Abstract

The properties of planar-integrated imaging systems are studied on the basis of algebraic ray tracing. A third-order approximation yields analytical expressions for ray aberrations in the image plane. Ray aberrations are compared with the diffraction-limited spot size to estimate optimum system performance from the minimum of the second moment of the point-spread function. We use as a figure of merit the space–bandwidth product of the planar imaging setups. The investigation is restricted to imaging systems consisting of three optical elements.

© 1999 Optical Society of America

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