S. Pavageau, R. Dallier, N. Servagent, and T. Bosch, "A new algorithm for large surfaces profiling by fringe projection," Sens. Actuators, A 115, 178-184 (2004).

[CrossRef]

L. Salas, E. Luna, J. Salinas, V. Garcia, and M. Servin, "Profilometry by fringe projection," Opt. Eng. (Bellingham) 42, 3307-3314 (2003).

[CrossRef]

J. L. Li, X. Y. Su, H. J. Su, and S. S. Cha, "Removal of carrier frequency in phase-shifting techniques," Opt. Lasers Eng. 30, 107-115 (1998).

[CrossRef]

W. S. Zhou and X. Y. Su, "A direct mapping algorithm for phase-measuring profilometry," J. Mod. Opt. 41, 89-94 (1994).

[CrossRef]

V. Srinivasan, H. C. Liu, and M. Halioua, "Automated phase-measuring profilometry: a phase mapping approach," J. Opt. Soc. Am. A 24, 185-188 (1985).

S. Pavageau, R. Dallier, N. Servagent, and T. Bosch, "A new algorithm for large surfaces profiling by fringe projection," Sens. Actuators, A 115, 178-184 (2004).

[CrossRef]

J. L. Li, X. Y. Su, H. J. Su, and S. S. Cha, "Removal of carrier frequency in phase-shifting techniques," Opt. Lasers Eng. 30, 107-115 (1998).

[CrossRef]

S. Pavageau, R. Dallier, N. Servagent, and T. Bosch, "A new algorithm for large surfaces profiling by fringe projection," Sens. Actuators, A 115, 178-184 (2004).

[CrossRef]

W. T. Vetterling, W. H. Press, S. A. Teukolsky, and B. P. Flannery, Numerical Recipes Example Book (C++), 2nd ed. (Cambridge U. Press, 2002).

L. Salas, E. Luna, J. Salinas, V. Garcia, and M. Servin, "Profilometry by fringe projection," Opt. Eng. (Bellingham) 42, 3307-3314 (2003).

[CrossRef]

J. E. Greivenkamp, "Generalized data reduction for heterodyne interferometry," Opt. Eng. (Bellingham) 23, 350-352 (1984).

V. Srinivasan, H. C. Liu, and M. Halioua, "Automated phase-measuring profilometry: a phase mapping approach," J. Opt. Soc. Am. A 24, 185-188 (1985).

J. L. Li, X. Y. Su, H. J. Su, and S. S. Cha, "Removal of carrier frequency in phase-shifting techniques," Opt. Lasers Eng. 30, 107-115 (1998).

[CrossRef]

V. Srinivasan, H. C. Liu, and M. Halioua, "Automated phase-measuring profilometry: a phase mapping approach," J. Opt. Soc. Am. A 24, 185-188 (1985).

V. Srinivasan, H. C. Liu, and M. Halious, "Automated phase-measuring profilometry of 3-D diffuse objects," Appl. Opt. 23, 3105-3108 (1984).

[CrossRef]
[PubMed]

L. Salas, E. Luna, J. Salinas, V. Garcia, and M. Servin, "Profilometry by fringe projection," Opt. Eng. (Bellingham) 42, 3307-3314 (2003).

[CrossRef]

S. Pavageau, R. Dallier, N. Servagent, and T. Bosch, "A new algorithm for large surfaces profiling by fringe projection," Sens. Actuators, A 115, 178-184 (2004).

[CrossRef]

W. T. Vetterling, W. H. Press, S. A. Teukolsky, and B. P. Flannery, Numerical Recipes Example Book (C++), 2nd ed. (Cambridge U. Press, 2002).

L. Salas, E. Luna, J. Salinas, V. Garcia, and M. Servin, "Profilometry by fringe projection," Opt. Eng. (Bellingham) 42, 3307-3314 (2003).

[CrossRef]

L. Salas, E. Luna, J. Salinas, V. Garcia, and M. Servin, "Profilometry by fringe projection," Opt. Eng. (Bellingham) 42, 3307-3314 (2003).

[CrossRef]

S. Pavageau, R. Dallier, N. Servagent, and T. Bosch, "A new algorithm for large surfaces profiling by fringe projection," Sens. Actuators, A 115, 178-184 (2004).

[CrossRef]

L. Salas, E. Luna, J. Salinas, V. Garcia, and M. Servin, "Profilometry by fringe projection," Opt. Eng. (Bellingham) 42, 3307-3314 (2003).

[CrossRef]

V. Srinivasan, H. C. Liu, and M. Halioua, "Automated phase-measuring profilometry: a phase mapping approach," J. Opt. Soc. Am. A 24, 185-188 (1985).

V. Srinivasan, H. C. Liu, and M. Halious, "Automated phase-measuring profilometry of 3-D diffuse objects," Appl. Opt. 23, 3105-3108 (1984).

[CrossRef]
[PubMed]

J. L. Li, X. Y. Su, H. J. Su, and S. S. Cha, "Removal of carrier frequency in phase-shifting techniques," Opt. Lasers Eng. 30, 107-115 (1998).

[CrossRef]

J. L. Li, X. Y. Su, H. J. Su, and S. S. Cha, "Removal of carrier frequency in phase-shifting techniques," Opt. Lasers Eng. 30, 107-115 (1998).

[CrossRef]

W. S. Zhou and X. Y. Su, "A direct mapping algorithm for phase-measuring profilometry," J. Mod. Opt. 41, 89-94 (1994).

[CrossRef]

W. T. Vetterling, W. H. Press, S. A. Teukolsky, and B. P. Flannery, Numerical Recipes Example Book (C++), 2nd ed. (Cambridge U. Press, 2002).

W. T. Vetterling, W. H. Press, S. A. Teukolsky, and B. P. Flannery, Numerical Recipes Example Book (C++), 2nd ed. (Cambridge U. Press, 2002).

W. S. Zhou and X. Y. Su, "A direct mapping algorithm for phase-measuring profilometry," J. Mod. Opt. 41, 89-94 (1994).

[CrossRef]

W. S. Zhou and X. Y. Su, "A direct mapping algorithm for phase-measuring profilometry," J. Mod. Opt. 41, 89-94 (1994).

[CrossRef]

V. Srinivasan, H. C. Liu, and M. Halioua, "Automated phase-measuring profilometry: a phase mapping approach," J. Opt. Soc. Am. A 24, 185-188 (1985).

J. E. Greivenkamp, "Generalized data reduction for heterodyne interferometry," Opt. Eng. (Bellingham) 23, 350-352 (1984).

L. Salas, E. Luna, J. Salinas, V. Garcia, and M. Servin, "Profilometry by fringe projection," Opt. Eng. (Bellingham) 42, 3307-3314 (2003).

[CrossRef]

J. L. Li, X. Y. Su, H. J. Su, and S. S. Cha, "Removal of carrier frequency in phase-shifting techniques," Opt. Lasers Eng. 30, 107-115 (1998).

[CrossRef]

S. Pavageau, R. Dallier, N. Servagent, and T. Bosch, "A new algorithm for large surfaces profiling by fringe projection," Sens. Actuators, A 115, 178-184 (2004).

[CrossRef]

W. T. Vetterling, W. H. Press, S. A. Teukolsky, and B. P. Flannery, Numerical Recipes Example Book (C++), 2nd ed. (Cambridge U. Press, 2002).