Abstract

Photorefractive recording of holograms in Bi₁₂SiO₂₀, exhibiting very long lifetimes (as great as 3600 s) at near-infrared wavelengths, is reported. This behavior is observed simultaneously with the principal dynamic recording in the diffusion regime, and no applied electric field is necessary for its observation. The dependence of these long-lived holograms on various recording parameters is studied experimentally. Image-processing operations such as image addition and subtraction are performed by simultaneous reconstruction of the fast and the slow multiplexed holograms.

© 1994 Optical Society of America

Determination of the photorefractive parameters of Bi₁₂SiO₂₀ by study of the dynamic behavior of complementary gratings

L. Boutsikaris, S. Mailis, and N. A. Vainos
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Dynamic beam deflection using photorefractive gratings in Bi₁₂SiO₂₀ crystals

G. Pauliat, J. P. Herriau, A. Delboulbé, G. Roosen, and J. P. Huignard
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Holographic interferometry using −1-order diffraction in photorefractive Bi₁₂SiO₂₀ and Bi₁₂TiO₂₀ crystals

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Efficiency and polarization characteristics of photorefractive diffraction in a Bi₁₂SiO₂₀ crystal

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Experimental comparison of the ac field and the moving-grating holographic-recording techniques for Bi₁₂SiO₂₀ and Bi₁₂TiO₂₀ photorefractive crystals

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