Abstract

Appropriate surface termination is used to improve dramatically the subwavelength imaging resolution of a multilayered positive–negative permittivity structure operating in the infrared or optical canalization regime. The imaging resolution of the improved multilayered structure resists practical material loss well, and it is not sensitive to the thickness of the interface layers, the total thickness, nor the period of the multilayered structure. Such a structure can be used to transfer a subwavelength image to a far distance through a thick structure.

© 2008 Optical Society of America

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