Abstract

The problem of the in-plane scattering of a TE guided wave by both waveguidesurface roughness and refractive-index fluctuations has been analyzed. Simple formulas emerge for the relative strength of the two scattering mechanisms and for the power collected by an off-axis detector. The theory is illustrated by applying it to the case of a step-index slab waveguide.

© 1985 Optical Society of America

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