Abstract

In our previous paper [J. Opt. Soc. Am. A 15, 101 (1998)], the integral equations that are suitable for simulations of near-field optics with use of an uncoated dielectric probe were proposed. We extend the integral equations to near-field optical circuits by using a metal-coated dielectric probe with an aperture. The derivation of the integral equations is described in detail for the incident TM mode, because it is impossible to derive them with the same procedures as those used in the case of the uncoated dielectric probe. Simulations of the illumination/collection mode of a two-dimensional scanning near-field optical microscope (2D-SNOM) are performed. All numerical results satisfy the energy conservation law within an accuracy of 1%. One-dimensional scanning images of a 2D-SNOM obtained by using the metal-coated dielectric probe with an aperture and those obtained by using the uncoated dielectric probe are compared, and advantages of the metal-coated dielectric probe are described.

© 2001 Optical Society of America

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