Abstract

Focusing light onto nanostructures thanks to spherical lenses is a first step in enhancing the field and is widely used in applications. Nonetheless, the electromagnetic response of such nanostructures, which have subwavelength patterns, to a focused beam cannot be described by the simple ray tracing formalism. Here, we present a method for computing the response to a focused beam, based on the B-spline modal method adapted to nanostructures in conical mounting. The eigenmodes are computed in each layer for both polarizations and are then combined for the computation of scattering matrices. The simulation of a Gaussian focused beam is obtained thanks to a truncated decomposition into plane waves computed on a single period, which limits the computation burden.

© 2014 Optical Society of America

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