Abstract

Complex absorption spectra obtained from thin films at normal incidence can be difficult to interpret owing to the appearance of Fabry–Perot interference fringes in the data. We describe a technique for modeling such spectra so that true absorption features can be identified and evaluated separately from the overlying fringes. The technique is used to interpret data obtained from photosensitive germanosilicate solgel films on fused-silica substrates but may be easily extended to analysis in other material systems.

© 1996 Optical Society of America

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