Abstract

Two-dimensional target characterization using inverse profiling approaches with total-field phaseless data is discussed. Two different inversion schemes are compared. In the first one, the intensity-only data are exploited in a minimization scheme, thanks to a proper definition of the cost functional. Specific normalization and starting guess are introduced to avoid the need for global optimization methods. In the second scheme [J. Opt. Soc. Am. A 21, 622 (2004) ], one exploits the field properties and the theoretical results on the inversion of quadratic operators to derive a two-step solution strategy, wherein the (complex) scattered fields embedded in the available data are retrieved first and then a traditional inverse scattering problem is solved. In both cases, the analytical properties of the fields allow one to properly fix the measurement setup and identify the more convenient strategy to adopt. Also, indications on the number and types of sources and receivers to be used are given. Results from experimental data show the efficiency of these approaches and the tools introduced.

© 2008 Optical Society of America

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