Abstract

We demonstrate that a negative-permittivity material (silicon carbide) sandwiched between two layers of positive-permittivity material (silicon oxide) can be used for enhancement of the resolution of near-field imaging via the superlensing effect. The resulting three-layer metamaterial is also shown to exhibit an enhanced transmission when its effective dielectric permittivity matches that of the vacuum. Experimental far-field diagnostics of the superlensing based on measuring transmission coefficients through the metal-coated superlens is implemented using Fourier-transformed infrared microscopy. Superlensing is shown to be a highly resonant phenomenon manifested in a narrow frequency range.

© 2006 Optical Society of America

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