Abstract

An operator algebra description of Fourier optics is used to examine the imaging properties of transmission electron microscopy when applied to the study of weak specimens. Effects due to the curvature of the incident beam, the finite extent of the source, beam tilt, and objective aperture shift are examined. An expression for the contrast transfer function is derived that can account for either beam tilt in conjunction with a centered aperture or a shifted aperture in conjunction with an aligned beam. It shows that high phase contrast over a broad spatial-frequency range can be achieved by laterally shifting the objective aperture rather than defocusing the specimen, as is normally done.

© 2003 Optical Society of America

Full Article  |  PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (4)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (98)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription