W. J. Chen, P. Bu, S. Z. Zheng, and X. Y. Su, "Study on Fourier transforms profilometry based on bi-color projecting," Opt. Laser Technol. 39, 821-827 (2007).

[CrossRef]

C. G. Quan, C. J. Tay, and L. J. Chen, "Fringe-density estimation by continuous wavelet transform," Appl. Opt. 44, 2359-2365 (2005).

[CrossRef]
[PubMed]

J. Vanherzeele, P. Guillaume, and S. Vanlanduit, "Fourier fringe processing using a regressive Fourier-transform technique," Opt. Lasers Eng. 43, 645-658 (2005).

[CrossRef]

V. Zlatko and G. Jadranko, "Phase retrieval errors in standard Fourier fringe analysis of digitally sampled model interferograms," Appl. Opt. 44, 6940-6947 (2005).

[CrossRef]

H. W. Guo, H. T. He, Y. J. Yu, and M. Y. Chen, "Least-squares calibration method for fringe projection profilometry," Opt. Eng. (Bellingham) 44, 033603 (2005).

[CrossRef]

X. L. Zhang, Y. C. Lin, M. R. Zhao, X. B. Niu, and Y. G. Huang, "Calibration of a fringe projection profilometry system using virtual phase calibrating model planes," J. Opt. A, Pure Appl. Opt. 7, 192-197 (2005).

[CrossRef]

G. Dinesh, J. Joby, and S. Kehar, "Object reconstruction in multilayer neural network based profilometry using grating structure comprising two regions with different spatial periods," Opt. Lasers Eng. 42, 179-192 (2004).

[CrossRef]

H. Y. Liu, W. H. Su, K. Reichard, and S. Z. Yin, "Calibration-based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement," Opt. Commun. 216, 65-801 (2003).

[CrossRef]

X. Y. Su and W. J. Chen, "Fourier transform profilometry: a review," Opt. Lasers Eng. 35, 263-284 (2001).

[CrossRef]

F. J. Cuevas, M. Servin, and O. N. Stavroudis, "Multi-layer neural network applied to phase and depth recovery from fringe patterns," Opt. Commun. 181, 239-259 (2000).

[CrossRef]

G. S. Spagnolo, G. Guattari, C. Sapia, D. Ambrosini, D. Paoletti, and G. Accardo, "Contouring of artwork surface by fringe projection and FFT analysis," Opt. Lasers Eng. 33, 141-156 (2000).

[CrossRef]

F. J. Cuevas, M. Servin, and R. Rodriguez-Vera, "Depth object recovery using radial basis functions," Opt. Commun. 163, 270-277 (1999).

[CrossRef]

W. J. Chen and X. Y. Su, "Error caused by sampling in Fourier transform profilometry," Opt. Eng. (Bellingham) 38, 1029-1034 (1999).

[CrossRef]

W. S. Zhou and X. Y. Su, "A direct mapping algorithm for phase-measuring profilometry," J. Mod. Opt. 41, 89-94 (1994).

[CrossRef]

J. Li, X.-Y. Su, and L.-R. Guo, "Improved Fourier transform profilometry of the automatic measurement of three-dimensional object shapes," Opt. Eng. (Bellingham) 29, 1439-1444 (1990).

[CrossRef]

H. Takasaki, "Moiré topography," Appl. Opt. 9, 1467-1472 (1970).

[CrossRef]
[PubMed]

V. Srinivasan, H. C. Lui, and M. Halioua, "Automatic phase measuring profilometry of 3-D diffuse object," Appl. Opt. 23, 3105-3108 (1984).

[CrossRef]
[PubMed]

M. Takeda and K. Mutoh, "Fourier transform profilometry for the automatic measurement of 3-D object shapes," Appl. Opt. 22, 3977-3982 (1983).

[CrossRef]
[PubMed]

V. Zlatko and G. Jadranko, "Phase retrieval errors in standard Fourier fringe analysis of digitally sampled model interferograms," Appl. Opt. 44, 6940-6947 (2005).

[CrossRef]

C. G. Quan, C. J. Tay, and L. J. Chen, "Fringe-density estimation by continuous wavelet transform," Appl. Opt. 44, 2359-2365 (2005).

[CrossRef]
[PubMed]

W. S. Zhou and X. Y. Su, "A direct mapping algorithm for phase-measuring profilometry," J. Mod. Opt. 41, 89-94 (1994).

[CrossRef]

X. L. Zhang, Y. C. Lin, M. R. Zhao, X. B. Niu, and Y. G. Huang, "Calibration of a fringe projection profilometry system using virtual phase calibrating model planes," J. Opt. A, Pure Appl. Opt. 7, 192-197 (2005).

[CrossRef]

H. Y. Liu, W. H. Su, K. Reichard, and S. Z. Yin, "Calibration-based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement," Opt. Commun. 216, 65-801 (2003).

[CrossRef]

F. J. Cuevas, M. Servin, and R. Rodriguez-Vera, "Depth object recovery using radial basis functions," Opt. Commun. 163, 270-277 (1999).

[CrossRef]

F. J. Cuevas, M. Servin, and O. N. Stavroudis, "Multi-layer neural network applied to phase and depth recovery from fringe patterns," Opt. Commun. 181, 239-259 (2000).

[CrossRef]

J. Li, X.-Y. Su, and L.-R. Guo, "Improved Fourier transform profilometry of the automatic measurement of three-dimensional object shapes," Opt. Eng. (Bellingham) 29, 1439-1444 (1990).

[CrossRef]

W. J. Chen and X. Y. Su, "Error caused by sampling in Fourier transform profilometry," Opt. Eng. (Bellingham) 38, 1029-1034 (1999).

[CrossRef]

H. W. Guo, H. T. He, Y. J. Yu, and M. Y. Chen, "Least-squares calibration method for fringe projection profilometry," Opt. Eng. (Bellingham) 44, 033603 (2005).

[CrossRef]

W. J. Chen, P. Bu, S. Z. Zheng, and X. Y. Su, "Study on Fourier transforms profilometry based on bi-color projecting," Opt. Laser Technol. 39, 821-827 (2007).

[CrossRef]

X. Y. Su and W. J. Chen, "Fourier transform profilometry: a review," Opt. Lasers Eng. 35, 263-284 (2001).

[CrossRef]

G. S. Spagnolo, G. Guattari, C. Sapia, D. Ambrosini, D. Paoletti, and G. Accardo, "Contouring of artwork surface by fringe projection and FFT analysis," Opt. Lasers Eng. 33, 141-156 (2000).

[CrossRef]

G. Dinesh, J. Joby, and S. Kehar, "Object reconstruction in multilayer neural network based profilometry using grating structure comprising two regions with different spatial periods," Opt. Lasers Eng. 42, 179-192 (2004).

[CrossRef]

J. Vanherzeele, P. Guillaume, and S. Vanlanduit, "Fourier fringe processing using a regressive Fourier-transform technique," Opt. Lasers Eng. 43, 645-658 (2005).

[CrossRef]

K. J. Gåsvik, "Optical techniques," in Interferogram Analysis, D.W.Robinson and G.T.Reid, eds. (IOP, 1993), pp. 49-93.