Abstract

An experimental method for determining the optical constants n and k of absorbing isotropic materials is presented. The calculation of the optical properties is based on the measurement of the oblique-incidence reflectance at different angles, and precise evaluation of the degree of polarization of the ultraviolet synchrotron radiation. The technique is applied to the calculation of the optical constants of thin films of thallium in the energy region of absorption (k ≠ 0), near the 5d-shell excitation threshold (between 900 and 1000 Å). The obtained values of n and k present an average error of better than ±0.005.

© 1988 Optical Society of America

Determination of the optical properties of absorbing uniaxial crystals from multiangle reflectance with polarized synchrotron radiation

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