Abstract

We consider lamellar gratings made of dielectric or lossy materials used in classical diffraction mounts. We show how the modal diffraction formulation may be generalized to deal with slanted lamellar gratings and illustrate the accuracy and versatility of the new method through study of highly slanted gratings in a homogenization limit. We also comment on the completeness of the eigenmode basis and present tests enabling this completeness to be verified numerically.

© 2008 Optical Society of America

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