Abstract
The photorefractive recording dynamics of two-beam coupling in semi-insulating semiconductors by beams with slightly different frequencies are studied theoretically and experimentally. The influences of bulk absorption, Gaussian beam profiles, and experimental geometry on the temporal response are analyzed. These effects act to narrow the bandwidth. Measurement of the material photorefractive time constant is discussed.
© 1998 Optical Society of America
Full Article | PDF ArticleMore Like This
J. G. Murillo, L. F. Magaña, M. Carrascosa, and F. Agulló-López
J. Opt. Soc. Am. B 15(7) 2092-2098 (1998)
S. X. Dou, Juntae Kim, Seungwoo Yi, Jaichul Yi, Sungdo Cha, Seung-Ho Shin, Yong Zhu, and Peixian Ye
Opt. Lett. 23(10) 753-755 (1998)
Henrik C. Pedersen, Per M. Johansen, and D. J. Webb
J. Opt. Soc. Am. B 15(5) 1528-1532 (1998)