Abstract

An inversion algorithm, based on the Kirchhoff approximation, for the reconstruction of a rough-surface profile from measurements of the scattered field is described. It is shown that the data can be related to the surface profile through a Fourier-transform relationship by a specific choice of data and so lead to a simple fast-Fourier-transform-based procedure. The algorithm is illustrated through the use of numerical results.

© 1991 Optical Society of America

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