J. M. Tamkin, B. Bagwell, B. Kimbrough, G. Jabbour, and M. Descour, “High speed gray scale laser direct write technology for micro-optic fabrication,” Proc. SPIE 4984, 210-218 (2003).

[Crossref]

E. Marx, J. J. Malik, Y. E. Strausser, T. Bristow, N. Poduje, and J. C. Stover, “Power spectral densities: A multiple technique study of different Si wafer surface,” J. Vac. Sci. Technol. B 20, 31-41 (2002).

[Crossref]

H. N. Yang, Y. P. Zhao, A. Chan, T. M. Lu, and G. C. Wang, “Sampling-induced hidden cycles in correlated random rough surfaces,” Phys. Rev. B 56, 4224-4232 (1997).

[Crossref]

I. A. Popov, N. V. Sidorovsky, and L. M. Veselov, “Statistical properties of non-Gaussian intensity fluctuations in the image plane of an optical system,” Opt. Commun. 134, 289-300 (1997).

[Crossref]

D. G. Voelz, K. A. Bush, and P. S. Idell, “Illumination coherence effects in laser-speckle imaging: modeling and experimental demonstration,” Appl. Opt. 36, 1781-1788 (1997).

[Crossref]
[PubMed]

G. Palasantzas, “Roughness spectrum and surface width of self-affine fractal surfaces via the K-correlation model,” Phys. Rev. B 48, 14472-14478 (1993).

[Crossref]

J. Krim, I. Heyvaert, C. Van Haesendonck, and Y. Bruynseraede, “Scanning tunneling microscopy observation of self-affine fractal roughness in ion-bombarded film surfaces,” Phys. Rev. Lett. 70, 57-60 (1993).

[Crossref]
[PubMed]

I. A. Popov, N. V. Sidorovsky, and L. M. Veselov, “Experimental study of intensity probability density function in the speckle pattern formed by a small number of scatterers,” Opt. Commun. 97, 304-306 (1993).

[Crossref]

L. Weng, J. M. Reid, P. Mohana Shankar, and K. Soetanto, “Ultrasound speckle analysis based on the K distribution,” J. Acoust. Soc. Am. 89, 2992-2995 (1991).

[Crossref]
[PubMed]

E. L. Church and P. Z. Takacs, “The optimal estimation of finish parameters,” Proc. SPIE 1530, 71-85 (1991).

[Crossref]

A. Majumdar and C. L. Tien, “Fractal characterization and simulation of rough surfaces,” Wear 136, 313-327 (1990).

[Crossref]

D. S. Goodman and A. E. Rosenbluth, “Condenser aberrations in Kohler illumination,” Proc. SPIE 922, 108-134 (1988).

P. K. Murphy, J. P. Allebach, and N. C. Gallagher, “Effect of optical aberrations on laser speckle,” J. Opt. Soc. Am. A 3, 215-222 (1986).

[Crossref]

R. Barakat, “Weak-scatterer generalization of the K-density function with application to laser scattering in atmospheric turbulence,” J. Opt. Soc. Am. A 3, 401-409 (1986).

[Crossref]

B. M. Levine, “Non-Gaussian speckle caused by thin phase screens of large root-mean-square phase variations and long single-scale autocorrelations,” J. Opt. Soc. Am. A 3, 1283-1292 (1986).

[Crossref]

E. Jakeman, “Speckle statistics with a small number of scatterers,” Opt. Eng. (Bellingham) 23, 453-461 (1984).

D. L. Jordan, R. C. Hollins, and E. Jakeman, “Experimental measurements of non-Gaussian scattering by a fractal diffuser,” Appl. Phys. B: Photophys. Laser Chem. 31, 179-186 (1983).

[Crossref]

B. M. Levine and J. C. Dainty, “Non-Gaussian image plane speckle: Measurements from diffusers of known statistics,” Opt. Commun. 45, 252-257 (1983).

[Crossref]

J. Uozumi and T. Asakura, “The first-order statistics of partially developed non-Gaussian speckle patterns,” J. Opt. 12, 177-186 (1981).

[Crossref]

E. Jakeman and J. G. McWhirter, “Non-Gaussian scattering by a random phase screen,” Appl. Phys. B: Photophys. Laser Chem. 26, 125-131 (1981).

[Crossref]

R. D. Bahuguna, K. K. Gupta, and K. Singh, “Study of laser speckles in the presence of spherical aberration,” J. Opt. Soc. Am. 69, 877-882 (1979).

[Crossref]

M. V. Berry, “Diffractals,” J. Phys. A 12, 781-797 (1979).

[Crossref]

P. J. Chandley and H. M. Escamilla, “Speckle from a rough surface when the illuminated region contains few correlation areas: the effect of changing the surface height variance,” Opt. Commun. 29, 151-154 (1979).

[Crossref]

H. Ohtsubo and T. Asakura, “Measurement of surface roughness properties using speckle patterns with non-Gaussian statistics,” Opt. Commun. 25, 315-319 (1978).

[Crossref]

E. Jakeman and P. N. Pussy, “Significance of K distribution in scattering experiments,” Phys. Rev. Lett. 40, 546-550 (1978).

[Crossref]

J. Ohtsubo and T. Asakura, “Statistical properties of speckle intensity variations in the diffraction field under illumination of coherent light,” Opt. Commun. 14, 30-34 (1975).

[Crossref]

H. Fujii and T. Asakura, “A contrast variation of image speckle intensity under illumination of partially coherent light,” Opt. Commun. 12, 32-38 (1974).

[Crossref]

J. Uozumi and T. Asakura, “The first-order statistics of partially developed non-Gaussian speckle patterns,” J. Opt. 12, 177-186 (1981).

[Crossref]

H. Ohtsubo and T. Asakura, “Measurement of surface roughness properties using speckle patterns with non-Gaussian statistics,” Opt. Commun. 25, 315-319 (1978).

[Crossref]

H. Fujii and T. Asakura, “Effect of the point spread function on the average contrast of image speckle patterns,” Opt. Commun. 21, 80-84 (1977).

[Crossref]

J. Ohtsubo and T. Asakura, “Statistical properties of speckle intensity variations in the diffraction field under illumination of coherent light,” Opt. Commun. 14, 30-34 (1975).

[Crossref]

H. Fujii and T. Asakura, “A contrast variation of image speckle intensity under illumination of partially coherent light,” Opt. Commun. 12, 32-38 (1974).

[Crossref]

J. M. Tamkin, B. Bagwell, B. Kimbrough, G. Jabbour, and M. Descour, “High speed gray scale laser direct write technology for micro-optic fabrication,” Proc. SPIE 4984, 210-218 (2003).

[Crossref]

R. D. Bahuguna, K. K. Gupta, and K. Singh, “Speckle patterns of weak diffusers: effect of spherical aberration,” Appl. Opt. 19, 1874-1878 (1980).

[Crossref]
[PubMed]

R. D. Bahuguna, K. K. Gupta, and K. Singh, “Study of laser speckles in the presence of spherical aberration,” J. Opt. Soc. Am. 69, 877-882 (1979).

[Crossref]

M. V. Berry, “Diffractals,” J. Phys. A 12, 781-797 (1979).

[Crossref]

E. Marx, J. J. Malik, Y. E. Strausser, T. Bristow, N. Poduje, and J. C. Stover, “Power spectral densities: A multiple technique study of different Si wafer surface,” J. Vac. Sci. Technol. B 20, 31-41 (2002).

[Crossref]

J. Krim, I. Heyvaert, C. Van Haesendonck, and Y. Bruynseraede, “Scanning tunneling microscopy observation of self-affine fractal roughness in ion-bombarded film surfaces,” Phys. Rev. Lett. 70, 57-60 (1993).

[Crossref]
[PubMed]

H. N. Yang, Y. P. Zhao, A. Chan, T. M. Lu, and G. C. Wang, “Sampling-induced hidden cycles in correlated random rough surfaces,” Phys. Rev. B 56, 4224-4232 (1997).

[Crossref]

P. J. Chandley and H. M. Escamilla, “Speckle from a rough surface when the illuminated region contains few correlation areas: the effect of changing the surface height variance,” Opt. Commun. 29, 151-154 (1979).

[Crossref]

E. L. Church and P. Z. Takacs, “The optimal estimation of finish parameters,” Proc. SPIE 1530, 71-85 (1991).

[Crossref]

B. M. Levine and J. C. Dainty, “Non-Gaussian image plane speckle: Measurements from diffusers of known statistics,” Opt. Commun. 45, 252-257 (1983).

[Crossref]

J. C. Dainty, A. E. Ennos, M. Francon, J. W. Goodman, T. S. McKechnie, and G. Parry, Laser Speckle and Related Phenomena (Springer-Verlag, 1984).

J. M. Tamkin, B. Bagwell, B. Kimbrough, G. Jabbour, and M. Descour, “High speed gray scale laser direct write technology for micro-optic fabrication,” Proc. SPIE 4984, 210-218 (2003).

[Crossref]

J. C. Dainty, A. E. Ennos, M. Francon, J. W. Goodman, T. S. McKechnie, and G. Parry, Laser Speckle and Related Phenomena (Springer-Verlag, 1984).

P. J. Chandley and H. M. Escamilla, “Speckle from a rough surface when the illuminated region contains few correlation areas: the effect of changing the surface height variance,” Opt. Commun. 29, 151-154 (1979).

[Crossref]

J. C. Dainty, A. E. Ennos, M. Francon, J. W. Goodman, T. S. McKechnie, and G. Parry, Laser Speckle and Related Phenomena (Springer-Verlag, 1984).

H. Fujii and T. Asakura, “Effect of the point spread function on the average contrast of image speckle patterns,” Opt. Commun. 21, 80-84 (1977).

[Crossref]

H. Fujii and T. Asakura, “A contrast variation of image speckle intensity under illumination of partially coherent light,” Opt. Commun. 12, 32-38 (1974).

[Crossref]

D. S. Goodman and A. E. Rosenbluth, “Condenser aberrations in Kohler illumination,” Proc. SPIE 922, 108-134 (1988).

J. W. Goodman, Speckle Phenomena in Optics (Roberts, 2007).

J. C. Dainty, A. E. Ennos, M. Francon, J. W. Goodman, T. S. McKechnie, and G. Parry, Laser Speckle and Related Phenomena (Springer-Verlag, 1984).

R. D. Bahuguna, K. K. Gupta, and K. Singh, “Speckle patterns of weak diffusers: effect of spherical aberration,” Appl. Opt. 19, 1874-1878 (1980).

[Crossref]
[PubMed]

R. D. Bahuguna, K. K. Gupta, and K. Singh, “Study of laser speckles in the presence of spherical aberration,” J. Opt. Soc. Am. 69, 877-882 (1979).

[Crossref]

J. Krim, I. Heyvaert, C. Van Haesendonck, and Y. Bruynseraede, “Scanning tunneling microscopy observation of self-affine fractal roughness in ion-bombarded film surfaces,” Phys. Rev. Lett. 70, 57-60 (1993).

[Crossref]
[PubMed]

D. L. Jordan, R. C. Hollins, and E. Jakeman, “Experimental measurements of non-Gaussian scattering by a fractal diffuser,” Appl. Phys. B: Photophys. Laser Chem. 31, 179-186 (1983).

[Crossref]

J. M. Tamkin, B. Bagwell, B. Kimbrough, G. Jabbour, and M. Descour, “High speed gray scale laser direct write technology for micro-optic fabrication,” Proc. SPIE 4984, 210-218 (2003).

[Crossref]

E. Jakeman, “Speckle statistics with a small number of scatterers,” Opt. Eng. (Bellingham) 23, 453-461 (1984).

D. L. Jordan, R. C. Hollins, and E. Jakeman, “Experimental measurements of non-Gaussian scattering by a fractal diffuser,” Appl. Phys. B: Photophys. Laser Chem. 31, 179-186 (1983).

[Crossref]

E. Jakeman, “Fresnel scattering by a corrugated random surface with fractal slope,” J. Opt. Soc. Am. 72, 1034-1041 (1982).

[Crossref]

E. Jakeman and J. G. McWhirter, “Non-Gaussian scattering by a random phase screen,” Appl. Phys. B: Photophys. Laser Chem. 26, 125-131 (1981).

[Crossref]

E. Jakeman and P. N. Pussy, “Significance of K distribution in scattering experiments,” Phys. Rev. Lett. 40, 546-550 (1978).

[Crossref]

D. L. Jordan, R. C. Hollins, and E. Jakeman, “Experimental measurements of non-Gaussian scattering by a fractal diffuser,” Appl. Phys. B: Photophys. Laser Chem. 31, 179-186 (1983).

[Crossref]

J. M. Tamkin, B. Bagwell, B. Kimbrough, G. Jabbour, and M. Descour, “High speed gray scale laser direct write technology for micro-optic fabrication,” Proc. SPIE 4984, 210-218 (2003).

[Crossref]

J. Krim, I. Heyvaert, C. Van Haesendonck, and Y. Bruynseraede, “Scanning tunneling microscopy observation of self-affine fractal roughness in ion-bombarded film surfaces,” Phys. Rev. Lett. 70, 57-60 (1993).

[Crossref]
[PubMed]

H. N. Yang, Y. P. Zhao, A. Chan, T. M. Lu, and G. C. Wang, “Sampling-induced hidden cycles in correlated random rough surfaces,” Phys. Rev. B 56, 4224-4232 (1997).

[Crossref]

A. Majumdar and C. L. Tien, “Fractal characterization and simulation of rough surfaces,” Wear 136, 313-327 (1990).

[Crossref]

E. Marx, J. J. Malik, Y. E. Strausser, T. Bristow, N. Poduje, and J. C. Stover, “Power spectral densities: A multiple technique study of different Si wafer surface,” J. Vac. Sci. Technol. B 20, 31-41 (2002).

[Crossref]

E. Marx, J. J. Malik, Y. E. Strausser, T. Bristow, N. Poduje, and J. C. Stover, “Power spectral densities: A multiple technique study of different Si wafer surface,” J. Vac. Sci. Technol. B 20, 31-41 (2002).

[Crossref]

T. S. McKechnie, “Image-plane speckle in partially coherent illumination,” Opt. Quantum Electron. 8, 61-67 (1976).

[Crossref]

J. C. Dainty, A. E. Ennos, M. Francon, J. W. Goodman, T. S. McKechnie, and G. Parry, Laser Speckle and Related Phenomena (Springer-Verlag, 1984).

E. Jakeman and J. G. McWhirter, “Non-Gaussian scattering by a random phase screen,” Appl. Phys. B: Photophys. Laser Chem. 26, 125-131 (1981).

[Crossref]

H. Ohtsubo and T. Asakura, “Measurement of surface roughness properties using speckle patterns with non-Gaussian statistics,” Opt. Commun. 25, 315-319 (1978).

[Crossref]

J. Ohtsubo and T. Asakura, “Statistical properties of speckle intensity variations in the diffraction field under illumination of coherent light,” Opt. Commun. 14, 30-34 (1975).

[Crossref]

G. Palasantzas, “Roughness spectrum and surface width of self-affine fractal surfaces via the K-correlation model,” Phys. Rev. B 48, 14472-14478 (1993).

[Crossref]

J. C. Dainty, A. E. Ennos, M. Francon, J. W. Goodman, T. S. McKechnie, and G. Parry, Laser Speckle and Related Phenomena (Springer-Verlag, 1984).

E. Marx, J. J. Malik, Y. E. Strausser, T. Bristow, N. Poduje, and J. C. Stover, “Power spectral densities: A multiple technique study of different Si wafer surface,” J. Vac. Sci. Technol. B 20, 31-41 (2002).

[Crossref]

I. A. Popov, N. V. Sidorovsky, and L. M. Veselov, “Statistical properties of non-Gaussian intensity fluctuations in the image plane of an optical system,” Opt. Commun. 134, 289-300 (1997).

[Crossref]

I. A. Popov, N. V. Sidorovsky, and L. M. Veselov, “Experimental study of intensity probability density function in the speckle pattern formed by a small number of scatterers,” Opt. Commun. 97, 304-306 (1993).

[Crossref]

E. Jakeman and P. N. Pussy, “Significance of K distribution in scattering experiments,” Phys. Rev. Lett. 40, 546-550 (1978).

[Crossref]

L. Weng, J. M. Reid, P. Mohana Shankar, and K. Soetanto, “Ultrasound speckle analysis based on the K distribution,” J. Acoust. Soc. Am. 89, 2992-2995 (1991).

[Crossref]
[PubMed]

D. S. Goodman and A. E. Rosenbluth, “Condenser aberrations in Kohler illumination,” Proc. SPIE 922, 108-134 (1988).

L. Weng, J. M. Reid, P. Mohana Shankar, and K. Soetanto, “Ultrasound speckle analysis based on the K distribution,” J. Acoust. Soc. Am. 89, 2992-2995 (1991).

[Crossref]
[PubMed]

I. A. Popov, N. V. Sidorovsky, and L. M. Veselov, “Statistical properties of non-Gaussian intensity fluctuations in the image plane of an optical system,” Opt. Commun. 134, 289-300 (1997).

[Crossref]

I. A. Popov, N. V. Sidorovsky, and L. M. Veselov, “Experimental study of intensity probability density function in the speckle pattern formed by a small number of scatterers,” Opt. Commun. 97, 304-306 (1993).

[Crossref]

R. D. Bahuguna, K. K. Gupta, and K. Singh, “Speckle patterns of weak diffusers: effect of spherical aberration,” Appl. Opt. 19, 1874-1878 (1980).

[Crossref]
[PubMed]

R. D. Bahuguna, K. K. Gupta, and K. Singh, “Study of laser speckles in the presence of spherical aberration,” J. Opt. Soc. Am. 69, 877-882 (1979).

[Crossref]

L. Weng, J. M. Reid, P. Mohana Shankar, and K. Soetanto, “Ultrasound speckle analysis based on the K distribution,” J. Acoust. Soc. Am. 89, 2992-2995 (1991).

[Crossref]
[PubMed]

E. Marx, J. J. Malik, Y. E. Strausser, T. Bristow, N. Poduje, and J. C. Stover, “Power spectral densities: A multiple technique study of different Si wafer surface,” J. Vac. Sci. Technol. B 20, 31-41 (2002).

[Crossref]

E. Marx, J. J. Malik, Y. E. Strausser, T. Bristow, N. Poduje, and J. C. Stover, “Power spectral densities: A multiple technique study of different Si wafer surface,” J. Vac. Sci. Technol. B 20, 31-41 (2002).

[Crossref]

E. L. Church and P. Z. Takacs, “The optimal estimation of finish parameters,” Proc. SPIE 1530, 71-85 (1991).

[Crossref]

J. M. Tamkin, B. Bagwell, B. Kimbrough, G. Jabbour, and M. Descour, “High speed gray scale laser direct write technology for micro-optic fabrication,” Proc. SPIE 4984, 210-218 (2003).

[Crossref]

A. Majumdar and C. L. Tien, “Fractal characterization and simulation of rough surfaces,” Wear 136, 313-327 (1990).

[Crossref]

J. Uozumi and T. Asakura, “The first-order statistics of partially developed non-Gaussian speckle patterns,” J. Opt. 12, 177-186 (1981).

[Crossref]

J. Krim, I. Heyvaert, C. Van Haesendonck, and Y. Bruynseraede, “Scanning tunneling microscopy observation of self-affine fractal roughness in ion-bombarded film surfaces,” Phys. Rev. Lett. 70, 57-60 (1993).

[Crossref]
[PubMed]

I. A. Popov, N. V. Sidorovsky, and L. M. Veselov, “Statistical properties of non-Gaussian intensity fluctuations in the image plane of an optical system,” Opt. Commun. 134, 289-300 (1997).

[Crossref]

I. A. Popov, N. V. Sidorovsky, and L. M. Veselov, “Experimental study of intensity probability density function in the speckle pattern formed by a small number of scatterers,” Opt. Commun. 97, 304-306 (1993).

[Crossref]

H. N. Yang, Y. P. Zhao, A. Chan, T. M. Lu, and G. C. Wang, “Sampling-induced hidden cycles in correlated random rough surfaces,” Phys. Rev. B 56, 4224-4232 (1997).

[Crossref]

L. Weng, J. M. Reid, P. Mohana Shankar, and K. Soetanto, “Ultrasound speckle analysis based on the K distribution,” J. Acoust. Soc. Am. 89, 2992-2995 (1991).

[Crossref]
[PubMed]

H. N. Yang, Y. P. Zhao, A. Chan, T. M. Lu, and G. C. Wang, “Sampling-induced hidden cycles in correlated random rough surfaces,” Phys. Rev. B 56, 4224-4232 (1997).

[Crossref]

H. N. Yang, Y. P. Zhao, A. Chan, T. M. Lu, and G. C. Wang, “Sampling-induced hidden cycles in correlated random rough surfaces,” Phys. Rev. B 56, 4224-4232 (1997).

[Crossref]

D. G. Voelz, K. A. Bush, and P. S. Idell, “Illumination coherence effects in laser-speckle imaging: modeling and experimental demonstration,” Appl. Opt. 36, 1781-1788 (1997).

[Crossref]
[PubMed]

R. D. Bahuguna, K. K. Gupta, and K. Singh, “Speckle patterns of weak diffusers: effect of spherical aberration,” Appl. Opt. 19, 1874-1878 (1980).

[Crossref]
[PubMed]

E. Jakeman and J. G. McWhirter, “Non-Gaussian scattering by a random phase screen,” Appl. Phys. B: Photophys. Laser Chem. 26, 125-131 (1981).

[Crossref]

D. L. Jordan, R. C. Hollins, and E. Jakeman, “Experimental measurements of non-Gaussian scattering by a fractal diffuser,” Appl. Phys. B: Photophys. Laser Chem. 31, 179-186 (1983).

[Crossref]

L. Weng, J. M. Reid, P. Mohana Shankar, and K. Soetanto, “Ultrasound speckle analysis based on the K distribution,” J. Acoust. Soc. Am. 89, 2992-2995 (1991).

[Crossref]
[PubMed]

J. Uozumi and T. Asakura, “The first-order statistics of partially developed non-Gaussian speckle patterns,” J. Opt. 12, 177-186 (1981).

[Crossref]

H. M. Pedersen, “Theory of speckle dependence on surface roughness,” J. Opt. Soc. Am. 66, 1204-1210 (1976).

[Crossref]

K. A. Stetson, “The vulnerability of speckle photography to lens aberrations,” J. Opt. Soc. Am. 67, 1587-1590 (1977).

[Crossref]

R. D. Bahuguna, K. K. Gupta, and K. Singh, “Study of laser speckles in the presence of spherical aberration,” J. Opt. Soc. Am. 69, 877-882 (1979).

[Crossref]

E. Jakeman, “Fresnel scattering by a corrugated random surface with fractal slope,” J. Opt. Soc. Am. 72, 1034-1041 (1982).

[Crossref]

R. Barakat, “Weak-scatterer generalization of the K-density function with application to laser scattering in atmospheric turbulence,” J. Opt. Soc. Am. A 3, 401-409 (1986).

[Crossref]

B. M. Levine, “Non-Gaussian speckle caused by thin phase screens of large root-mean-square phase variations and long single-scale autocorrelations,” J. Opt. Soc. Am. A 3, 1283-1292 (1986).

[Crossref]

P. K. Murphy, J. P. Allebach, and N. C. Gallagher, “Effect of optical aberrations on laser speckle,” J. Opt. Soc. Am. A 3, 215-222 (1986).

[Crossref]

M. V. Berry, “Diffractals,” J. Phys. A 12, 781-797 (1979).

[Crossref]

E. Marx, J. J. Malik, Y. E. Strausser, T. Bristow, N. Poduje, and J. C. Stover, “Power spectral densities: A multiple technique study of different Si wafer surface,” J. Vac. Sci. Technol. B 20, 31-41 (2002).

[Crossref]

I. A. Popov, N. V. Sidorovsky, and L. M. Veselov, “Statistical properties of non-Gaussian intensity fluctuations in the image plane of an optical system,” Opt. Commun. 134, 289-300 (1997).

[Crossref]

J. Ohtsubo and T. Asakura, “Statistical properties of speckle intensity variations in the diffraction field under illumination of coherent light,” Opt. Commun. 14, 30-34 (1975).

[Crossref]

B. M. Levine and J. C. Dainty, “Non-Gaussian image plane speckle: Measurements from diffusers of known statistics,” Opt. Commun. 45, 252-257 (1983).

[Crossref]

I. A. Popov, N. V. Sidorovsky, and L. M. Veselov, “Experimental study of intensity probability density function in the speckle pattern formed by a small number of scatterers,” Opt. Commun. 97, 304-306 (1993).

[Crossref]

H. Ohtsubo and T. Asakura, “Measurement of surface roughness properties using speckle patterns with non-Gaussian statistics,” Opt. Commun. 25, 315-319 (1978).

[Crossref]

P. J. Chandley and H. M. Escamilla, “Speckle from a rough surface when the illuminated region contains few correlation areas: the effect of changing the surface height variance,” Opt. Commun. 29, 151-154 (1979).

[Crossref]

H. Fujii and T. Asakura, “Effect of the point spread function on the average contrast of image speckle patterns,” Opt. Commun. 21, 80-84 (1977).

[Crossref]

H. Fujii and T. Asakura, “A contrast variation of image speckle intensity under illumination of partially coherent light,” Opt. Commun. 12, 32-38 (1974).

[Crossref]

E. Jakeman, “Speckle statistics with a small number of scatterers,” Opt. Eng. (Bellingham) 23, 453-461 (1984).

T. S. McKechnie, “Image-plane speckle in partially coherent illumination,” Opt. Quantum Electron. 8, 61-67 (1976).

[Crossref]

G. Palasantzas, “Roughness spectrum and surface width of self-affine fractal surfaces via the K-correlation model,” Phys. Rev. B 48, 14472-14478 (1993).

[Crossref]

H. N. Yang, Y. P. Zhao, A. Chan, T. M. Lu, and G. C. Wang, “Sampling-induced hidden cycles in correlated random rough surfaces,” Phys. Rev. B 56, 4224-4232 (1997).

[Crossref]

J. Krim, I. Heyvaert, C. Van Haesendonck, and Y. Bruynseraede, “Scanning tunneling microscopy observation of self-affine fractal roughness in ion-bombarded film surfaces,” Phys. Rev. Lett. 70, 57-60 (1993).

[Crossref]
[PubMed]

E. Jakeman and P. N. Pussy, “Significance of K distribution in scattering experiments,” Phys. Rev. Lett. 40, 546-550 (1978).

[Crossref]

E. L. Church and P. Z. Takacs, “The optimal estimation of finish parameters,” Proc. SPIE 1530, 71-85 (1991).

[Crossref]

J. M. Tamkin, B. Bagwell, B. Kimbrough, G. Jabbour, and M. Descour, “High speed gray scale laser direct write technology for micro-optic fabrication,” Proc. SPIE 4984, 210-218 (2003).

[Crossref]

D. S. Goodman and A. E. Rosenbluth, “Condenser aberrations in Kohler illumination,” Proc. SPIE 922, 108-134 (1988).

A. Majumdar and C. L. Tien, “Fractal characterization and simulation of rough surfaces,” Wear 136, 313-327 (1990).

[Crossref]

D. Kang and T. D. Milster, “Effect of optical aberration on Gaussian speckle in a partially coherent imaging system,” submitted to J. Opt. Soc. Am. A.

J. C. Dainty, A. E. Ennos, M. Francon, J. W. Goodman, T. S. McKechnie, and G. Parry, Laser Speckle and Related Phenomena (Springer-Verlag, 1984).

J. W. Goodman, Speckle Phenomena in Optics (Roberts, 2007).