Abstract

It is shown that the spatial convolution formulation offers the advantage for direct analysis in the real space of the effects of system-object feature mismatches on the resulting image quality. Imaging systems of various layered Ag-poly(methyl methacrylate) configurations and a variety of square-slit objects were considered for the analysis. The results reveal how those feature mismatches affect the image quality and clarify the previously suggested possible advantage of using a layered Ag superlens over a single-Ag slab of the same total thickness. Those mismatches may eventually be quantified to allow the optimization of a superlens appropriate for imaging a certain object.

© 2010 Optical Society of America

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References

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  1. J. B. Pendry, “Negative refraction makes a perfect lens,” Phys. Rev. Lett. 85, 3966-3969 (2000).
    [CrossRef]
  2. N. Fang, H. Lee, C. Sun, and X. Zhang, “Sub-diffraction-limited optical imaging with a silver superlens,” Science 308, 534-537 (2005).
    [CrossRef]
  3. D. O. S. Melville and R. J. Blaikie, “Super-resolution imaging through a planar silver lens,” Opt. Express 13, 2127-2134 (2005).
    [CrossRef]
  4. V. G. Veselago, “The electrodynamics of substances with simultaneously negative values of ε and μ,” Sov. Phys. Usp. 10, 509-514 (1968).
    [CrossRef]
  5. S. A. Ramakrishna, “Physics of negative refractive index materials,” Rep. Prog. Phys. 68, 449-521 (2005).
    [CrossRef]
  6. B. Wood, J. B. Pendry, and D. P. Tsai, “Directed subwavelength imaging using a layered metal-dielectric system,” Phys. Rev. B 74, 115116 (2006).
    [CrossRef]
  7. D. O. S. Melville and R. J. Blaikie, “Experimental comparison of resolution and pattern fidelity in single and double layer planar lens lithography,” J. Opt. Soc. Am. B 23, 461-467 (2006).
    [CrossRef]
  8. D. O. S. Melville and R. J. Blaikie, “Analysis and optimization of multilayer silver superlens for near-field optical lithography,” Physica B 394, 197-202 (2007).
    [CrossRef]
  9. C. P. Moore, M. D. Arnold, P. J. Bones, and R. J. Blaikie, “Image fidelity for single-layer and multi-layer silver superlens,” J. Opt. Soc. Am. A 25, 911-918 (2008).
    [CrossRef]
  10. K. Lee, Y. Jung, G. Kang, H. Park, and K. Kim, “Active phase control of a Ag near-field superlens via the index mismatch approach,” Appl. Phys. Lett. 94, 101113 (2009).
    [CrossRef]
  11. The result presented in Figs. 4(f) and 4(g) of seems to have a missing factor of (2π)−1 in the calculated intensity.
  12. P. Yeh, Optical Waves in Layered Media (Wiley, 1988).

2009 (1)

K. Lee, Y. Jung, G. Kang, H. Park, and K. Kim, “Active phase control of a Ag near-field superlens via the index mismatch approach,” Appl. Phys. Lett. 94, 101113 (2009).
[CrossRef]

2008 (1)

2007 (1)

D. O. S. Melville and R. J. Blaikie, “Analysis and optimization of multilayer silver superlens for near-field optical lithography,” Physica B 394, 197-202 (2007).
[CrossRef]

2006 (2)

B. Wood, J. B. Pendry, and D. P. Tsai, “Directed subwavelength imaging using a layered metal-dielectric system,” Phys. Rev. B 74, 115116 (2006).
[CrossRef]

D. O. S. Melville and R. J. Blaikie, “Experimental comparison of resolution and pattern fidelity in single and double layer planar lens lithography,” J. Opt. Soc. Am. B 23, 461-467 (2006).
[CrossRef]

2005 (3)

S. A. Ramakrishna, “Physics of negative refractive index materials,” Rep. Prog. Phys. 68, 449-521 (2005).
[CrossRef]

N. Fang, H. Lee, C. Sun, and X. Zhang, “Sub-diffraction-limited optical imaging with a silver superlens,” Science 308, 534-537 (2005).
[CrossRef]

D. O. S. Melville and R. J. Blaikie, “Super-resolution imaging through a planar silver lens,” Opt. Express 13, 2127-2134 (2005).
[CrossRef]

2000 (1)

J. B. Pendry, “Negative refraction makes a perfect lens,” Phys. Rev. Lett. 85, 3966-3969 (2000).
[CrossRef]

1968 (1)

V. G. Veselago, “The electrodynamics of substances with simultaneously negative values of ε and μ,” Sov. Phys. Usp. 10, 509-514 (1968).
[CrossRef]

Arnold, M. D.

Blaikie, R. J.

Bones, P. J.

Fang, N.

N. Fang, H. Lee, C. Sun, and X. Zhang, “Sub-diffraction-limited optical imaging with a silver superlens,” Science 308, 534-537 (2005).
[CrossRef]

Jung, Y.

K. Lee, Y. Jung, G. Kang, H. Park, and K. Kim, “Active phase control of a Ag near-field superlens via the index mismatch approach,” Appl. Phys. Lett. 94, 101113 (2009).
[CrossRef]

Kang, G.

K. Lee, Y. Jung, G. Kang, H. Park, and K. Kim, “Active phase control of a Ag near-field superlens via the index mismatch approach,” Appl. Phys. Lett. 94, 101113 (2009).
[CrossRef]

Kim, K.

K. Lee, Y. Jung, G. Kang, H. Park, and K. Kim, “Active phase control of a Ag near-field superlens via the index mismatch approach,” Appl. Phys. Lett. 94, 101113 (2009).
[CrossRef]

Lee, H.

N. Fang, H. Lee, C. Sun, and X. Zhang, “Sub-diffraction-limited optical imaging with a silver superlens,” Science 308, 534-537 (2005).
[CrossRef]

Lee, K.

K. Lee, Y. Jung, G. Kang, H. Park, and K. Kim, “Active phase control of a Ag near-field superlens via the index mismatch approach,” Appl. Phys. Lett. 94, 101113 (2009).
[CrossRef]

Melville, D. O. S.

Moore, C. P.

Park, H.

K. Lee, Y. Jung, G. Kang, H. Park, and K. Kim, “Active phase control of a Ag near-field superlens via the index mismatch approach,” Appl. Phys. Lett. 94, 101113 (2009).
[CrossRef]

Pendry, J. B.

B. Wood, J. B. Pendry, and D. P. Tsai, “Directed subwavelength imaging using a layered metal-dielectric system,” Phys. Rev. B 74, 115116 (2006).
[CrossRef]

J. B. Pendry, “Negative refraction makes a perfect lens,” Phys. Rev. Lett. 85, 3966-3969 (2000).
[CrossRef]

Ramakrishna, S. A.

S. A. Ramakrishna, “Physics of negative refractive index materials,” Rep. Prog. Phys. 68, 449-521 (2005).
[CrossRef]

Sun, C.

N. Fang, H. Lee, C. Sun, and X. Zhang, “Sub-diffraction-limited optical imaging with a silver superlens,” Science 308, 534-537 (2005).
[CrossRef]

Tsai, D. P.

B. Wood, J. B. Pendry, and D. P. Tsai, “Directed subwavelength imaging using a layered metal-dielectric system,” Phys. Rev. B 74, 115116 (2006).
[CrossRef]

Veselago, V. G.

V. G. Veselago, “The electrodynamics of substances with simultaneously negative values of ε and μ,” Sov. Phys. Usp. 10, 509-514 (1968).
[CrossRef]

Wood, B.

B. Wood, J. B. Pendry, and D. P. Tsai, “Directed subwavelength imaging using a layered metal-dielectric system,” Phys. Rev. B 74, 115116 (2006).
[CrossRef]

Yeh, P.

P. Yeh, Optical Waves in Layered Media (Wiley, 1988).

Zhang, X.

N. Fang, H. Lee, C. Sun, and X. Zhang, “Sub-diffraction-limited optical imaging with a silver superlens,” Science 308, 534-537 (2005).
[CrossRef]

Appl. Phys. Lett. (1)

K. Lee, Y. Jung, G. Kang, H. Park, and K. Kim, “Active phase control of a Ag near-field superlens via the index mismatch approach,” Appl. Phys. Lett. 94, 101113 (2009).
[CrossRef]

J. Opt. Soc. Am. A (1)

J. Opt. Soc. Am. B (1)

Opt. Express (1)

Phys. Rev. B (1)

B. Wood, J. B. Pendry, and D. P. Tsai, “Directed subwavelength imaging using a layered metal-dielectric system,” Phys. Rev. B 74, 115116 (2006).
[CrossRef]

Phys. Rev. Lett. (1)

J. B. Pendry, “Negative refraction makes a perfect lens,” Phys. Rev. Lett. 85, 3966-3969 (2000).
[CrossRef]

Physica B (1)

D. O. S. Melville and R. J. Blaikie, “Analysis and optimization of multilayer silver superlens for near-field optical lithography,” Physica B 394, 197-202 (2007).
[CrossRef]

Rep. Prog. Phys. (1)

S. A. Ramakrishna, “Physics of negative refractive index materials,” Rep. Prog. Phys. 68, 449-521 (2005).
[CrossRef]

Science (1)

N. Fang, H. Lee, C. Sun, and X. Zhang, “Sub-diffraction-limited optical imaging with a silver superlens,” Science 308, 534-537 (2005).
[CrossRef]

Sov. Phys. Usp. (1)

V. G. Veselago, “The electrodynamics of substances with simultaneously negative values of ε and μ,” Sov. Phys. Usp. 10, 509-514 (1968).
[CrossRef]

Other (2)

The result presented in Figs. 4(f) and 4(g) of seems to have a missing factor of (2π)−1 in the calculated intensity.

P. Yeh, Optical Waves in Layered Media (Wiley, 1988).

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