Mod. Opt. (1)

S. V. Kershaw, “Analysis of EZ scan measurement technique,” J. Mod. Opt. 42, 1361–1366 (1995).

J. Opt. Soc. Am. B (1)

Opt. Eng. (1)

A. Marcano O., G. Da Costa, and J. A. Castillo, “Geometrical interpretation of a laser-induced thermal lens,” Opt. Eng. 32, 1125–1130 (1993).

Opt. Lett. (6)

Proc. SPIE (1)

A. Marcano O. and G. Da Costa, “Microstructure of the laser-induced thermal lens,” Proc. SPIE 1626, 348–353 (1992).

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