J. E. Harvey, N. Choi, A. Krywonos, S. Schroder, and D. H. Penalver, “Scattering from moderately rough interfaces between two arbitrary media,” Proc. SPIE 7794, 77940V (2010).

[CrossRef]

J. E. Harvey, A. Krywonos, G. Peterson, and M. Bruner, “Image Degradation due to scattering effects in two-mirror telescopes,” Opt. Eng. 49, 063202 (2010).

[CrossRef]

D. Domine, F. J. Haug, C. Battaglia, and C. Ballif, “Modeling of light scattering from micro- and nanotextured surfaces,” J. Appl. Phys. 107, 044504 (2010).

[CrossRef]

J. E. Harvey, N. Choi, A. Krywonos, and J. Marcen, “Calculating BRDFs from surface PSDs for moderately rough optical surfaces,” Proc. SPIE 7426, 742601 (2009).

[CrossRef]

J. C. Stover and J. E. Harvey, “Limitations of Rayleigh-Rice perturbation theory for describing surface scatter,” Proc. SPIE 6672, 66720B (2007).

[CrossRef]

J. E. Harvey, A. Krywonos, and J. C. Stover “Unified scatter model for rough surfaces at large incident and scatter angles,” Proc. SPIE 6672, 66720C (2007).

[CrossRef]

J. E. Harvey, A. Krywonos, and C. L. Vernold, “Modified Beckmann-Kirchhoff scattering model for rough surfaces with large incident and scattered angles,” Opt. Eng. 46, 078002 (2007). One of the ten most frequently downloaded SPIE papers and articles (from SPIE Digital Library) in August 2007.

[CrossRef]

H. Ragheb and E. Hancock, “The modified Beckmann-Kirchhoff scattering theory for rough surface analysis,” Pattern Recog. 40, 2004–2020 (2007).

[CrossRef]

Y. Sun, “Statistical ray method for deriving reflection models of rough surfaces,” J. Opt. Soc. Am. A 24, 724–744 (2007).

[CrossRef]

J. E. Harvey, A. Krywonos, and Dijana Bogunovic, “Non-paraxial scalar treatment of sinusoidal phase gratings,” J. Opt. Soc. Am. A 23, 858–865 (2006).

[CrossRef]

H. Ragheb and E. R. Hancock, “Testing new variants of the Beckmann-Kirchhoff model against radiance data,” Comput. Vis. Image Understanding 102, 145–168 (2006).

[CrossRef]

M. G. Dittman, “K-correlation power spectral density and surface scatter model,” Proc. SPIE 6291, 62910P (2006).

[CrossRef]

J. E. Harvey and A. Krywonos, “Radiance: the natural quantity for describing diffraction and propagation,” Proc. SPIE 6285, 628503 (2006).

[CrossRef]

A. Robles-Kelly and E. R. Hancock, “Estimating the surface radiance function from single images,” Graph. Models 67, 518–548 (2005).

[CrossRef]

H. Ragheb and E. R. Hancock, “Surface radiance correction for shape from shading,” Pattern Recog. 38, 1574–1595 (2005).

[CrossRef]

S. Schröder, S. Gliech, and A. Duparre, “Measurement system to determine the total and angle-resolved light scattering of optical components in the deep-ultraviolet and vacuum-ultraviolet spectral regions,” Appl. Opt. 44, 6093–6107 (2005).

[CrossRef]
[PubMed]

J. E. Harvey, “Scattering effects in x-ray imaging systems,” Proc. SPIE 2515, 246–272 (1995).

[CrossRef]

E. L. Church and P. Z. Takacs, “The optimal estimation of finish parameters,” Proc SPIE 1530, 71–86 (1991).

[CrossRef]

E. L. Church, P. Z. Takacs, and T. A. Leonard, “The prediction of BRDFs from surface profile measurements,” Proc. SPIE 1165, 136–150 (1989).

E. L. Church and P. Z. Takacs, “Effects of the optical transfer function in surface profile measurements,” Proc. SPIE 1164, 46–59 (1989).

J. E. Harvey, “Surface scatter phenomena: a linear, shift-invariant process,” Proc. SPIE 1165, 87–99 (1989).

E. L. Church and P. Z. Takacs, “Instrumental effects in surface finish measurements,” Proc. SPIE 1009, 46–55 (1988).

E. L. Church, “Fractal surface finish,” Appl. Opt. 27, 1518–1526(1988).

[CrossRef]
[PubMed]

J. E. Harvey, E. C. Moran, and W. P. Zmek, “Transfer function characterization of grazing incidence optical systems,” Appl. Opt. 27, 1527–1533 (1988).

[CrossRef]
[PubMed]

P. Glenn, P. Reid, A. Slomba, and L. P. Van Speybroeck, “Performance prediction of AXAF technology mirror assembly using measured mirror surface errors,” Appl. Opt. 27, 1539–1543(1988).

[CrossRef]
[PubMed]

R. J. Noll, “Effect of mid and high spatial frequencies on optical performance,” Opt. Eng. 18, 137–142 (1979).

E. L. Church, H. A. Jenkinson, and J. M. Zavada, “Relationship between surface scattering and microtopographic features,” Opt. Eng. 18, 125–136 (1979).

H. Davies, “The reflection of electromagnetic waves from a rough surface,” Proc. IEE IV 101, 209–214 (1954).

[CrossRef]

S. O. Rice, “Reflection of electromagnetic waves from slightly rough surfaces,” Commun. Pure Appl. Math. 4, 351–378 (1951).

[CrossRef]

D. Domine, F. J. Haug, C. Battaglia, and C. Ballif, “Modeling of light scattering from micro- and nanotextured surfaces,” J. Appl. Phys. 107, 044504 (2010).

[CrossRef]

D. Domine, F. J. Haug, C. Battaglia, and C. Ballif, “Modeling of light scattering from micro- and nanotextured surfaces,” J. Appl. Phys. 107, 044504 (2010).

[CrossRef]

P. Beckmann and A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces (Pergamon, 1963).

A. Duparré, J. Ferre-Borrull, S. Gliech, G. Notni, J. Steinert, and J. M. Bennett, “Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components,” Appl. Opt. 41, 154–171(2002).

[CrossRef]
[PubMed]

J. M. Elson, J. M. Bennett, and J. C. Stover, “Wavelength and Angular Dependence of light scattering from beryllium: comparison of theory and experiment,” Appl. Opt. 32, 3362–3376(1993).

[CrossRef]
[PubMed]

J. M. Bennett and L. Mattsson, Introduction to Surface Roughness and Scattering (Optical Society of America, 1989).

R. W. Boyd, Radiometry and the Detection of Optical Radiation (Wiley, 1983).

J. E. Harvey, A. Krywonos, G. Peterson, and M. Bruner, “Image Degradation due to scattering effects in two-mirror telescopes,” Opt. Eng. 49, 063202 (2010).

[CrossRef]

J. E. Harvey, N. Choi, A. Krywonos, S. Schroder, and D. H. Penalver, “Scattering from moderately rough interfaces between two arbitrary media,” Proc. SPIE 7794, 77940V (2010).

[CrossRef]

J. E. Harvey, N. Choi, A. Krywonos, and J. Marcen, “Calculating BRDFs from surface PSDs for moderately rough optical surfaces,” Proc. SPIE 7426, 742601 (2009).

[CrossRef]

E. L. Church and P. Z. Takacs, “The optimal estimation of finish parameters,” Proc SPIE 1530, 71–86 (1991).

[CrossRef]

E. L. Church, P. Z. Takacs, and T. A. Leonard, “The prediction of BRDFs from surface profile measurements,” Proc. SPIE 1165, 136–150 (1989).

E. L. Church and P. Z. Takacs, “Effects of the optical transfer function in surface profile measurements,” Proc. SPIE 1164, 46–59 (1989).

E. L. Church and P. Z. Takacs, “Instrumental effects in surface finish measurements,” Proc. SPIE 1009, 46–55 (1988).

E. L. Church, “Fractal surface finish,” Appl. Opt. 27, 1518–1526(1988).

[CrossRef]
[PubMed]

E. L. Church, H. A. Jenkinson, and J. M. Zavada, “Relationship between surface scattering and microtopographic features,” Opt. Eng. 18, 125–136 (1979).

H. Davies, “The reflection of electromagnetic waves from a rough surface,” Proc. IEE IV 101, 209–214 (1954).

[CrossRef]

M. G. Dittman, “K-correlation power spectral density and surface scatter model,” Proc. SPIE 6291, 62910P (2006).

[CrossRef]

D. Domine, F. J. Haug, C. Battaglia, and C. Ballif, “Modeling of light scattering from micro- and nanotextured surfaces,” J. Appl. Phys. 107, 044504 (2010).

[CrossRef]

S. Fay, S. Dubail, U. Kroll, J. Meier, Y. Ziegler, and A. Shah, “Light trapping enhancement for thin-film silicon solar cells by roughness improvement of the ZnC front TCO,” in Proceedings of the 16th European Photovoltaic Solar Energy Conference & Exhibition (WIP Wirtschaft und Infrastruktur Planungs-KG, 2000), pp. 361–364.

A. Duparré, J. Ferre-Borrull, S. Gliech, G. Notni, J. Steinert, and J. M. Bennett, “Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components,” Appl. Opt. 41, 154–171(2002).

[CrossRef]
[PubMed]

S. Schröder, A. Duparré, K. Füchsel, N. Kaiser, A. Tünnermann, and J. E. Harvey, “Scattering of roughened TCO films—modeling and measurement,” in OSA Topical Meeting on Optical Interference Coatings, OSA Technical Digest (CD) (2010).

T. M. Elfouhaily and C. A. Guerin, “A critical survey of approximate scattering wave theories from random rough surfaces,” Waves Random Media 14, R1–R40 (2004).

[CrossRef]

P. Hermansson, G. Forssell, and J. Fagerstrom, “A review of models for scattering from rough Surfaces,” Scientific Report FOI-R-0988-SE (Swedish Defense Research Agency, Nov. 2003).

S. Fay, S. Dubail, U. Kroll, J. Meier, Y. Ziegler, and A. Shah, “Light trapping enhancement for thin-film silicon solar cells by roughness improvement of the ZnC front TCO,” in Proceedings of the 16th European Photovoltaic Solar Energy Conference & Exhibition (WIP Wirtschaft und Infrastruktur Planungs-KG, 2000), pp. 361–364.

P. Hermansson, G. Forssell, and J. Fagerstrom, “A review of models for scattering from rough Surfaces,” Scientific Report FOI-R-0988-SE (Swedish Defense Research Agency, Nov. 2003).

S. Schröder, A. Duparré, K. Füchsel, N. Kaiser, A. Tünnermann, and J. E. Harvey, “Scattering of roughened TCO films—modeling and measurement,” in OSA Topical Meeting on Optical Interference Coatings, OSA Technical Digest (CD) (2010).

J. D. Gaskill, Linear Systems, Fourier Transforms, and Optics (Wiley, 1978).

S. Schröder, S. Gliech, and A. Duparre, “Measurement system to determine the total and angle-resolved light scattering of optical components in the deep-ultraviolet and vacuum-ultraviolet spectral regions,” Appl. Opt. 44, 6093–6107 (2005).

[CrossRef]
[PubMed]

A. Duparré, J. Ferre-Borrull, S. Gliech, G. Notni, J. Steinert, and J. M. Bennett, “Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components,” Appl. Opt. 41, 154–171(2002).

[CrossRef]
[PubMed]

J. W. Goodman, Introduction to Fourier Optics, 2nd ed. (McGraw-Hill, 1996).

T. M. Elfouhaily and C. A. Guerin, “A critical survey of approximate scattering wave theories from random rough surfaces,” Waves Random Media 14, R1–R40 (2004).

[CrossRef]

A. J. S. Hamilton, “Uncorrelated modes of nonlinear power spectrum,” Mon. Not. R. Astron. Soc. 312, 257–284 (2000).

[CrossRef]

H. Ragheb and E. Hancock, “The modified Beckmann-Kirchhoff scattering theory for rough surface analysis,” Pattern Recog. 40, 2004–2020 (2007).

[CrossRef]

H. Ragheb and E. R. Hancock, “Testing new variants of the Beckmann-Kirchhoff model against radiance data,” Comput. Vis. Image Understanding 102, 145–168 (2006).

[CrossRef]

A. Robles-Kelly and E. R. Hancock, “Estimating the surface radiance function from single images,” Graph. Models 67, 518–548 (2005).

[CrossRef]

H. Ragheb and E. R. Hancock, “Surface radiance correction for shape from shading,” Pattern Recog. 38, 1574–1595 (2005).

[CrossRef]

H. Ragheb and E. R. Hancock, “Rough surface correction and re-illumination using the modified Beckmann model,” in Computer Analysis of Images and Patterns: 10th International Conference, Proceedings, Vol. 2756 of Lecture Notes in Computer Science (Springer-Verlag, 2003), pp. 98–106.

H. Ragheb and E. R. Hancock, “Rough surface estimation using the Kirchhoff model,” in Image Analysis, Proceedings, Vol. 2749 of Lecture Notes in Computer Science (Springer-Verlag, 2003), pp. 477–484.

H. Ragheb and E. R. Hancock, “Adding subsurface attenuation to the Beckmann-Kirchhoff theory,” in Pattern Recognition and Image Analysis, Part 2, Vol. 3523 of Lecture Notes in Computer Science (Springer-Verlag, 2005), pp. 247–254.

[CrossRef]

A. Robles-Kelly and E. R. Hancock, “Radiance function estimation for object classification,” in Progress in Pattern Recognition, Image Analysis and Applications, Vol. 3287 of Lecture Notes in Computer Science (Springer-Verlag, 2004), pp. 67–75.

[CrossRef]

J. E. Harvey, A. Krywonos, G. Peterson, and M. Bruner, “Image Degradation due to scattering effects in two-mirror telescopes,” Opt. Eng. 49, 063202 (2010).

[CrossRef]

J. E. Harvey, N. Choi, A. Krywonos, S. Schroder, and D. H. Penalver, “Scattering from moderately rough interfaces between two arbitrary media,” Proc. SPIE 7794, 77940V (2010).

[CrossRef]

J. E. Harvey, N. Choi, A. Krywonos, and J. Marcen, “Calculating BRDFs from surface PSDs for moderately rough optical surfaces,” Proc. SPIE 7426, 742601 (2009).

[CrossRef]

J. E. Harvey, A. Krywonos, and J. C. Stover “Unified scatter model for rough surfaces at large incident and scatter angles,” Proc. SPIE 6672, 66720C (2007).

[CrossRef]

J. C. Stover and J. E. Harvey, “Limitations of Rayleigh-Rice perturbation theory for describing surface scatter,” Proc. SPIE 6672, 66720B (2007).

[CrossRef]

J. E. Harvey, A. Krywonos, and C. L. Vernold, “Modified Beckmann-Kirchhoff scattering model for rough surfaces with large incident and scattered angles,” Opt. Eng. 46, 078002 (2007). One of the ten most frequently downloaded SPIE papers and articles (from SPIE Digital Library) in August 2007.

[CrossRef]

J. E. Harvey and A. Krywonos, “Radiance: the natural quantity for describing diffraction and propagation,” Proc. SPIE 6285, 628503 (2006).

[CrossRef]

J. E. Harvey, A. Krywonos, and Dijana Bogunovic, “Non-paraxial scalar treatment of sinusoidal phase gratings,” J. Opt. Soc. Am. A 23, 858–865 (2006).

[CrossRef]

J. E. Harvey, C. L. Vernold, A. Krywonos, and P. L. Thompson, “Diffracted radiance: a fundamental quantity in a nonparaxial scalar diffraction theory: errata,” Appl. Opt. 39, 6374–6375(2000).

[CrossRef]

J. E. Harvey, C. L. Vernold, A. Krywonos, and P. L. Thompson, “Diffracted radiance: a fundamental quantity in a non-paraxial scalar diffraction theory,” Appl. Opt. 38, 6469–6481 (1999).

[CrossRef]

J. E. Harvey and P. L. Thompson, “Generalized Wolter Type I design for the solar x-ray imager (SXI),” Proc. SPIE 3766, 173–183 (1999).

[CrossRef]

C. L. Vernold and J. E. Harvey, “A modified Beckmann-Kirchhoff scattering theory,” Proc. SPIE 3426, 51–56 (1998).

[CrossRef]

J. E. Harvey and C. L. Vernold, “Description of diffraction grating behavior in direction cosine space,” Appl. Opt. 37, 8158–8160 (1998).

[CrossRef]

J. E. Harvey, “Scattering effects in x-ray imaging systems,” Proc. SPIE 2515, 246–272 (1995).

[CrossRef]

J. E. Harvey, “Surface scatter phenomena: a linear, shift-invariant process,” Proc. SPIE 1165, 87–99 (1989).

J. E. Harvey, E. C. Moran, and W. P. Zmek, “Transfer function characterization of grazing incidence optical systems,” Appl. Opt. 27, 1527–1533 (1988).

[CrossRef]
[PubMed]

S. Schröder, A. Duparré, K. Füchsel, N. Kaiser, A. Tünnermann, and J. E. Harvey, “Scattering of roughened TCO films—modeling and measurement,” in OSA Topical Meeting on Optical Interference Coatings, OSA Technical Digest (CD) (2010).

J. E. Harvey, “Light-scattering characteristics of optical surfaces,” Ph.D. dissertation (University of Arizona, 1976).

J. E. Harvey, “Bridging the gap between “figure” and “finish”,” presented at the Optical Society of America Optical Fabrication and Testing Meeting, Boston, Massachusetts, May 3, 1996.

D. Domine, F. J. Haug, C. Battaglia, and C. Ballif, “Modeling of light scattering from micro- and nanotextured surfaces,” J. Appl. Phys. 107, 044504 (2010).

[CrossRef]

P. Hermansson, G. Forssell, and J. Fagerstrom, “A review of models for scattering from rough Surfaces,” Scientific Report FOI-R-0988-SE (Swedish Defense Research Agency, Nov. 2003).

E. L. Church, H. A. Jenkinson, and J. M. Zavada, “Relationship between surface scattering and microtopographic features,” Opt. Eng. 18, 125–136 (1979).

S. Schröder, A. Duparré, K. Füchsel, N. Kaiser, A. Tünnermann, and J. E. Harvey, “Scattering of roughened TCO films—modeling and measurement,” in OSA Topical Meeting on Optical Interference Coatings, OSA Technical Digest (CD) (2010).

S. Fay, S. Dubail, U. Kroll, J. Meier, Y. Ziegler, and A. Shah, “Light trapping enhancement for thin-film silicon solar cells by roughness improvement of the ZnC front TCO,” in Proceedings of the 16th European Photovoltaic Solar Energy Conference & Exhibition (WIP Wirtschaft und Infrastruktur Planungs-KG, 2000), pp. 361–364.

J. E. Harvey, A. Krywonos, G. Peterson, and M. Bruner, “Image Degradation due to scattering effects in two-mirror telescopes,” Opt. Eng. 49, 063202 (2010).

[CrossRef]

J. E. Harvey, N. Choi, A. Krywonos, S. Schroder, and D. H. Penalver, “Scattering from moderately rough interfaces between two arbitrary media,” Proc. SPIE 7794, 77940V (2010).

[CrossRef]

J. E. Harvey, N. Choi, A. Krywonos, and J. Marcen, “Calculating BRDFs from surface PSDs for moderately rough optical surfaces,” Proc. SPIE 7426, 742601 (2009).

[CrossRef]

J. E. Harvey, A. Krywonos, and J. C. Stover “Unified scatter model for rough surfaces at large incident and scatter angles,” Proc. SPIE 6672, 66720C (2007).

[CrossRef]

J. E. Harvey, A. Krywonos, and C. L. Vernold, “Modified Beckmann-Kirchhoff scattering model for rough surfaces with large incident and scattered angles,” Opt. Eng. 46, 078002 (2007). One of the ten most frequently downloaded SPIE papers and articles (from SPIE Digital Library) in August 2007.

[CrossRef]

J. E. Harvey and A. Krywonos, “Radiance: the natural quantity for describing diffraction and propagation,” Proc. SPIE 6285, 628503 (2006).

[CrossRef]

J. E. Harvey, A. Krywonos, and Dijana Bogunovic, “Non-paraxial scalar treatment of sinusoidal phase gratings,” J. Opt. Soc. Am. A 23, 858–865 (2006).

[CrossRef]

J. E. Harvey, C. L. Vernold, A. Krywonos, and P. L. Thompson, “Diffracted radiance: a fundamental quantity in a nonparaxial scalar diffraction theory: errata,” Appl. Opt. 39, 6374–6375(2000).

[CrossRef]

J. E. Harvey, C. L. Vernold, A. Krywonos, and P. L. Thompson, “Diffracted radiance: a fundamental quantity in a non-paraxial scalar diffraction theory,” Appl. Opt. 38, 6469–6481 (1999).

[CrossRef]

A. Krywonos, “Predicting surface scatter using a linear systems formulation of nonparaxial scalar diffraction,” Ph.D. dissertation (University of Central Florida, 2006).

E. L. Church, P. Z. Takacs, and T. A. Leonard, “The prediction of BRDFs from surface profile measurements,” Proc. SPIE 1165, 136–150 (1989).

J. E. Harvey, N. Choi, A. Krywonos, and J. Marcen, “Calculating BRDFs from surface PSDs for moderately rough optical surfaces,” Proc. SPIE 7426, 742601 (2009).

[CrossRef]

J. M. Bennett and L. Mattsson, Introduction to Surface Roughness and Scattering (Optical Society of America, 1989).

S. Fay, S. Dubail, U. Kroll, J. Meier, Y. Ziegler, and A. Shah, “Light trapping enhancement for thin-film silicon solar cells by roughness improvement of the ZnC front TCO,” in Proceedings of the 16th European Photovoltaic Solar Energy Conference & Exhibition (WIP Wirtschaft und Infrastruktur Planungs-KG, 2000), pp. 361–364.

R. J. Noll, “Effect of mid and high spatial frequencies on optical performance,” Opt. Eng. 18, 137–142 (1979).

J. E. Harvey, N. Choi, A. Krywonos, S. Schroder, and D. H. Penalver, “Scattering from moderately rough interfaces between two arbitrary media,” Proc. SPIE 7794, 77940V (2010).

[CrossRef]

J. E. Harvey, A. Krywonos, G. Peterson, and M. Bruner, “Image Degradation due to scattering effects in two-mirror telescopes,” Opt. Eng. 49, 063202 (2010).

[CrossRef]

H. Ragheb and E. Hancock, “The modified Beckmann-Kirchhoff scattering theory for rough surface analysis,” Pattern Recog. 40, 2004–2020 (2007).

[CrossRef]

H. Ragheb and E. R. Hancock, “Testing new variants of the Beckmann-Kirchhoff model against radiance data,” Comput. Vis. Image Understanding 102, 145–168 (2006).

[CrossRef]

H. Ragheb and E. R. Hancock, “Surface radiance correction for shape from shading,” Pattern Recog. 38, 1574–1595 (2005).

[CrossRef]

H. Ragheb and E. R. Hancock, “Rough surface correction and re-illumination using the modified Beckmann model,” in Computer Analysis of Images and Patterns: 10th International Conference, Proceedings, Vol. 2756 of Lecture Notes in Computer Science (Springer-Verlag, 2003), pp. 98–106.

H. Ragheb and E. R. Hancock, “Rough surface estimation using the Kirchhoff model,” in Image Analysis, Proceedings, Vol. 2749 of Lecture Notes in Computer Science (Springer-Verlag, 2003), pp. 477–484.

H. Ragheb and E. R. Hancock, “Adding subsurface attenuation to the Beckmann-Kirchhoff theory,” in Pattern Recognition and Image Analysis, Part 2, Vol. 3523 of Lecture Notes in Computer Science (Springer-Verlag, 2005), pp. 247–254.

[CrossRef]

J. A. Ratcliff, “Some aspects of diffraction theory and their application to the ionosphere,” in Reports of Progress in Physics, A.C.Strickland, ed. (The Physical Society, 1956), Vol. XIX.

S. O. Rice, “Reflection of electromagnetic waves from slightly rough surfaces,” Commun. Pure Appl. Math. 4, 351–378 (1951).

[CrossRef]

A. Robles-Kelly and E. R. Hancock, “Estimating the surface radiance function from single images,” Graph. Models 67, 518–548 (2005).

[CrossRef]

A. Robles-Kelly and E. R. Hancock, “Radiance function estimation for object classification,” in Progress in Pattern Recognition, Image Analysis and Applications, Vol. 3287 of Lecture Notes in Computer Science (Springer-Verlag, 2004), pp. 67–75.

[CrossRef]

B. E. A. Saleh and M. C. Teich, Fundamentals of Photonics(Wiley, 1991).

[CrossRef]

J. E. Harvey, N. Choi, A. Krywonos, S. Schroder, and D. H. Penalver, “Scattering from moderately rough interfaces between two arbitrary media,” Proc. SPIE 7794, 77940V (2010).

[CrossRef]

S. Schröder, S. Gliech, and A. Duparre, “Measurement system to determine the total and angle-resolved light scattering of optical components in the deep-ultraviolet and vacuum-ultraviolet spectral regions,” Appl. Opt. 44, 6093–6107 (2005).

[CrossRef]
[PubMed]

S. Schröder, “Light scattering of optical components at 193 nm and 13.5 nm,” Ph.D. dissertation (Friedrich-Schiller-Universitat, Jena, Germany, 2008).

S. Schröder, A. Duparré, K. Füchsel, N. Kaiser, A. Tünnermann, and J. E. Harvey, “Scattering of roughened TCO films—modeling and measurement,” in OSA Topical Meeting on Optical Interference Coatings, OSA Technical Digest (CD) (2010).

S. Fay, S. Dubail, U. Kroll, J. Meier, Y. Ziegler, and A. Shah, “Light trapping enhancement for thin-film silicon solar cells by roughness improvement of the ZnC front TCO,” in Proceedings of the 16th European Photovoltaic Solar Energy Conference & Exhibition (WIP Wirtschaft und Infrastruktur Planungs-KG, 2000), pp. 361–364.

P. Beckmann and A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces (Pergamon, 1963).

J. E. Harvey, A. Krywonos, and J. C. Stover “Unified scatter model for rough surfaces at large incident and scatter angles,” Proc. SPIE 6672, 66720C (2007).

[CrossRef]

J. C. Stover and J. E. Harvey, “Limitations of Rayleigh-Rice perturbation theory for describing surface scatter,” Proc. SPIE 6672, 66720B (2007).

[CrossRef]

J. M. Elson, J. M. Bennett, and J. C. Stover, “Wavelength and Angular Dependence of light scattering from beryllium: comparison of theory and experiment,” Appl. Opt. 32, 3362–3376(1993).

[CrossRef]
[PubMed]

J. C. Stover, Optical Scattering, Measurement and Analysis, 2nd ed. (SPIE, 1995).

[CrossRef]

E. L. Church and P. Z. Takacs, “The optimal estimation of finish parameters,” Proc SPIE 1530, 71–86 (1991).

[CrossRef]

E. L. Church, P. Z. Takacs, and T. A. Leonard, “The prediction of BRDFs from surface profile measurements,” Proc. SPIE 1165, 136–150 (1989).

E. L. Church and P. Z. Takacs, “Effects of the optical transfer function in surface profile measurements,” Proc. SPIE 1164, 46–59 (1989).

E. L. Church and P. Z. Takacs, “Instrumental effects in surface finish measurements,” Proc. SPIE 1009, 46–55 (1988).

B. E. A. Saleh and M. C. Teich, Fundamentals of Photonics(Wiley, 1991).

[CrossRef]

J. E. Harvey, C. L. Vernold, A. Krywonos, and P. L. Thompson, “Diffracted radiance: a fundamental quantity in a nonparaxial scalar diffraction theory: errata,” Appl. Opt. 39, 6374–6375(2000).

[CrossRef]

J. E. Harvey, C. L. Vernold, A. Krywonos, and P. L. Thompson, “Diffracted radiance: a fundamental quantity in a non-paraxial scalar diffraction theory,” Appl. Opt. 38, 6469–6481 (1999).

[CrossRef]

J. E. Harvey and P. L. Thompson, “Generalized Wolter Type I design for the solar x-ray imager (SXI),” Proc. SPIE 3766, 173–183 (1999).

[CrossRef]

S. Schröder, A. Duparré, K. Füchsel, N. Kaiser, A. Tünnermann, and J. E. Harvey, “Scattering of roughened TCO films—modeling and measurement,” in OSA Topical Meeting on Optical Interference Coatings, OSA Technical Digest (CD) (2010).

J. E. Harvey, A. Krywonos, and C. L. Vernold, “Modified Beckmann-Kirchhoff scattering model for rough surfaces with large incident and scattered angles,” Opt. Eng. 46, 078002 (2007). One of the ten most frequently downloaded SPIE papers and articles (from SPIE Digital Library) in August 2007.

[CrossRef]

J. E. Harvey, C. L. Vernold, A. Krywonos, and P. L. Thompson, “Diffracted radiance: a fundamental quantity in a nonparaxial scalar diffraction theory: errata,” Appl. Opt. 39, 6374–6375(2000).

[CrossRef]

J. E. Harvey, C. L. Vernold, A. Krywonos, and P. L. Thompson, “Diffracted radiance: a fundamental quantity in a non-paraxial scalar diffraction theory,” Appl. Opt. 38, 6469–6481 (1999).

[CrossRef]

J. E. Harvey and C. L. Vernold, “Description of diffraction grating behavior in direction cosine space,” Appl. Opt. 37, 8158–8160 (1998).

[CrossRef]

C. L. Vernold and J. E. Harvey, “A modified Beckmann-Kirchhoff scattering theory,” Proc. SPIE 3426, 51–56 (1998).

[CrossRef]

E. L. Church, H. A. Jenkinson, and J. M. Zavada, “Relationship between surface scattering and microtopographic features,” Opt. Eng. 18, 125–136 (1979).

S. Fay, S. Dubail, U. Kroll, J. Meier, Y. Ziegler, and A. Shah, “Light trapping enhancement for thin-film silicon solar cells by roughness improvement of the ZnC front TCO,” in Proceedings of the 16th European Photovoltaic Solar Energy Conference & Exhibition (WIP Wirtschaft und Infrastruktur Planungs-KG, 2000), pp. 361–364.

E. L. Church, “Fractal surface finish,” Appl. Opt. 27, 1518–1526(1988).

[CrossRef]
[PubMed]

J. E. Harvey, E. C. Moran, and W. P. Zmek, “Transfer function characterization of grazing incidence optical systems,” Appl. Opt. 27, 1527–1533 (1988).

[CrossRef]
[PubMed]

P. Glenn, P. Reid, A. Slomba, and L. P. Van Speybroeck, “Performance prediction of AXAF technology mirror assembly using measured mirror surface errors,” Appl. Opt. 27, 1539–1543(1988).

[CrossRef]
[PubMed]

J. M. Elson, J. M. Bennett, and J. C. Stover, “Wavelength and Angular Dependence of light scattering from beryllium: comparison of theory and experiment,” Appl. Opt. 32, 3362–3376(1993).

[CrossRef]
[PubMed]

J. E. Harvey, C. L. Vernold, A. Krywonos, and P. L. Thompson, “Diffracted radiance: a fundamental quantity in a non-paraxial scalar diffraction theory,” Appl. Opt. 38, 6469–6481 (1999).

[CrossRef]

J. E. Harvey, C. L. Vernold, A. Krywonos, and P. L. Thompson, “Diffracted radiance: a fundamental quantity in a nonparaxial scalar diffraction theory: errata,” Appl. Opt. 39, 6374–6375(2000).

[CrossRef]

A. Duparré, J. Ferre-Borrull, S. Gliech, G. Notni, J. Steinert, and J. M. Bennett, “Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components,” Appl. Opt. 41, 154–171(2002).

[CrossRef]
[PubMed]

S. Schröder, S. Gliech, and A. Duparre, “Measurement system to determine the total and angle-resolved light scattering of optical components in the deep-ultraviolet and vacuum-ultraviolet spectral regions,” Appl. Opt. 44, 6093–6107 (2005).

[CrossRef]
[PubMed]

J. J. Murrey, F. E. Nicodemus, and I. Wunderman, “Proposed supplement to the SI nomenclature for radiometry and photometry,” Appl. Opt. 10, 1465–1468 (1971).

[CrossRef]

F. E. Nicodemus, “Reflectance nomenclature and directional reflectance and emissivity,” Appl. Opt. 9, 1474–1475 (1970).

[CrossRef]
[PubMed]

J. E. Harvey and C. L. Vernold, “Description of diffraction grating behavior in direction cosine space,” Appl. Opt. 37, 8158–8160 (1998).

[CrossRef]

S. O. Rice, “Reflection of electromagnetic waves from slightly rough surfaces,” Commun. Pure Appl. Math. 4, 351–378 (1951).

[CrossRef]

H. Ragheb and E. R. Hancock, “Testing new variants of the Beckmann-Kirchhoff model against radiance data,” Comput. Vis. Image Understanding 102, 145–168 (2006).

[CrossRef]

A. Robles-Kelly and E. R. Hancock, “Estimating the surface radiance function from single images,” Graph. Models 67, 518–548 (2005).

[CrossRef]

D. Domine, F. J. Haug, C. Battaglia, and C. Ballif, “Modeling of light scattering from micro- and nanotextured surfaces,” J. Appl. Phys. 107, 044504 (2010).

[CrossRef]

M. Guzar-Sicairos and J. C. Gutierrez-Vega, “Computation of quasi-discrete Hankel transforms of integer order for propagating optical wave fields,” J. Opt. Soc. Am. A 21, 53–58(2004).

[CrossRef]

J. E. Harvey, A. Krywonos, and Dijana Bogunovic, “Non-paraxial scalar treatment of sinusoidal phase gratings,” J. Opt. Soc. Am. A 23, 858–865 (2006).

[CrossRef]

Y. Sun, “Statistical ray method for deriving reflection models of rough surfaces,” J. Opt. Soc. Am. A 24, 724–744 (2007).

[CrossRef]

K. A. O’Donnell and E. R. Mendez, “Experimental study of scattering from characterized random surfaces,” J. Opt. Soc. Am. A 4, 1194–1205 (1987).

[CrossRef]

A. J. S. Hamilton, “Uncorrelated modes of nonlinear power spectrum,” Mon. Not. R. Astron. Soc. 312, 257–284 (2000).

[CrossRef]

R. J. Noll, “Effect of mid and high spatial frequencies on optical performance,” Opt. Eng. 18, 137–142 (1979).

E. L. Church, H. A. Jenkinson, and J. M. Zavada, “Relationship between surface scattering and microtopographic features,” Opt. Eng. 18, 125–136 (1979).

J. E. Harvey, A. Krywonos, and C. L. Vernold, “Modified Beckmann-Kirchhoff scattering model for rough surfaces with large incident and scattered angles,” Opt. Eng. 46, 078002 (2007). One of the ten most frequently downloaded SPIE papers and articles (from SPIE Digital Library) in August 2007.

[CrossRef]

J. E. Harvey, A. Krywonos, G. Peterson, and M. Bruner, “Image Degradation due to scattering effects in two-mirror telescopes,” Opt. Eng. 49, 063202 (2010).

[CrossRef]

H. Ragheb and E. Hancock, “The modified Beckmann-Kirchhoff scattering theory for rough surface analysis,” Pattern Recog. 40, 2004–2020 (2007).

[CrossRef]

H. Ragheb and E. R. Hancock, “Surface radiance correction for shape from shading,” Pattern Recog. 38, 1574–1595 (2005).

[CrossRef]

E. L. Church and P. Z. Takacs, “The optimal estimation of finish parameters,” Proc SPIE 1530, 71–86 (1991).

[CrossRef]

H. Davies, “The reflection of electromagnetic waves from a rough surface,” Proc. IEE IV 101, 209–214 (1954).

[CrossRef]

J. E. Harvey and A. Krywonos, “Radiance: the natural quantity for describing diffraction and propagation,” Proc. SPIE 6285, 628503 (2006).

[CrossRef]

J. E. Harvey, N. Choi, A. Krywonos, S. Schroder, and D. H. Penalver, “Scattering from moderately rough interfaces between two arbitrary media,” Proc. SPIE 7794, 77940V (2010).

[CrossRef]

E. L. Church and P. Z. Takacs, “Instrumental effects in surface finish measurements,” Proc. SPIE 1009, 46–55 (1988).

E. L. Church and P. Z. Takacs, “Effects of the optical transfer function in surface profile measurements,” Proc. SPIE 1164, 46–59 (1989).

J. E. Harvey, “Scattering effects in x-ray imaging systems,” Proc. SPIE 2515, 246–272 (1995).

[CrossRef]

J. E. Harvey, “Surface scatter phenomena: a linear, shift-invariant process,” Proc. SPIE 1165, 87–99 (1989).

C. L. Vernold and J. E. Harvey, “A modified Beckmann-Kirchhoff scattering theory,” Proc. SPIE 3426, 51–56 (1998).

[CrossRef]

M. G. Dittman, “K-correlation power spectral density and surface scatter model,” Proc. SPIE 6291, 62910P (2006).

[CrossRef]

J. E. Harvey, N. Choi, A. Krywonos, and J. Marcen, “Calculating BRDFs from surface PSDs for moderately rough optical surfaces,” Proc. SPIE 7426, 742601 (2009).

[CrossRef]

J. C. Stover and J. E. Harvey, “Limitations of Rayleigh-Rice perturbation theory for describing surface scatter,” Proc. SPIE 6672, 66720B (2007).

[CrossRef]

J. E. Harvey, A. Krywonos, and J. C. Stover “Unified scatter model for rough surfaces at large incident and scatter angles,” Proc. SPIE 6672, 66720C (2007).

[CrossRef]

E. L. Church, P. Z. Takacs, and T. A. Leonard, “The prediction of BRDFs from surface profile measurements,” Proc. SPIE 1165, 136–150 (1989).

J. E. Harvey and P. L. Thompson, “Generalized Wolter Type I design for the solar x-ray imager (SXI),” Proc. SPIE 3766, 173–183 (1999).

[CrossRef]

T. M. Elfouhaily and C. A. Guerin, “A critical survey of approximate scattering wave theories from random rough surfaces,” Waves Random Media 14, R1–R40 (2004).

[CrossRef]

J. C. Stover, Optical Scattering, Measurement and Analysis, 2nd ed. (SPIE, 1995).

[CrossRef]

S. Schröder, A. Duparré, K. Füchsel, N. Kaiser, A. Tünnermann, and J. E. Harvey, “Scattering of roughened TCO films—modeling and measurement,” in OSA Topical Meeting on Optical Interference Coatings, OSA Technical Digest (CD) (2010).

J. E. Harvey, “Bridging the gap between “figure” and “finish”,” presented at the Optical Society of America Optical Fabrication and Testing Meeting, Boston, Massachusetts, May 3, 1996.

R. W. Boyd, Radiometry and the Detection of Optical Radiation (Wiley, 1983).

The NIST Reference on Constants, Units, and Uncertainty, http://physics.nist.gov/cuu/Units/units.html.

S. Schröder, “Light scattering of optical components at 193 nm and 13.5 nm,” Ph.D. dissertation (Friedrich-Schiller-Universitat, Jena, Germany, 2008).

P. Beckmann and A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces (Pergamon, 1963).

J. E. Harvey, “Light-scattering characteristics of optical surfaces,” Ph.D. dissertation (University of Arizona, 1976).

H. Ragheb and E. R. Hancock, “Adding subsurface attenuation to the Beckmann-Kirchhoff theory,” in Pattern Recognition and Image Analysis, Part 2, Vol. 3523 of Lecture Notes in Computer Science (Springer-Verlag, 2005), pp. 247–254.

[CrossRef]

A. Robles-Kelly and E. R. Hancock, “Radiance function estimation for object classification,” in Progress in Pattern Recognition, Image Analysis and Applications, Vol. 3287 of Lecture Notes in Computer Science (Springer-Verlag, 2004), pp. 67–75.

[CrossRef]

P. Hermansson, G. Forssell, and J. Fagerstrom, “A review of models for scattering from rough Surfaces,” Scientific Report FOI-R-0988-SE (Swedish Defense Research Agency, Nov. 2003).

H. Ragheb and E. R. Hancock, “Rough surface correction and re-illumination using the modified Beckmann model,” in Computer Analysis of Images and Patterns: 10th International Conference, Proceedings, Vol. 2756 of Lecture Notes in Computer Science (Springer-Verlag, 2003), pp. 98–106.

H. Ragheb and E. R. Hancock, “Rough surface estimation using the Kirchhoff model,” in Image Analysis, Proceedings, Vol. 2749 of Lecture Notes in Computer Science (Springer-Verlag, 2003), pp. 477–484.

A. Krywonos, “Predicting surface scatter using a linear systems formulation of nonparaxial scalar diffraction,” Ph.D. dissertation (University of Central Florida, 2006).

J. A. Ratcliff, “Some aspects of diffraction theory and their application to the ionosphere,” in Reports of Progress in Physics, A.C.Strickland, ed. (The Physical Society, 1956), Vol. XIX.

J. W. Goodman, Introduction to Fourier Optics, 2nd ed. (McGraw-Hill, 1996).

J. D. Gaskill, Linear Systems, Fourier Transforms, and Optics (Wiley, 1978).

Users Manual for APART/PADE, Version 8.6 (Breault Research Organization, 4601 East First Street, Tucson, Ariz., 1987), p. 5-2.

ASAP Reference Manual (Breault Research Organization, 4601 East First Street, Tucson, Ariz., 1990), pp. 3–43.

TracePro User’s Manual, Release 3.0 (Lambda Research Corporation, 80 Taylor Street, Littleton, Mass. (1998), p. 7.12.

ZEMAX User’s Guide, August 2007 (ZEMAX Development Corp., 3001 112th Avenue NE, Suite 202, Bellevue, Wash., 2007), p. 391.

FRED User’s Manual, Version 9.110 (Photon Engineering, 440 S. Williams Blvd. #106, Tucson, Ariz., 2010).

http://www.opticsinfobase.org/submit/ocis/.

J. M. Bennett and L. Mattsson, Introduction to Surface Roughness and Scattering (Optical Society of America, 1989).

B. E. A. Saleh and M. C. Teich, Fundamentals of Photonics(Wiley, 1991).

[CrossRef]

S. Fay, S. Dubail, U. Kroll, J. Meier, Y. Ziegler, and A. Shah, “Light trapping enhancement for thin-film silicon solar cells by roughness improvement of the ZnC front TCO,” in Proceedings of the 16th European Photovoltaic Solar Energy Conference & Exhibition (WIP Wirtschaft und Infrastruktur Planungs-KG, 2000), pp. 361–364.