Fourth- and higher-order small-perturbation solution for scattering from dielectric rough surfaces

Abstract

A recursive solution of the small-perturbation method for rough surface scattering is presented. These results permit fourth- and higher-order corrections to rough surface scattering coefficients to be determined in a form that explicitly separates surface and electromagnetic properties. Sample results are presented for the fourth-order correction to the specular reflection coefficient of a rough surface and the sixth-order correction to incoherent scattering cross sections.

© 2003 Optical Society of America

Third-order small-perturbation method for scattering from dielectric rough surfaces

Joel T. Johnson
J. Opt. Soc. Am. A 16(11) 2720-2736 (1999)

Scattering of electromagnetic waves from 3D multilayer random rough surfaces based on the second-order small perturbation method: energy conservation, reflectivity, and emissivity

Mohammadreza Sanamzadeh, Leung Tsang, Joel T. Johnson, Robert J. Burkholder, and Shurun Tan
J. Opt. Soc. Am. A 34(3) 395-409 (2017)

Second-order perturbation theory for scattering from heterogeneous rough surfaces

Charles-Antoine Guérin and Anne Sentenac
J. Opt. Soc. Am. A 21(7) 1251-1260 (2004)

High-order perturbation theory for light scattering from a rough metal surface

K. A. ODonnell
J. Opt. Soc. Am. A 18(7) 1507-1518 (2001)

Scattering from slightly rough random surfaces: a detailed study on the validity of the small perturbation method

J. M. Soto-Crespo, M. Nieto-Vesperinas, and A. T. Friberg
J. Opt. Soc. Am. A 7(7) 1185-1201 (1990)