Abstract

Relatively simple mathematical models are developed to determine the optical density as a function of the x-ray intensity, its angle of incidence, and its photon energy in the 100–10,000-eV region for monolayer and emulsion types of photographic films. Semiempirical relations are applied to characterize a monolayer film (Kodak 101-07) and an emulsion-type film (Kodak RAR 2497); these relations fit calibration data at nine photon energies well within typical experimental error.

© 1984 Optical Society of America

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