Abstract

Conventional structured illumination microscopy (SIM) utilizes a sinusoidal excitation pattern of frequency within the detection passband and provides a maximum of twofold resolution enhancement over the diffraction limit. A transmission approach proposed in an earlier publication [J. Phys. D 53, 044006 (2019) [CrossRef]  ] to further improve the lateral resolution requires sequential higher frequency illumination patterns. However, the existing reconstruction algorithms fail to deliver appropriate reconstruction when the excitation frequency lies far from the passband boundary. Here, we present a correlation-based SIM reconstruction approach for sequential high-frequency illumination patterns even if the pattern frequency lies far from the passband limit. The scheme can be suitably implemented in a variety of custom-built systems where illumination frequency lies beyond the passband support (e.g., non-linear SIM and plasmonic SIM).

© 2021 Optical Society of America

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Supplementary Material (1)

NameDescription
Supplement 1       Raw frames (S1-S3); isotropic resolution (S4); effect of photon level (S5-S6).

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Data underlying the results presented in this paper are not publicly available at this time but may be obtained from the authors upon reasonable request.

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