## Abstract

We report an extension of the spectrally resolved two-beam coupling technique to measure the nonlinear intensity index of refraction $(n_{2}{}^{I})$ and the two-photon absorption coefficient (*β*) by use of chirped laser pulses. The linear chirp parameter *b* is incorporated into the derivation of a more general model than the previous one [Opt. Lett. **22**, 1077 (1997)]. We have also analyzed the validity of this linear chirp model through a comparison of the experimental results for fused silica with the numerically accurate calculation that considers higher-order chirps obtained by second-harmonic generation frequency-resolved optical gating. The results show that this method potentially can be used to extract the chirp. Finally, we applied this transient spectrally resolved nonlinear transmittance spectroscopy to semiconductor-doped glasses to extract their $n_{2}{}^{I}$ and *β*.

© 1999 Optical Society of America

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