Abstract

The second-order nonlinear optical coefficients of 4H-SiC and 6H-SiC have been measured by use of two second-harmonic generation methods, the rotational Maker-fringe and wedge techniques, at the fundamental wavelength of 1.064μm. Measurements on high-quality (0001) and (112¯0) plane samples as well as rigorous analyses taking into account the multiple-reflection effects allowed us to accurately determine the magnitudes of the nonlinear optical coefficients. The obtained values are d31=6.7pmV, d15=6.5pmV, and d33=12.5pmV for 6H-SiC; and d31=6.5pmV, d15=6.7pmV, and d33=11.7pmV for 4H-SiC.

© 2009 Optical Society of America

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