Abstract

A two-beam polarization (TBP) interferometer with a reflection configuration for measuring the linear electro-optic coefficient is described and investigated experimentally and theoretically. It is shown that a TBP interferometer can be used for measuring the Pockels coefficient of a thin film with a strong Fabry–Perot effect. Relative errors of the simple proposed method for Pockels coefficient measurement are estimated. The TBP interferometer technique is used to measure the effective differential linear electro-optic coefficient $r_e=r_{33}-\hspace{0.5em}(n_o/n_e{)}^3{r}_{13}$ of a lead zirconate titanate thin film. The results are in agreement with known data.

© 1998 Optical Society of America

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