Abstract

A mathematical description of the reflection spectrum R(λ) of a thin dielectric layer on a transmitting substrate is represented at inclined incidence of nonpolarized or s- or p-polarized light. The finite dimensions of the substrate and its absorption are taken into account in the calculations. An approximation of the envelopes along the maxima and the minima of the spectrum, RM(λ) and Rm(λ), respectively, is performed. A way of computing the optical constants n(λ) and k(λ) and the thickness d of the layer of the envelopes RM(λ) and Rm(λ) is proposed. The computation of the optical constants of the layer for a model of an optical system shows that, for angles of incidence Φ smaller than the Brewster angle Φb, a high accuracy of the computed results is achieved.

© 1991 Optical Society of America

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