We develop a generalized model to describe thin film interference in interface-specific nonlinear optical spectroscopies of ideal isotropic stratified systems that enables the separation of this effect from the individual interfacial nonlinear responses. The model utilizes a property of the transfer matrix formalism that allows for simplification of an arbitrary layered system to a single layer with newly defined coefficients of reflection and transmission. In addition to the already well known internal transfer coefficients that relate incident fields to internal fields, we define external transfer coefficients that describe how internally generated fields propagate out of the system. By applying the usual boundary conditions we are able to analytically describe the local and induced fields immediately adjacent to an arbitrary interface, followed by transfer of the generated fields out of the system. The model provides a complete and easily implemented approach to calculating the observables from interface-specific spectroscopies on arbitrary layered thin film systems in a concise way.
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