P. Jia, J. Kofman, and C. English, "Two-step triangular-pattern phase-shifting method for three-dimensional object-shape measurement," Opt. Eng. (Bellingham) 46, 083201 (2007).

[CrossRef]

P. Jia, J. Kofman, and C. English, "Comparison of linear and non-linear calibration methods for phase-measuring profilometry," Opt. Eng. (Bellingham) 46, 043601 (2007).

[CrossRef]

P. Jia, J. Kofman, and C. English, "Multiple-step triangular-pattern phase-shifting and the influence of number of steps and pitch on measurement accuracy," Appl. Opt. 46, 3253-3262 (2007).

[CrossRef]
[PubMed]

P. Jia, J. Kofman, and C. English, "Repeated phase-offset measurement for error compensation in two-step triangular phase-shifting profilometry," Proc. SPIE 6375, 63750D (2006).

[CrossRef]

S. Zhang and P. S. Huang, "Phase error compensation for a 3-D shape measurement system based on the phase-shifting method," Proc. SPIE 6000, E1-E10 (2005).

[CrossRef]

P. S. Huang, S. Zhang, and F.-P. Chiang, "Trapezoidal phase-shifting method for the three-dimensional shape measurement," Opt. Eng. (Bellingham) 44, 123601 (2005).

[CrossRef]

J. Pan, P. S. Huang, and F. Chiang, "Color-encoded digital fringe projection technique for high-speed 3D shape measurement--color coupling and imbalance compensation," Proc. SPIE 5265, 205-212 (2004).

[CrossRef]

H. Guo, H. He, and M. Chen, "Gamma correction for digital fringe projection profilometry," Appl. Opt. 43, 2906-2914 (2004).

[CrossRef]
[PubMed]

P. S. Huang, Q. J. Hu, and F. P. Chiang, "Double three-step phase-shifting algorithm," Appl. Opt. 41, 4503-4509 (2002).

[CrossRef]
[PubMed]

C. Zhang, P. S. Huang, and F. P. Chiang, "Microscopic phase-shifting profilometry based on digital micromirror device technology," Appl. Opt. 41, 5896-5904 (2002).

[CrossRef]
[PubMed]

G. Frankowski, M. Chen, and T. Huth, "Real-time 3D shape measurement with digital strip projection by Texas Instruments Micromirror Devices DMDtrade," Proc. SPIE 3958, 90-105 (2000).

[CrossRef]

X. Y. He, D. Q. Zou, S. Liu, and Y. F. Guo, "Phase-shifting analysis in moiré interferometry and its application in electronic packaging," Opt. Eng. (Bellingham) 37, 1410-1419 (1998).

[CrossRef]

Y. B. Choi and S. W. Kim, "Phase-shifting grating projection moiré topography," Opt. Eng. (Bellingham) 37, 1005-1010 (1998).

[CrossRef]

M. Halioua and H. C. Liu, "Optical three-dimensional sensing by phase measuring profilometry," Opt. Lasers Eng. 11, 185-215 (1989).

[CrossRef]

T. Miyasaka and K. Araki, "Development of real time 3-D measurement system using intensity ratio method," in Photogrammetric Computer Vision (PCV02), Proceedings of the ISPRS Commission III (ISPRS, 2002), Vol. XXXIV, Part 3B, pp. 181-185.

J. E. Greivenkamp and J. H. Bruning, "Phase shifting interferometry," in Optical Shop Testing (Wiley, 1992), pp. 501-598.

B. Carrihill and R. Hummel, "Experiments with the intensity ratio depth sensor," in Computer Vision, Graphics and Image Processing (Academic, 1985), pp. 337-358.

[CrossRef]

G. Chazan and N. Kiryati, "Pyramidal intensity-ratio depth sensor," Tech. Rep. 121, Department of Electrical Engineering (Center for Communication and Information Technologies, Technion, Haifa, Israel, 1995).

H. Guo, H. He, and M. Chen, "Gamma correction for digital fringe projection profilometry," Appl. Opt. 43, 2906-2914 (2004).

[CrossRef]
[PubMed]

G. Frankowski, M. Chen, and T. Huth, "Real-time 3D shape measurement with digital strip projection by Texas Instruments Micromirror Devices DMDtrade," Proc. SPIE 3958, 90-105 (2000).

[CrossRef]

J. Pan, P. S. Huang, and F. Chiang, "Color-encoded digital fringe projection technique for high-speed 3D shape measurement--color coupling and imbalance compensation," Proc. SPIE 5265, 205-212 (2004).

[CrossRef]

P. S. Huang, Q. J. Hu, and F. P. Chiang, "Double three-step phase-shifting algorithm," Appl. Opt. 41, 4503-4509 (2002).

[CrossRef]
[PubMed]

C. Zhang, P. S. Huang, and F. P. Chiang, "Microscopic phase-shifting profilometry based on digital micromirror device technology," Appl. Opt. 41, 5896-5904 (2002).

[CrossRef]
[PubMed]

P. S. Huang, S. Zhang, and F.-P. Chiang, "Trapezoidal phase-shifting method for the three-dimensional shape measurement," Opt. Eng. (Bellingham) 44, 123601 (2005).

[CrossRef]

Y. B. Choi and S. W. Kim, "Phase-shifting grating projection moiré topography," Opt. Eng. (Bellingham) 37, 1005-1010 (1998).

[CrossRef]

K. Creath, "Phase-measurement interferometry techniques," in Progress in Optics, Vol. XXVI, E.Wolf, ed. (Elsevier Science, 1988), pp. 349-393.

[CrossRef]

P. Jia, J. Kofman, and C. English, "Multiple-step triangular-pattern phase-shifting and the influence of number of steps and pitch on measurement accuracy," Appl. Opt. 46, 3253-3262 (2007).

[CrossRef]
[PubMed]

P. Jia, J. Kofman, and C. English, "Two-step triangular-pattern phase-shifting method for three-dimensional object-shape measurement," Opt. Eng. (Bellingham) 46, 083201 (2007).

[CrossRef]

P. Jia, J. Kofman, and C. English, "Comparison of linear and non-linear calibration methods for phase-measuring profilometry," Opt. Eng. (Bellingham) 46, 043601 (2007).

[CrossRef]

P. Jia, J. Kofman, and C. English, "Repeated phase-offset measurement for error compensation in two-step triangular phase-shifting profilometry," Proc. SPIE 6375, 63750D (2006).

[CrossRef]

G. Frankowski, M. Chen, and T. Huth, "Real-time 3D shape measurement with digital strip projection by Texas Instruments Micromirror Devices DMDtrade," Proc. SPIE 3958, 90-105 (2000).

[CrossRef]

D. C. Ghiglia and M. D. Pritt, Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software (Wiley-Interscience, 1998).

J. E. Greivenkamp and J. H. Bruning, "Phase shifting interferometry," in Optical Shop Testing (Wiley, 1992), pp. 501-598.

X. Y. He, D. Q. Zou, S. Liu, and Y. F. Guo, "Phase-shifting analysis in moiré interferometry and its application in electronic packaging," Opt. Eng. (Bellingham) 37, 1410-1419 (1998).

[CrossRef]

M. Halioua and H. C. Liu, "Optical three-dimensional sensing by phase measuring profilometry," Opt. Lasers Eng. 11, 185-215 (1989).

[CrossRef]

X. Y. He, D. Q. Zou, S. Liu, and Y. F. Guo, "Phase-shifting analysis in moiré interferometry and its application in electronic packaging," Opt. Eng. (Bellingham) 37, 1410-1419 (1998).

[CrossRef]

S. Zhang and P. S. Huang, "Phase error compensation for a 3-D shape measurement system based on the phase-shifting method," Proc. SPIE 6000, E1-E10 (2005).

[CrossRef]

P. S. Huang, S. Zhang, and F.-P. Chiang, "Trapezoidal phase-shifting method for the three-dimensional shape measurement," Opt. Eng. (Bellingham) 44, 123601 (2005).

[CrossRef]

J. Pan, P. S. Huang, and F. Chiang, "Color-encoded digital fringe projection technique for high-speed 3D shape measurement--color coupling and imbalance compensation," Proc. SPIE 5265, 205-212 (2004).

[CrossRef]

C. Zhang, P. S. Huang, and F. P. Chiang, "Microscopic phase-shifting profilometry based on digital micromirror device technology," Appl. Opt. 41, 5896-5904 (2002).

[CrossRef]
[PubMed]

P. S. Huang, Q. J. Hu, and F. P. Chiang, "Double three-step phase-shifting algorithm," Appl. Opt. 41, 4503-4509 (2002).

[CrossRef]
[PubMed]

B. Carrihill and R. Hummel, "Experiments with the intensity ratio depth sensor," in Computer Vision, Graphics and Image Processing (Academic, 1985), pp. 337-358.

[CrossRef]

G. Frankowski, M. Chen, and T. Huth, "Real-time 3D shape measurement with digital strip projection by Texas Instruments Micromirror Devices DMDtrade," Proc. SPIE 3958, 90-105 (2000).

[CrossRef]

P. Jia, J. Kofman, and C. English, "Multiple-step triangular-pattern phase-shifting and the influence of number of steps and pitch on measurement accuracy," Appl. Opt. 46, 3253-3262 (2007).

[CrossRef]
[PubMed]

P. Jia, J. Kofman, and C. English, "Comparison of linear and non-linear calibration methods for phase-measuring profilometry," Opt. Eng. (Bellingham) 46, 043601 (2007).

[CrossRef]

P. Jia, J. Kofman, and C. English, "Two-step triangular-pattern phase-shifting method for three-dimensional object-shape measurement," Opt. Eng. (Bellingham) 46, 083201 (2007).

[CrossRef]

P. Jia, J. Kofman, and C. English, "Repeated phase-offset measurement for error compensation in two-step triangular phase-shifting profilometry," Proc. SPIE 6375, 63750D (2006).

[CrossRef]

Y. B. Choi and S. W. Kim, "Phase-shifting grating projection moiré topography," Opt. Eng. (Bellingham) 37, 1005-1010 (1998).

[CrossRef]

G. Chazan and N. Kiryati, "Pyramidal intensity-ratio depth sensor," Tech. Rep. 121, Department of Electrical Engineering (Center for Communication and Information Technologies, Technion, Haifa, Israel, 1995).

P. Jia, J. Kofman, and C. English, "Multiple-step triangular-pattern phase-shifting and the influence of number of steps and pitch on measurement accuracy," Appl. Opt. 46, 3253-3262 (2007).

[CrossRef]
[PubMed]

P. Jia, J. Kofman, and C. English, "Two-step triangular-pattern phase-shifting method for three-dimensional object-shape measurement," Opt. Eng. (Bellingham) 46, 083201 (2007).

[CrossRef]

P. Jia, J. Kofman, and C. English, "Comparison of linear and non-linear calibration methods for phase-measuring profilometry," Opt. Eng. (Bellingham) 46, 043601 (2007).

[CrossRef]

P. Jia, J. Kofman, and C. English, "Repeated phase-offset measurement for error compensation in two-step triangular phase-shifting profilometry," Proc. SPIE 6375, 63750D (2006).

[CrossRef]

M. Halioua and H. C. Liu, "Optical three-dimensional sensing by phase measuring profilometry," Opt. Lasers Eng. 11, 185-215 (1989).

[CrossRef]

X. Y. He, D. Q. Zou, S. Liu, and Y. F. Guo, "Phase-shifting analysis in moiré interferometry and its application in electronic packaging," Opt. Eng. (Bellingham) 37, 1410-1419 (1998).

[CrossRef]

T. Miyasaka and K. Araki, "Development of real time 3-D measurement system using intensity ratio method," in Photogrammetric Computer Vision (PCV02), Proceedings of the ISPRS Commission III (ISPRS, 2002), Vol. XXXIV, Part 3B, pp. 181-185.

J. Pan, P. S. Huang, and F. Chiang, "Color-encoded digital fringe projection technique for high-speed 3D shape measurement--color coupling and imbalance compensation," Proc. SPIE 5265, 205-212 (2004).

[CrossRef]

D. C. Ghiglia and M. D. Pritt, Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software (Wiley-Interscience, 1998).

S. Zhang and P. S. Huang, "Phase error compensation for a 3-D shape measurement system based on the phase-shifting method," Proc. SPIE 6000, E1-E10 (2005).

[CrossRef]

P. S. Huang, S. Zhang, and F.-P. Chiang, "Trapezoidal phase-shifting method for the three-dimensional shape measurement," Opt. Eng. (Bellingham) 44, 123601 (2005).

[CrossRef]

X. Y. He, D. Q. Zou, S. Liu, and Y. F. Guo, "Phase-shifting analysis in moiré interferometry and its application in electronic packaging," Opt. Eng. (Bellingham) 37, 1410-1419 (1998).

[CrossRef]

Q. Fang and S. Zheng, "Linearly coded profilometry," Appl. Opt. 36, 2401-2407 (1997).

[CrossRef]
[PubMed]

Q. Fang, "Linearly coded profilometry with a coding light that has isosceles triangle teeth: even-number-sample decoding method," Appl. Opt. 36, 1615-1620 (1997).

[CrossRef]
[PubMed]

P. S. Huang, Q. J. Hu, and F. P. Chiang, "Double three-step phase-shifting algorithm," Appl. Opt. 41, 4503-4509 (2002).

[CrossRef]
[PubMed]

C. Zhang, P. S. Huang, and F. P. Chiang, "Microscopic phase-shifting profilometry based on digital micromirror device technology," Appl. Opt. 41, 5896-5904 (2002).

[CrossRef]
[PubMed]

H. Guo, H. He, and M. Chen, "Gamma correction for digital fringe projection profilometry," Appl. Opt. 43, 2906-2914 (2004).

[CrossRef]
[PubMed]

P. Jia, J. Kofman, and C. English, "Multiple-step triangular-pattern phase-shifting and the influence of number of steps and pitch on measurement accuracy," Appl. Opt. 46, 3253-3262 (2007).

[CrossRef]
[PubMed]

P. Jia, J. Kofman, and C. English, "Comparison of linear and non-linear calibration methods for phase-measuring profilometry," Opt. Eng. (Bellingham) 46, 043601 (2007).

[CrossRef]

X. Y. He, D. Q. Zou, S. Liu, and Y. F. Guo, "Phase-shifting analysis in moiré interferometry and its application in electronic packaging," Opt. Eng. (Bellingham) 37, 1410-1419 (1998).

[CrossRef]

Y. B. Choi and S. W. Kim, "Phase-shifting grating projection moiré topography," Opt. Eng. (Bellingham) 37, 1005-1010 (1998).

[CrossRef]

P. Jia, J. Kofman, and C. English, "Two-step triangular-pattern phase-shifting method for three-dimensional object-shape measurement," Opt. Eng. (Bellingham) 46, 083201 (2007).

[CrossRef]

P. S. Huang, S. Zhang, and F.-P. Chiang, "Trapezoidal phase-shifting method for the three-dimensional shape measurement," Opt. Eng. (Bellingham) 44, 123601 (2005).

[CrossRef]

M. Halioua and H. C. Liu, "Optical three-dimensional sensing by phase measuring profilometry," Opt. Lasers Eng. 11, 185-215 (1989).

[CrossRef]

J. Pan, P. S. Huang, and F. Chiang, "Color-encoded digital fringe projection technique for high-speed 3D shape measurement--color coupling and imbalance compensation," Proc. SPIE 5265, 205-212 (2004).

[CrossRef]

S. Zhang and P. S. Huang, "Phase error compensation for a 3-D shape measurement system based on the phase-shifting method," Proc. SPIE 6000, E1-E10 (2005).

[CrossRef]

P. Jia, J. Kofman, and C. English, "Repeated phase-offset measurement for error compensation in two-step triangular phase-shifting profilometry," Proc. SPIE 6375, 63750D (2006).

[CrossRef]

G. Frankowski, M. Chen, and T. Huth, "Real-time 3D shape measurement with digital strip projection by Texas Instruments Micromirror Devices DMDtrade," Proc. SPIE 3958, 90-105 (2000).

[CrossRef]

B. Carrihill and R. Hummel, "Experiments with the intensity ratio depth sensor," in Computer Vision, Graphics and Image Processing (Academic, 1985), pp. 337-358.

[CrossRef]

T. Miyasaka and K. Araki, "Development of real time 3-D measurement system using intensity ratio method," in Photogrammetric Computer Vision (PCV02), Proceedings of the ISPRS Commission III (ISPRS, 2002), Vol. XXXIV, Part 3B, pp. 181-185.

G. Chazan and N. Kiryati, "Pyramidal intensity-ratio depth sensor," Tech. Rep. 121, Department of Electrical Engineering (Center for Communication and Information Technologies, Technion, Haifa, Israel, 1995).

D. C. Ghiglia and M. D. Pritt, Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software (Wiley-Interscience, 1998).

J. E. Greivenkamp and J. H. Bruning, "Phase shifting interferometry," in Optical Shop Testing (Wiley, 1992), pp. 501-598.

K. Creath, "Phase-measurement interferometry techniques," in Progress in Optics, Vol. XXVI, E.Wolf, ed. (Elsevier Science, 1988), pp. 349-393.

[CrossRef]