Abstract

An experimental investigation of the electric field in the bulk of a Bi12SiO20 crystal is carried out, and a two-region model is developed that can account for the buildup of screening charges near the electrodes. In light of our results, a simple method is proposed for the determination of the effective electro-optic coefficients based on applying a sufficiently high-frequency square-wave voltage to prevent screening charge buildup. A demonstration of this method for Bi12SiO20 leads to a value of 4.4 pm/V for the stress-free (unclamped) coefficient, and a subsequent consideration of piezoelastic contributions allows the strain-free (clamped) coefficient to be estimated at 3.7 pm/V.

© 1995 Optical Society of America

Full Article  |  PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (8)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (22)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription