Abstract

We introduce a temporal delay in one beam of the two-color Z-scan apparatus, which measures nondegenerate nonlinear absorption and nondegenerate nonlinear refraction. This technique allows us to time resolve separately the sign and the magnitude of the nonlinear absorption and refraction at frequency ωp that are due to the presence of a strong excitation at frequency ωe. For example, in semiconductors we specifically measure the bound electronic, nondegenerate nonlinear refraction and nondegenerate two-photon absorption, as well as the two-photon-generated free-carrier refraction and absorption as functions of time. We demonstrate this technique on ZnSe, ZnS, and CS2, using picosecond pulses at 1.06 and 0.532 μm.

© 1994 Optical Society of America

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