Abstract

Multichanneled imaging systems rely on nonredundant images recorded by an array of low-resolution imagers to enable construction of a high-resolution image. We show how the varying degree of redundancy associated with imaging throughout the imaged volume effects image quality. Using ray-traced image simulations and a metric used as a proxy for human perception, we show that robust recovery of high-resolution images can be obtained by avoiding excessive redundancy and that this is a felicitous consequence of typical manufacturing tolerances.

© 2012 Optical Society of America

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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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2009 (1)

G. Muyo and A. Harvey, “The effect of detector sampling in wavefront-coded imaging systems,” J. Opt. A 11, 054002 (2009).
[CrossRef]

2008 (4)

2007 (2)

2006 (1)

2005 (1)

R. Driggers, K. Krapels, S. Murrill, S. Young, M. Thielke, and J. Schuler, “Superresolution performance for undersampled imagers,” Opt. Eng. 44, 014002 (2005).
[CrossRef]

2004 (2)

Z. Wang, A. Bovik, H. Sheikh, and E. Simoncelli, “Image quality assessment: From error visibility to structural similarity,” IEEE Trans. Image Process. 13, 600–612 (2004).
[CrossRef]

S. Young, “Alias-free image subsampling using Fourier-based windowing methods,” Opt. Eng. 43, 843–855 (2004).
[CrossRef]

2003 (1)

S. Park, M. Park, and M. Kang, “Super-resolution image reconstruction: a technical overview,” IEEE Signal Process. Mag. 20, 21–36 (2003).
[CrossRef]

2001 (1)

1982 (1)

W. Wittenstein, J. Fontanella, A. Newbery, and J. Baars, “The definition of the OTF and the measurement of aliasing for sampled imaging systems,” J. Mod. Opt. 29, 41–50 (1982).

Ackerman, J.

Ashok, A.

Baars, J.

W. Wittenstein, J. Fontanella, A. Newbery, and J. Baars, “The definition of the OTF and the measurement of aliasing for sampled imaging systems,” J. Mod. Opt. 29, 41–50 (1982).

Boreman, G.

G. Boreman, Modulation Transfer Function in Optical and Electro-Optical Systems (SPIE, 2001).

Bovik, A.

Z. Wang, A. Bovik, H. Sheikh, and E. Simoncelli, “Image quality assessment: From error visibility to structural similarity,” IEEE Trans. Image Process. 13, 600–612 (2004).
[CrossRef]

Brady, D.

Carriere, J.

Chen, C.

Choi, K.

Driggers, R.

R. Driggers, K. Krapels, S. Murrill, S. Young, M. Thielke, and J. Schuler, “Superresolution performance for undersampled imagers,” Opt. Eng. 44, 014002 (2005).
[CrossRef]

R. Vollmerhausen and R. Driggers, Analysis of Sampled Imaging Systems (SPIE, 2000).

Fleet, E.

Fontanella, J.

W. Wittenstein, J. Fontanella, A. Newbery, and J. Baars, “The definition of the OTF and the measurement of aliasing for sampled imaging systems,” J. Mod. Opt. 29, 41–50 (1982).

Gibbons, R.

Harvey, A.

G. Muyo and A. Harvey, “The effect of detector sampling in wavefront-coded imaging systems,” J. Opt. A 11, 054002 (2009).
[CrossRef]

Horisaki, R.

R. Horisaki, Y. Nakao, T. Toyoda, K. Kagawa, Y. Masaki, and J. Tanida, “A compound-eye imaging system with irregular lens-array arrangement,” Proc. SPIE 7072, 1–9 (2008).

Ichioka, Y.

Ishida, K.

Kagawa, K.

R. Horisaki, Y. Nakao, T. Toyoda, K. Kagawa, Y. Masaki, and J. Tanida, “A compound-eye imaging system with irregular lens-array arrangement,” Proc. SPIE 7072, 1–9 (2008).

Kanaev, A.

Kang, M.

S. Park, M. Park, and M. Kang, “Super-resolution image reconstruction: a technical overview,” IEEE Signal Process. Mag. 20, 21–36 (2003).
[CrossRef]

Kolste, R.

Kondou, N.

Krapels, K.

R. Driggers, K. Krapels, S. Murrill, S. Young, M. Thielke, and J. Schuler, “Superresolution performance for undersampled imagers,” Opt. Eng. 44, 014002 (2005).
[CrossRef]

Kumagai, T.

Masaki, Y.

R. Horisaki, Y. Nakao, T. Toyoda, K. Kagawa, Y. Masaki, and J. Tanida, “A compound-eye imaging system with irregular lens-array arrangement,” Proc. SPIE 7072, 1–9 (2008).

Miyatake, S.

Miyazaki, D.

Morimoto, T.

Murrill, S.

R. Driggers, K. Krapels, S. Murrill, S. Young, M. Thielke, and J. Schuler, “Superresolution performance for undersampled imagers,” Opt. Eng. 44, 014002 (2005).
[CrossRef]

Muyo, G.

G. Muyo and A. Harvey, “The effect of detector sampling in wavefront-coded imaging systems,” J. Opt. A 11, 054002 (2009).
[CrossRef]

Nakao, Y.

R. Horisaki, Y. Nakao, T. Toyoda, K. Kagawa, Y. Masaki, and J. Tanida, “A compound-eye imaging system with irregular lens-array arrangement,” Proc. SPIE 7072, 1–9 (2008).

Neifeld, M. A.

Newbery, A.

W. Wittenstein, J. Fontanella, A. Newbery, and J. Baars, “The definition of the OTF and the measurement of aliasing for sampled imaging systems,” J. Mod. Opt. 29, 41–50 (1982).

Nitta, K.

Park, M.

S. Park, M. Park, and M. Kang, “Super-resolution image reconstruction: a technical overview,” IEEE Signal Process. Mag. 20, 21–36 (2003).
[CrossRef]

Park, S.

S. Park, M. Park, and M. Kang, “Super-resolution image reconstruction: a technical overview,” IEEE Signal Process. Mag. 20, 21–36 (2003).
[CrossRef]

Pitsianis, N.

Portnoy, A.

Prather, D.

Schuler, J.

R. Driggers, K. Krapels, S. Murrill, S. Young, M. Thielke, and J. Schuler, “Superresolution performance for undersampled imagers,” Opt. Eng. 44, 014002 (2005).
[CrossRef]

Schulz, T.

Scribner, D.

Shankar, M.

Sheikh, H.

Z. Wang, A. Bovik, H. Sheikh, and E. Simoncelli, “Image quality assessment: From error visibility to structural similarity,” IEEE Trans. Image Process. 13, 600–612 (2004).
[CrossRef]

Shogenji, R.

Simoncelli, E.

Z. Wang, A. Bovik, H. Sheikh, and E. Simoncelli, “Image quality assessment: From error visibility to structural similarity,” IEEE Trans. Image Process. 13, 600–612 (2004).
[CrossRef]

Sun, X.

Tanida, J.

Thielke, M.

R. Driggers, K. Krapels, S. Murrill, S. Young, M. Thielke, and J. Schuler, “Superresolution performance for undersampled imagers,” Opt. Eng. 44, 014002 (2005).
[CrossRef]

Toyoda, T.

R. Horisaki, Y. Nakao, T. Toyoda, K. Kagawa, Y. Masaki, and J. Tanida, “A compound-eye imaging system with irregular lens-array arrangement,” Proc. SPIE 7072, 1–9 (2008).

Vollmerhausen, R.

R. Vollmerhausen and R. Driggers, Analysis of Sampled Imaging Systems (SPIE, 2000).

Wang, Z.

Z. Wang, A. Bovik, H. Sheikh, and E. Simoncelli, “Image quality assessment: From error visibility to structural similarity,” IEEE Trans. Image Process. 13, 600–612 (2004).
[CrossRef]

Willett, R.

Wittenstein, W.

W. Wittenstein, J. Fontanella, A. Newbery, and J. Baars, “The definition of the OTF and the measurement of aliasing for sampled imaging systems,” J. Mod. Opt. 29, 41–50 (1982).

Yamada, K.

Young, S.

R. Driggers, K. Krapels, S. Murrill, S. Young, M. Thielke, and J. Schuler, “Superresolution performance for undersampled imagers,” Opt. Eng. 44, 014002 (2005).
[CrossRef]

S. Young, “Alias-free image subsampling using Fourier-based windowing methods,” Opt. Eng. 43, 843–855 (2004).
[CrossRef]

Appl. Opt. (6)

IEEE Signal Process. Mag. (1)

S. Park, M. Park, and M. Kang, “Super-resolution image reconstruction: a technical overview,” IEEE Signal Process. Mag. 20, 21–36 (2003).
[CrossRef]

IEEE Trans. Image Process. (1)

Z. Wang, A. Bovik, H. Sheikh, and E. Simoncelli, “Image quality assessment: From error visibility to structural similarity,” IEEE Trans. Image Process. 13, 600–612 (2004).
[CrossRef]

J. Mod. Opt. (1)

W. Wittenstein, J. Fontanella, A. Newbery, and J. Baars, “The definition of the OTF and the measurement of aliasing for sampled imaging systems,” J. Mod. Opt. 29, 41–50 (1982).

J. Opt. A (1)

G. Muyo and A. Harvey, “The effect of detector sampling in wavefront-coded imaging systems,” J. Opt. A 11, 054002 (2009).
[CrossRef]

Opt. Eng. (2)

S. Young, “Alias-free image subsampling using Fourier-based windowing methods,” Opt. Eng. 43, 843–855 (2004).
[CrossRef]

R. Driggers, K. Krapels, S. Murrill, S. Young, M. Thielke, and J. Schuler, “Superresolution performance for undersampled imagers,” Opt. Eng. 44, 014002 (2005).
[CrossRef]

Opt. Lett. (1)

Proc. SPIE (1)

R. Horisaki, Y. Nakao, T. Toyoda, K. Kagawa, Y. Masaki, and J. Tanida, “A compound-eye imaging system with irregular lens-array arrangement,” Proc. SPIE 7072, 1–9 (2008).

Other (3)

G. Boreman, Modulation Transfer Function in Optical and Electro-Optical Systems (SPIE, 2001).

R. Vollmerhausen and R. Driggers, Analysis of Sampled Imaging Systems (SPIE, 2000).

ZEMAX Corporation, “ZEMAX-EE(32bit),” Version: April 14 (2010).

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