Differential reflection phase shift under conditions of attenuated internal reflection

Abstract

The angle-of-incidence dependence of the differential reflection phase shift Δ between p and s polarizations is considered a function of the real and imaginary parts of the relative complex dielectric function ε of an interface in the domain of fractional optical constants, i.e., under conditions of internal reflection. The constraint on complex ε such that oscillatory and monotonic angular responses are obtained is determined. A sensitive and stable technique, which is based on attenuated internal reflection ellipsometry between the Brewster angle and the critical angle, is proposed for measuring small induced absorption $({\epsilon }_i\sim {10}^{-5})$ in the medium of refraction.

© 1999 Optical Society of America

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