Abstract

Image reconstruction from Fourier intensity through phase retrieval was investigated when the intensity was contaminated with Poisson noise. Although different initial conditions and/or the instability of the iterative phase retrieval process led to different reconstructed images, we found that the distribution of the resulting images in both the object and Fourier spaces formed spherical shell structures. Averaging of the images over the distribution corresponds to the position of the image at the sphere center.

© 2010 Optical Society of America

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    [CrossRef]
  2. R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of phase from image and diffraction plane pictures,” Optik (Stuttgart) 35, 237–246 (1972).
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    [CrossRef] [PubMed]
  4. J. Miao, D. Sayre, and H. N. Chapman, “Phase retrieval from the magnitude of the Fourier transforms of nonperiodic objects,” J. Opt. Soc. Am. A 15, 1662–1669 (1998).
    [CrossRef]
  5. J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of X-ray crystallography to allow imaging of micrometer-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
    [CrossRef]
  6. J. C. H. Spence, in Science of Microscopy, P.W.Hawkes and J.C. H.Spence, eds. (Springer, 2007).
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    [CrossRef] [PubMed]
  8. J. Miao, T. Ishikawa, E. H. Anderson, and K. O. Hodgson, “Phase retrieval of diffraction patterns from noncrystalline samples using the oversampling method,” Phys. Rev. B 67, 174104 (2003).
    [CrossRef]
  9. Y. Nishino, J. Miao, and T. Ishikawa, “Image reconstruction of nanostructured nonperiodic objects only from oversampled hard x-ray diffraction intensities,” Phys. Rev. B 68, 220101(R) (2003).
    [CrossRef]
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    [CrossRef]
  11. J. M. Zuo, I. Vartanyants, M. Gao, R. Zhang, and L. A. Nagahara, “Atomic resolution imaging of a carbon nanotube from diffraction intensities,” Science 300, 1419–1421 (2003).
    [CrossRef] [PubMed]
  12. U. Weierstall, Q. Chen, J. C. H. Spence, M. R. Howells, M. Isaacson, and R. R. Panepucci, “Image reconstruction from electron and X-ray diffraction patterns using iterative algorithms: experiment and simulation,” Ultramicroscopy 90, 171–195 (2002).
    [CrossRef] [PubMed]
  13. O. Kamimura, K. Kawahara, T. Doi, T. Dobashi, T. Abe, and K. Gohara, “Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes,” Appl. Phys. Lett. 92, 024106 (2008).
    [CrossRef]
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    [CrossRef] [PubMed]
  16. G. Oszlányi and A. Suto, “Ab initio structure solution by charge flipping,” Acta Crystallogr. A60, 134–141 (2004).
    [CrossRef]
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    [CrossRef]
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    [CrossRef] [PubMed]
  19. H. N. Chapman, A. Barty, S. Marchesini, A. Noy, C. Cui, M. R. Howells, R. Rosen, H. He, J. C. H. Spence, U. Weierstall, T. Beetz, C. Jacobson, and D. Shapiro, “High-resolution ab initio three-dimensional x-ray diffraction microscopy,” J. Opt. Soc. Am. A 23, 1179–1200 (2006).
    [CrossRef]
  20. P. Thibault, V. Elser, C. Jacobsen, D. Shapiro, and D. Sayre, “Reconstruction of a yeast cell from X-ray diffraction data,” Acta Crystallogr. A62, 248–261 (2006).
    [CrossRef]
  21. V. Elser, “Phase retrieval by iterated projections,” J. Opt. Soc. Am. A 20, 40–55 (2003).
    [CrossRef]
  22. O. Kamimura, T. Dobashi, K. Kawahara, T. Abe, and K. Gohara, “10-kV diffractive imaging using newly developed electron diffraction microscope,” Ultramicroscopy 110, 130–133 (2010).
    [CrossRef]
  23. K. Kawahara, K. Gohara, Y. Maehara, T. Dobashi, and O. Kamimura, “Beam-divergence deconvolution for diffractive imaging,” Phys. Rev. B 81, 018404 (2010).
    [CrossRef]

2010 (2)

O. Kamimura, T. Dobashi, K. Kawahara, T. Abe, and K. Gohara, “10-kV diffractive imaging using newly developed electron diffraction microscope,” Ultramicroscopy 110, 130–133 (2010).
[CrossRef]

K. Kawahara, K. Gohara, Y. Maehara, T. Dobashi, and O. Kamimura, “Beam-divergence deconvolution for diffractive imaging,” Phys. Rev. B 81, 018404 (2010).
[CrossRef]

2008 (2)

O. Kamimura, K. Kawahara, T. Doi, T. Dobashi, T. Abe, and K. Gohara, “Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes,” Appl. Phys. Lett. 92, 024106 (2008).
[CrossRef]

S. Morishita, J. Yamasaki, K. Nakamura, T. Kato, and N. Tanaka, “Diffractive imaging of the dumbbell structure in silicon by spherical-aberration-corrected electron diffraction,” Appl. Phys. Lett. 93, 183103 (2008).
[CrossRef]

2007 (3)

R. L. Sandberg, A. Paul, D. A. Raymondson, S. Hädrich, D. M. Gaudiosi, J. Holtsnider, R. I. Tobey, O. Cohen, M. M. Murnane, H. C. Kapteyn, C. Song, J. Miao, Y. Liu, and F. Salmassi, “Lensless diffractive imaging using tabletop coherent high-harmonic soft-x-ray beams,” Phys. Rev. Lett. 99, 098103 (2007).
[CrossRef] [PubMed]

J. C. H. Spence, in Science of Microscopy, P.W.Hawkes and J.C. H.Spence, eds. (Springer, 2007).

K. Choi and A. Lanterman, “Phase retrieval from noisy data based on minimization of penalized I-divergence,” J. Opt. Soc. Am. A 24, 34–49 (2007).
[CrossRef]

2006 (3)

P. Thibault, V. Elser, C. Jacobsen, D. Shapiro, and D. Sayre, “Reconstruction of a yeast cell from X-ray diffraction data,” Acta Crystallogr. A62, 248–261 (2006).
[CrossRef]

H. N. Chapman, A. Barty, S. Marchesini, A. Noy, C. Cui, M. R. Howells, R. Rosen, H. He, J. C. H. Spence, U. Weierstall, T. Beetz, C. Jacobson, and D. Shapiro, “High-resolution ab initio three-dimensional x-ray diffraction microscopy,” J. Opt. Soc. Am. A 23, 1179–1200 (2006).
[CrossRef]

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

2005 (1)

J. Miao, Y. Nishino, Y. Kohmura, B. Johnson, C. Song, S. H. Risbud, and T. Ishikawa, “Quantitative image reconstruction of GaN quantum dots from oversampled diffraction intensities alone,” Phys. Rev. Lett. 95, 085503 (2005).
[CrossRef] [PubMed]

2004 (1)

G. Oszlányi and A. Suto, “Ab initio structure solution by charge flipping,” Acta Crystallogr. A60, 134–141 (2004).
[CrossRef]

2003 (4)

J. Miao, T. Ishikawa, E. H. Anderson, and K. O. Hodgson, “Phase retrieval of diffraction patterns from noncrystalline samples using the oversampling method,” Phys. Rev. B 67, 174104 (2003).
[CrossRef]

Y. Nishino, J. Miao, and T. Ishikawa, “Image reconstruction of nanostructured nonperiodic objects only from oversampled hard x-ray diffraction intensities,” Phys. Rev. B 68, 220101(R) (2003).
[CrossRef]

J. M. Zuo, I. Vartanyants, M. Gao, R. Zhang, and L. A. Nagahara, “Atomic resolution imaging of a carbon nanotube from diffraction intensities,” Science 300, 1419–1421 (2003).
[CrossRef] [PubMed]

V. Elser, “Phase retrieval by iterated projections,” J. Opt. Soc. Am. A 20, 40–55 (2003).
[CrossRef]

2002 (2)

U. Weierstall, Q. Chen, J. C. H. Spence, M. R. Howells, M. Isaacson, and R. R. Panepucci, “Image reconstruction from electron and X-ray diffraction patterns using iterative algorithms: experiment and simulation,” Ultramicroscopy 90, 171–195 (2002).
[CrossRef] [PubMed]

J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, “High resolution 3D x-ray diffraction microscopy,” Phys. Rev. Lett. 89, 088303 (2002).
[CrossRef] [PubMed]

1999 (1)

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of X-ray crystallography to allow imaging of micrometer-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[CrossRef]

1998 (1)

1982 (1)

1972 (1)

R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of phase from image and diffraction plane pictures,” Optik (Stuttgart) 35, 237–246 (1972).

1952 (1)

D. Sayre, “Some implications of a theorem due to Shannon,” Acta Crystallogr. 5, 843 (1952).
[CrossRef]

Abe, T.

O. Kamimura, T. Dobashi, K. Kawahara, T. Abe, and K. Gohara, “10-kV diffractive imaging using newly developed electron diffraction microscope,” Ultramicroscopy 110, 130–133 (2010).
[CrossRef]

O. Kamimura, K. Kawahara, T. Doi, T. Dobashi, T. Abe, and K. Gohara, “Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes,” Appl. Phys. Lett. 92, 024106 (2008).
[CrossRef]

Anderson, E. H.

J. Miao, T. Ishikawa, E. H. Anderson, and K. O. Hodgson, “Phase retrieval of diffraction patterns from noncrystalline samples using the oversampling method,” Phys. Rev. B 67, 174104 (2003).
[CrossRef]

J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, “High resolution 3D x-ray diffraction microscopy,” Phys. Rev. Lett. 89, 088303 (2002).
[CrossRef] [PubMed]

Bajt, S.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Barty, A.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

H. N. Chapman, A. Barty, S. Marchesini, A. Noy, C. Cui, M. R. Howells, R. Rosen, H. He, J. C. H. Spence, U. Weierstall, T. Beetz, C. Jacobson, and D. Shapiro, “High-resolution ab initio three-dimensional x-ray diffraction microscopy,” J. Opt. Soc. Am. A 23, 1179–1200 (2006).
[CrossRef]

Beetz, T.

Benner, W. H.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Bergh, M.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Bogan, M. J.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Bostedt, C.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Boutet, S.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Burmeister, F.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Caleman, C.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Chapman, H. N.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

H. N. Chapman, A. Barty, S. Marchesini, A. Noy, C. Cui, M. R. Howells, R. Rosen, H. He, J. C. H. Spence, U. Weierstall, T. Beetz, C. Jacobson, and D. Shapiro, “High-resolution ab initio three-dimensional x-ray diffraction microscopy,” J. Opt. Soc. Am. A 23, 1179–1200 (2006).
[CrossRef]

J. Miao, D. Sayre, and H. N. Chapman, “Phase retrieval from the magnitude of the Fourier transforms of nonperiodic objects,” J. Opt. Soc. Am. A 15, 1662–1669 (1998).
[CrossRef]

Charalambous, P.

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of X-ray crystallography to allow imaging of micrometer-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[CrossRef]

Chen, Q.

U. Weierstall, Q. Chen, J. C. H. Spence, M. R. Howells, M. Isaacson, and R. R. Panepucci, “Image reconstruction from electron and X-ray diffraction patterns using iterative algorithms: experiment and simulation,” Ultramicroscopy 90, 171–195 (2002).
[CrossRef] [PubMed]

Choi, K.

Cohen, O.

R. L. Sandberg, A. Paul, D. A. Raymondson, S. Hädrich, D. M. Gaudiosi, J. Holtsnider, R. I. Tobey, O. Cohen, M. M. Murnane, H. C. Kapteyn, C. Song, J. Miao, Y. Liu, and F. Salmassi, “Lensless diffractive imaging using tabletop coherent high-harmonic soft-x-ray beams,” Phys. Rev. Lett. 99, 098103 (2007).
[CrossRef] [PubMed]

Cui, C.

Dobashi, T.

O. Kamimura, T. Dobashi, K. Kawahara, T. Abe, and K. Gohara, “10-kV diffractive imaging using newly developed electron diffraction microscope,” Ultramicroscopy 110, 130–133 (2010).
[CrossRef]

K. Kawahara, K. Gohara, Y. Maehara, T. Dobashi, and O. Kamimura, “Beam-divergence deconvolution for diffractive imaging,” Phys. Rev. B 81, 018404 (2010).
[CrossRef]

O. Kamimura, K. Kawahara, T. Doi, T. Dobashi, T. Abe, and K. Gohara, “Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes,” Appl. Phys. Lett. 92, 024106 (2008).
[CrossRef]

Doi, T.

O. Kamimura, K. Kawahara, T. Doi, T. Dobashi, T. Abe, and K. Gohara, “Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes,” Appl. Phys. Lett. 92, 024106 (2008).
[CrossRef]

Düsterer, S.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Elser, V.

P. Thibault, V. Elser, C. Jacobsen, D. Shapiro, and D. Sayre, “Reconstruction of a yeast cell from X-ray diffraction data,” Acta Crystallogr. A62, 248–261 (2006).
[CrossRef]

V. Elser, “Phase retrieval by iterated projections,” J. Opt. Soc. Am. A 20, 40–55 (2003).
[CrossRef]

Fienup, J. R.

Frank, M.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Gao, M.

J. M. Zuo, I. Vartanyants, M. Gao, R. Zhang, and L. A. Nagahara, “Atomic resolution imaging of a carbon nanotube from diffraction intensities,” Science 300, 1419–1421 (2003).
[CrossRef] [PubMed]

Gaudiosi, D. M.

R. L. Sandberg, A. Paul, D. A. Raymondson, S. Hädrich, D. M. Gaudiosi, J. Holtsnider, R. I. Tobey, O. Cohen, M. M. Murnane, H. C. Kapteyn, C. Song, J. Miao, Y. Liu, and F. Salmassi, “Lensless diffractive imaging using tabletop coherent high-harmonic soft-x-ray beams,” Phys. Rev. Lett. 99, 098103 (2007).
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Gerchberg, R. W.

R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of phase from image and diffraction plane pictures,” Optik (Stuttgart) 35, 237–246 (1972).

Gohara, K.

K. Kawahara, K. Gohara, Y. Maehara, T. Dobashi, and O. Kamimura, “Beam-divergence deconvolution for diffractive imaging,” Phys. Rev. B 81, 018404 (2010).
[CrossRef]

O. Kamimura, T. Dobashi, K. Kawahara, T. Abe, and K. Gohara, “10-kV diffractive imaging using newly developed electron diffraction microscope,” Ultramicroscopy 110, 130–133 (2010).
[CrossRef]

O. Kamimura, K. Kawahara, T. Doi, T. Dobashi, T. Abe, and K. Gohara, “Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes,” Appl. Phys. Lett. 92, 024106 (2008).
[CrossRef]

Hädrich, S.

R. L. Sandberg, A. Paul, D. A. Raymondson, S. Hädrich, D. M. Gaudiosi, J. Holtsnider, R. I. Tobey, O. Cohen, M. M. Murnane, H. C. Kapteyn, C. Song, J. Miao, Y. Liu, and F. Salmassi, “Lensless diffractive imaging using tabletop coherent high-harmonic soft-x-ray beams,” Phys. Rev. Lett. 99, 098103 (2007).
[CrossRef] [PubMed]

Hajdu, J.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Hau-Riege, S. P.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

He, H.

Hodgson, K. O.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

J. Miao, T. Ishikawa, E. H. Anderson, and K. O. Hodgson, “Phase retrieval of diffraction patterns from noncrystalline samples using the oversampling method,” Phys. Rev. B 67, 174104 (2003).
[CrossRef]

J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, “High resolution 3D x-ray diffraction microscopy,” Phys. Rev. Lett. 89, 088303 (2002).
[CrossRef] [PubMed]

Hoener, M.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Holtsnider, J.

R. L. Sandberg, A. Paul, D. A. Raymondson, S. Hädrich, D. M. Gaudiosi, J. Holtsnider, R. I. Tobey, O. Cohen, M. M. Murnane, H. C. Kapteyn, C. Song, J. Miao, Y. Liu, and F. Salmassi, “Lensless diffractive imaging using tabletop coherent high-harmonic soft-x-ray beams,” Phys. Rev. Lett. 99, 098103 (2007).
[CrossRef] [PubMed]

Howells, M. R.

H. N. Chapman, A. Barty, S. Marchesini, A. Noy, C. Cui, M. R. Howells, R. Rosen, H. He, J. C. H. Spence, U. Weierstall, T. Beetz, C. Jacobson, and D. Shapiro, “High-resolution ab initio three-dimensional x-ray diffraction microscopy,” J. Opt. Soc. Am. A 23, 1179–1200 (2006).
[CrossRef]

U. Weierstall, Q. Chen, J. C. H. Spence, M. R. Howells, M. Isaacson, and R. R. Panepucci, “Image reconstruction from electron and X-ray diffraction patterns using iterative algorithms: experiment and simulation,” Ultramicroscopy 90, 171–195 (2002).
[CrossRef] [PubMed]

Huldt, G.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Isaacson, M.

U. Weierstall, Q. Chen, J. C. H. Spence, M. R. Howells, M. Isaacson, and R. R. Panepucci, “Image reconstruction from electron and X-ray diffraction patterns using iterative algorithms: experiment and simulation,” Ultramicroscopy 90, 171–195 (2002).
[CrossRef] [PubMed]

Ishikawa, T.

J. Miao, Y. Nishino, Y. Kohmura, B. Johnson, C. Song, S. H. Risbud, and T. Ishikawa, “Quantitative image reconstruction of GaN quantum dots from oversampled diffraction intensities alone,” Phys. Rev. Lett. 95, 085503 (2005).
[CrossRef] [PubMed]

J. Miao, T. Ishikawa, E. H. Anderson, and K. O. Hodgson, “Phase retrieval of diffraction patterns from noncrystalline samples using the oversampling method,” Phys. Rev. B 67, 174104 (2003).
[CrossRef]

Y. Nishino, J. Miao, and T. Ishikawa, “Image reconstruction of nanostructured nonperiodic objects only from oversampled hard x-ray diffraction intensities,” Phys. Rev. B 68, 220101(R) (2003).
[CrossRef]

J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, “High resolution 3D x-ray diffraction microscopy,” Phys. Rev. Lett. 89, 088303 (2002).
[CrossRef] [PubMed]

Jacobsen, C.

P. Thibault, V. Elser, C. Jacobsen, D. Shapiro, and D. Sayre, “Reconstruction of a yeast cell from X-ray diffraction data,” Acta Crystallogr. A62, 248–261 (2006).
[CrossRef]

Jacobson, C.

Johnson, B.

J. Miao, Y. Nishino, Y. Kohmura, B. Johnson, C. Song, S. H. Risbud, and T. Ishikawa, “Quantitative image reconstruction of GaN quantum dots from oversampled diffraction intensities alone,” Phys. Rev. Lett. 95, 085503 (2005).
[CrossRef] [PubMed]

J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, “High resolution 3D x-ray diffraction microscopy,” Phys. Rev. Lett. 89, 088303 (2002).
[CrossRef] [PubMed]

Kamimura, O.

O. Kamimura, T. Dobashi, K. Kawahara, T. Abe, and K. Gohara, “10-kV diffractive imaging using newly developed electron diffraction microscope,” Ultramicroscopy 110, 130–133 (2010).
[CrossRef]

K. Kawahara, K. Gohara, Y. Maehara, T. Dobashi, and O. Kamimura, “Beam-divergence deconvolution for diffractive imaging,” Phys. Rev. B 81, 018404 (2010).
[CrossRef]

O. Kamimura, K. Kawahara, T. Doi, T. Dobashi, T. Abe, and K. Gohara, “Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes,” Appl. Phys. Lett. 92, 024106 (2008).
[CrossRef]

Kapteyn, H. C.

R. L. Sandberg, A. Paul, D. A. Raymondson, S. Hädrich, D. M. Gaudiosi, J. Holtsnider, R. I. Tobey, O. Cohen, M. M. Murnane, H. C. Kapteyn, C. Song, J. Miao, Y. Liu, and F. Salmassi, “Lensless diffractive imaging using tabletop coherent high-harmonic soft-x-ray beams,” Phys. Rev. Lett. 99, 098103 (2007).
[CrossRef] [PubMed]

Kato, T.

S. Morishita, J. Yamasaki, K. Nakamura, T. Kato, and N. Tanaka, “Diffractive imaging of the dumbbell structure in silicon by spherical-aberration-corrected electron diffraction,” Appl. Phys. Lett. 93, 183103 (2008).
[CrossRef]

Kawahara, K.

K. Kawahara, K. Gohara, Y. Maehara, T. Dobashi, and O. Kamimura, “Beam-divergence deconvolution for diffractive imaging,” Phys. Rev. B 81, 018404 (2010).
[CrossRef]

O. Kamimura, T. Dobashi, K. Kawahara, T. Abe, and K. Gohara, “10-kV diffractive imaging using newly developed electron diffraction microscope,” Ultramicroscopy 110, 130–133 (2010).
[CrossRef]

O. Kamimura, K. Kawahara, T. Doi, T. Dobashi, T. Abe, and K. Gohara, “Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes,” Appl. Phys. Lett. 92, 024106 (2008).
[CrossRef]

Kirz, J.

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of X-ray crystallography to allow imaging of micrometer-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[CrossRef]

Kohmura, Y.

J. Miao, Y. Nishino, Y. Kohmura, B. Johnson, C. Song, S. H. Risbud, and T. Ishikawa, “Quantitative image reconstruction of GaN quantum dots from oversampled diffraction intensities alone,” Phys. Rev. Lett. 95, 085503 (2005).
[CrossRef] [PubMed]

Kuhlmann, M.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Lai, B.

J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, “High resolution 3D x-ray diffraction microscopy,” Phys. Rev. Lett. 89, 088303 (2002).
[CrossRef] [PubMed]

Lanterman, A.

Lee, R. W.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Liu, Y.

R. L. Sandberg, A. Paul, D. A. Raymondson, S. Hädrich, D. M. Gaudiosi, J. Holtsnider, R. I. Tobey, O. Cohen, M. M. Murnane, H. C. Kapteyn, C. Song, J. Miao, Y. Liu, and F. Salmassi, “Lensless diffractive imaging using tabletop coherent high-harmonic soft-x-ray beams,” Phys. Rev. Lett. 99, 098103 (2007).
[CrossRef] [PubMed]

London, R. A.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Maehara, Y.

K. Kawahara, K. Gohara, Y. Maehara, T. Dobashi, and O. Kamimura, “Beam-divergence deconvolution for diffractive imaging,” Phys. Rev. B 81, 018404 (2010).
[CrossRef]

Maia, F. R.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Marchesini, S.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

H. N. Chapman, A. Barty, S. Marchesini, A. Noy, C. Cui, M. R. Howells, R. Rosen, H. He, J. C. H. Spence, U. Weierstall, T. Beetz, C. Jacobson, and D. Shapiro, “High-resolution ab initio three-dimensional x-ray diffraction microscopy,” J. Opt. Soc. Am. A 23, 1179–1200 (2006).
[CrossRef]

Miao, J.

R. L. Sandberg, A. Paul, D. A. Raymondson, S. Hädrich, D. M. Gaudiosi, J. Holtsnider, R. I. Tobey, O. Cohen, M. M. Murnane, H. C. Kapteyn, C. Song, J. Miao, Y. Liu, and F. Salmassi, “Lensless diffractive imaging using tabletop coherent high-harmonic soft-x-ray beams,” Phys. Rev. Lett. 99, 098103 (2007).
[CrossRef] [PubMed]

J. Miao, Y. Nishino, Y. Kohmura, B. Johnson, C. Song, S. H. Risbud, and T. Ishikawa, “Quantitative image reconstruction of GaN quantum dots from oversampled diffraction intensities alone,” Phys. Rev. Lett. 95, 085503 (2005).
[CrossRef] [PubMed]

J. Miao, T. Ishikawa, E. H. Anderson, and K. O. Hodgson, “Phase retrieval of diffraction patterns from noncrystalline samples using the oversampling method,” Phys. Rev. B 67, 174104 (2003).
[CrossRef]

Y. Nishino, J. Miao, and T. Ishikawa, “Image reconstruction of nanostructured nonperiodic objects only from oversampled hard x-ray diffraction intensities,” Phys. Rev. B 68, 220101(R) (2003).
[CrossRef]

J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, “High resolution 3D x-ray diffraction microscopy,” Phys. Rev. Lett. 89, 088303 (2002).
[CrossRef] [PubMed]

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of X-ray crystallography to allow imaging of micrometer-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[CrossRef]

J. Miao, D. Sayre, and H. N. Chapman, “Phase retrieval from the magnitude of the Fourier transforms of nonperiodic objects,” J. Opt. Soc. Am. A 15, 1662–1669 (1998).
[CrossRef]

Möller, T.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Morishita, S.

S. Morishita, J. Yamasaki, K. Nakamura, T. Kato, and N. Tanaka, “Diffractive imaging of the dumbbell structure in silicon by spherical-aberration-corrected electron diffraction,” Appl. Phys. Lett. 93, 183103 (2008).
[CrossRef]

Murnane, M. M.

R. L. Sandberg, A. Paul, D. A. Raymondson, S. Hädrich, D. M. Gaudiosi, J. Holtsnider, R. I. Tobey, O. Cohen, M. M. Murnane, H. C. Kapteyn, C. Song, J. Miao, Y. Liu, and F. Salmassi, “Lensless diffractive imaging using tabletop coherent high-harmonic soft-x-ray beams,” Phys. Rev. Lett. 99, 098103 (2007).
[CrossRef] [PubMed]

Nagahara, L. A.

J. M. Zuo, I. Vartanyants, M. Gao, R. Zhang, and L. A. Nagahara, “Atomic resolution imaging of a carbon nanotube from diffraction intensities,” Science 300, 1419–1421 (2003).
[CrossRef] [PubMed]

Nakamura, K.

S. Morishita, J. Yamasaki, K. Nakamura, T. Kato, and N. Tanaka, “Diffractive imaging of the dumbbell structure in silicon by spherical-aberration-corrected electron diffraction,” Appl. Phys. Lett. 93, 183103 (2008).
[CrossRef]

Nishino, Y.

J. Miao, Y. Nishino, Y. Kohmura, B. Johnson, C. Song, S. H. Risbud, and T. Ishikawa, “Quantitative image reconstruction of GaN quantum dots from oversampled diffraction intensities alone,” Phys. Rev. Lett. 95, 085503 (2005).
[CrossRef] [PubMed]

Y. Nishino, J. Miao, and T. Ishikawa, “Image reconstruction of nanostructured nonperiodic objects only from oversampled hard x-ray diffraction intensities,” Phys. Rev. B 68, 220101(R) (2003).
[CrossRef]

Noy, A.

Oszlányi, G.

G. Oszlányi and A. Suto, “Ab initio structure solution by charge flipping,” Acta Crystallogr. A60, 134–141 (2004).
[CrossRef]

Panepucci, R. R.

U. Weierstall, Q. Chen, J. C. H. Spence, M. R. Howells, M. Isaacson, and R. R. Panepucci, “Image reconstruction from electron and X-ray diffraction patterns using iterative algorithms: experiment and simulation,” Ultramicroscopy 90, 171–195 (2002).
[CrossRef] [PubMed]

Paul, A.

R. L. Sandberg, A. Paul, D. A. Raymondson, S. Hädrich, D. M. Gaudiosi, J. Holtsnider, R. I. Tobey, O. Cohen, M. M. Murnane, H. C. Kapteyn, C. Song, J. Miao, Y. Liu, and F. Salmassi, “Lensless diffractive imaging using tabletop coherent high-harmonic soft-x-ray beams,” Phys. Rev. Lett. 99, 098103 (2007).
[CrossRef] [PubMed]

Plönjes, E.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Raymondson, D. A.

R. L. Sandberg, A. Paul, D. A. Raymondson, S. Hädrich, D. M. Gaudiosi, J. Holtsnider, R. I. Tobey, O. Cohen, M. M. Murnane, H. C. Kapteyn, C. Song, J. Miao, Y. Liu, and F. Salmassi, “Lensless diffractive imaging using tabletop coherent high-harmonic soft-x-ray beams,” Phys. Rev. Lett. 99, 098103 (2007).
[CrossRef] [PubMed]

Risbud, S. H.

J. Miao, Y. Nishino, Y. Kohmura, B. Johnson, C. Song, S. H. Risbud, and T. Ishikawa, “Quantitative image reconstruction of GaN quantum dots from oversampled diffraction intensities alone,” Phys. Rev. Lett. 95, 085503 (2005).
[CrossRef] [PubMed]

Rosen, R.

Salmassi, F.

R. L. Sandberg, A. Paul, D. A. Raymondson, S. Hädrich, D. M. Gaudiosi, J. Holtsnider, R. I. Tobey, O. Cohen, M. M. Murnane, H. C. Kapteyn, C. Song, J. Miao, Y. Liu, and F. Salmassi, “Lensless diffractive imaging using tabletop coherent high-harmonic soft-x-ray beams,” Phys. Rev. Lett. 99, 098103 (2007).
[CrossRef] [PubMed]

Sandberg, R. L.

R. L. Sandberg, A. Paul, D. A. Raymondson, S. Hädrich, D. M. Gaudiosi, J. Holtsnider, R. I. Tobey, O. Cohen, M. M. Murnane, H. C. Kapteyn, C. Song, J. Miao, Y. Liu, and F. Salmassi, “Lensless diffractive imaging using tabletop coherent high-harmonic soft-x-ray beams,” Phys. Rev. Lett. 99, 098103 (2007).
[CrossRef] [PubMed]

Saxton, W. O.

R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of phase from image and diffraction plane pictures,” Optik (Stuttgart) 35, 237–246 (1972).

Sayre, D.

P. Thibault, V. Elser, C. Jacobsen, D. Shapiro, and D. Sayre, “Reconstruction of a yeast cell from X-ray diffraction data,” Acta Crystallogr. A62, 248–261 (2006).
[CrossRef]

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of X-ray crystallography to allow imaging of micrometer-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[CrossRef]

J. Miao, D. Sayre, and H. N. Chapman, “Phase retrieval from the magnitude of the Fourier transforms of nonperiodic objects,” J. Opt. Soc. Am. A 15, 1662–1669 (1998).
[CrossRef]

D. Sayre, “Some implications of a theorem due to Shannon,” Acta Crystallogr. 5, 843 (1952).
[CrossRef]

Schneider, J. R.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Seibert, M. M.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Shapiro, D.

Shapiro, D. A.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Song, C.

R. L. Sandberg, A. Paul, D. A. Raymondson, S. Hädrich, D. M. Gaudiosi, J. Holtsnider, R. I. Tobey, O. Cohen, M. M. Murnane, H. C. Kapteyn, C. Song, J. Miao, Y. Liu, and F. Salmassi, “Lensless diffractive imaging using tabletop coherent high-harmonic soft-x-ray beams,” Phys. Rev. Lett. 99, 098103 (2007).
[CrossRef] [PubMed]

J. Miao, Y. Nishino, Y. Kohmura, B. Johnson, C. Song, S. H. Risbud, and T. Ishikawa, “Quantitative image reconstruction of GaN quantum dots from oversampled diffraction intensities alone,” Phys. Rev. Lett. 95, 085503 (2005).
[CrossRef] [PubMed]

Spence, J. C. H.

J. C. H. Spence, in Science of Microscopy, P.W.Hawkes and J.C. H.Spence, eds. (Springer, 2007).

H. N. Chapman, A. Barty, S. Marchesini, A. Noy, C. Cui, M. R. Howells, R. Rosen, H. He, J. C. H. Spence, U. Weierstall, T. Beetz, C. Jacobson, and D. Shapiro, “High-resolution ab initio three-dimensional x-ray diffraction microscopy,” J. Opt. Soc. Am. A 23, 1179–1200 (2006).
[CrossRef]

U. Weierstall, Q. Chen, J. C. H. Spence, M. R. Howells, M. Isaacson, and R. R. Panepucci, “Image reconstruction from electron and X-ray diffraction patterns using iterative algorithms: experiment and simulation,” Ultramicroscopy 90, 171–195 (2002).
[CrossRef] [PubMed]

Spiller, E.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Suto, A.

G. Oszlányi and A. Suto, “Ab initio structure solution by charge flipping,” Acta Crystallogr. A60, 134–141 (2004).
[CrossRef]

Szöke, A.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Tanaka, N.

S. Morishita, J. Yamasaki, K. Nakamura, T. Kato, and N. Tanaka, “Diffractive imaging of the dumbbell structure in silicon by spherical-aberration-corrected electron diffraction,” Appl. Phys. Lett. 93, 183103 (2008).
[CrossRef]

Thibault, P.

P. Thibault, V. Elser, C. Jacobsen, D. Shapiro, and D. Sayre, “Reconstruction of a yeast cell from X-ray diffraction data,” Acta Crystallogr. A62, 248–261 (2006).
[CrossRef]

Timneanu, N.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Tobey, R. I.

R. L. Sandberg, A. Paul, D. A. Raymondson, S. Hädrich, D. M. Gaudiosi, J. Holtsnider, R. I. Tobey, O. Cohen, M. M. Murnane, H. C. Kapteyn, C. Song, J. Miao, Y. Liu, and F. Salmassi, “Lensless diffractive imaging using tabletop coherent high-harmonic soft-x-ray beams,” Phys. Rev. Lett. 99, 098103 (2007).
[CrossRef] [PubMed]

Treusch, R.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Tschentscher, T.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

van der Spoel, D.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Vartanyants, I.

J. M. Zuo, I. Vartanyants, M. Gao, R. Zhang, and L. A. Nagahara, “Atomic resolution imaging of a carbon nanotube from diffraction intensities,” Science 300, 1419–1421 (2003).
[CrossRef] [PubMed]

Weierstall, U.

H. N. Chapman, A. Barty, S. Marchesini, A. Noy, C. Cui, M. R. Howells, R. Rosen, H. He, J. C. H. Spence, U. Weierstall, T. Beetz, C. Jacobson, and D. Shapiro, “High-resolution ab initio three-dimensional x-ray diffraction microscopy,” J. Opt. Soc. Am. A 23, 1179–1200 (2006).
[CrossRef]

U. Weierstall, Q. Chen, J. C. H. Spence, M. R. Howells, M. Isaacson, and R. R. Panepucci, “Image reconstruction from electron and X-ray diffraction patterns using iterative algorithms: experiment and simulation,” Ultramicroscopy 90, 171–195 (2002).
[CrossRef] [PubMed]

Woods, B. W.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Yamasaki, J.

S. Morishita, J. Yamasaki, K. Nakamura, T. Kato, and N. Tanaka, “Diffractive imaging of the dumbbell structure in silicon by spherical-aberration-corrected electron diffraction,” Appl. Phys. Lett. 93, 183103 (2008).
[CrossRef]

Zhang, R.

J. M. Zuo, I. Vartanyants, M. Gao, R. Zhang, and L. A. Nagahara, “Atomic resolution imaging of a carbon nanotube from diffraction intensities,” Science 300, 1419–1421 (2003).
[CrossRef] [PubMed]

Zuo, J. M.

J. M. Zuo, I. Vartanyants, M. Gao, R. Zhang, and L. A. Nagahara, “Atomic resolution imaging of a carbon nanotube from diffraction intensities,” Science 300, 1419–1421 (2003).
[CrossRef] [PubMed]

Acta Crystallogr. (3)

G. Oszlányi and A. Suto, “Ab initio structure solution by charge flipping,” Acta Crystallogr. A60, 134–141 (2004).
[CrossRef]

D. Sayre, “Some implications of a theorem due to Shannon,” Acta Crystallogr. 5, 843 (1952).
[CrossRef]

P. Thibault, V. Elser, C. Jacobsen, D. Shapiro, and D. Sayre, “Reconstruction of a yeast cell from X-ray diffraction data,” Acta Crystallogr. A62, 248–261 (2006).
[CrossRef]

Appl. Opt. (1)

Appl. Phys. Lett. (2)

O. Kamimura, K. Kawahara, T. Doi, T. Dobashi, T. Abe, and K. Gohara, “Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes,” Appl. Phys. Lett. 92, 024106 (2008).
[CrossRef]

S. Morishita, J. Yamasaki, K. Nakamura, T. Kato, and N. Tanaka, “Diffractive imaging of the dumbbell structure in silicon by spherical-aberration-corrected electron diffraction,” Appl. Phys. Lett. 93, 183103 (2008).
[CrossRef]

J. Opt. Soc. Am. A (4)

Nat. Phys. (1)

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-x-ray free-electron laser,” Nat. Phys. 2, 839–843 (2006).
[CrossRef]

Nature (1)

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of X-ray crystallography to allow imaging of micrometer-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[CrossRef]

Optik (Stuttgart) (1)

R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of phase from image and diffraction plane pictures,” Optik (Stuttgart) 35, 237–246 (1972).

Phys. Rev. B (3)

K. Kawahara, K. Gohara, Y. Maehara, T. Dobashi, and O. Kamimura, “Beam-divergence deconvolution for diffractive imaging,” Phys. Rev. B 81, 018404 (2010).
[CrossRef]

J. Miao, T. Ishikawa, E. H. Anderson, and K. O. Hodgson, “Phase retrieval of diffraction patterns from noncrystalline samples using the oversampling method,” Phys. Rev. B 67, 174104 (2003).
[CrossRef]

Y. Nishino, J. Miao, and T. Ishikawa, “Image reconstruction of nanostructured nonperiodic objects only from oversampled hard x-ray diffraction intensities,” Phys. Rev. B 68, 220101(R) (2003).
[CrossRef]

Phys. Rev. Lett. (3)

R. L. Sandberg, A. Paul, D. A. Raymondson, S. Hädrich, D. M. Gaudiosi, J. Holtsnider, R. I. Tobey, O. Cohen, M. M. Murnane, H. C. Kapteyn, C. Song, J. Miao, Y. Liu, and F. Salmassi, “Lensless diffractive imaging using tabletop coherent high-harmonic soft-x-ray beams,” Phys. Rev. Lett. 99, 098103 (2007).
[CrossRef] [PubMed]

J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, “High resolution 3D x-ray diffraction microscopy,” Phys. Rev. Lett. 89, 088303 (2002).
[CrossRef] [PubMed]

J. Miao, Y. Nishino, Y. Kohmura, B. Johnson, C. Song, S. H. Risbud, and T. Ishikawa, “Quantitative image reconstruction of GaN quantum dots from oversampled diffraction intensities alone,” Phys. Rev. Lett. 95, 085503 (2005).
[CrossRef] [PubMed]

Science (1)

J. M. Zuo, I. Vartanyants, M. Gao, R. Zhang, and L. A. Nagahara, “Atomic resolution imaging of a carbon nanotube from diffraction intensities,” Science 300, 1419–1421 (2003).
[CrossRef] [PubMed]

Ultramicroscopy (2)

U. Weierstall, Q. Chen, J. C. H. Spence, M. R. Howells, M. Isaacson, and R. R. Panepucci, “Image reconstruction from electron and X-ray diffraction patterns using iterative algorithms: experiment and simulation,” Ultramicroscopy 90, 171–195 (2002).
[CrossRef] [PubMed]

O. Kamimura, T. Dobashi, K. Kawahara, T. Abe, and K. Gohara, “10-kV diffractive imaging using newly developed electron diffraction microscope,” Ultramicroscopy 110, 130–133 (2010).
[CrossRef]

Other (1)

J. C. H. Spence, in Science of Microscopy, P.W.Hawkes and J.C. H.Spence, eds. (Springer, 2007).

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Figures (4)

Fig. 1
Fig. 1

Gerchberg–Saxton iterative diagram for phase retrieval.

Fig. 2
Fig. 2

(a) ρ org used as the original image. (b) Fourier intensity I org obtained by Fourier transform of ρ org . (c) Poisson-noise-contaminated intensity I noise obtained from Eq. (4). The insets in (b) and (c) are each an enlargement of a quarter.

Fig. 3
Fig. 3

(a)–(c) Three examples of estimated images ρ i ( i = 1 , 2 , 3 ) using three different initial conditions. The noise-contaminated-diffraction pattern in Fig. 2c was used for the diffractive imaging. (d) Average image ρ ¯ taken from the average of 10,000 estimated images { ρ 1 , , ρ 10 , 000 } . (e)–(g) Three examples of estimated images τ i ( i = 1 , 2 , 3 ) chosen during the final stage of iterations. Figure 2c was also used for the diffractive imaging. (h) Average image τ ¯ taken from the average of 10,000 estimated images { τ 1 , , τ 10 , 000 } . (i) Original image ρ org . A line profile along each thin solid horizontal red line is shown just under each image.

Fig. 4
Fig. 4

(a) Histogram A ρ of distance values between average image ρ ¯ and each estimated image ρ j for j = 1 , , 10 , 000 . (b) Histogram A τ of the distance value between the average image τ ¯ and each estimated image τ j for j = 1 , , 10 , 000 . (c) and (d) Histograms B ρ and B τ in the Fourier space that correspond to A ρ and A τ in the object space, respectively. (e) The relationship between the object and Fourier spaces X and K is schematically presented. Various distinct estimated images ( ρ j , with j = 1 , , N ) are distributed around the center ρ ¯ , and their Fourier transformed functions [ F j = F ( ρ j ) , with j = 1 , , N ] are also distributed around the center F ¯ ρ . In the case of the estimated images { τ 1 , , τ N } , the relationship between the two spaces is the same as in the case { ρ 1 , , ρ N } .

Equations (7)

Equations on this page are rendered with MathJax. Learn more.

( ρ obs , ρ obj ) = arg   min ρ 1 S obs , ρ 2 S obj L ( ρ 1 , ρ 2 ) ,
ρ n + 1 ( r ) = { ρ n ( r ) , r ̸ D 0 , r D } ,
ρ n + 1 ( r ) = { ρ n ( r ) , r ̸ D ρ n ( r ) β ρ n ( r ) , r D } ,
Poisson { c I org ( k ) } I noise ( k ) ,
A ρ = { ρ i L ( ρ ¯ , ρ i ) [ s , s + q ) ,     i = 1 , , M } ,
F ( 1 M i = 1 M ρ i ) = 1 M i = 1 M F ( ρ i ) = 1 M i = 1 M F ρ i .
B ρ = { F ρ i L ( F ρ ¯ , F ρ i ) [ t , t + q ) ,     i = 1 , , M } ,

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