Abstract

Simple analytical relations for reflection and transmission matrices of plane-parallel layers of random media with discrete particles are presented. They can be used for rapid estimation of intensity and polarization characteristics of reflected and transmitted light beams under arbitrary illumination of a layer. The accuracy of the analytical formulas obtained increases with the optical thickness τ of a layer. Thus equations are applicable only at large values of τ (τ>5). Another limitation is due to the probability of photon absorption β, which should be rather low (β<0.050.1, depending on the optical characteristics in question).

© 2001 Optical Society of America

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