Abstract

The concept of a conducting surface is applied to the description of dielectric multilayers with very thin absorbing films at layer boundaries. Recursive formulas are derived for calculation of multilayer parameters on the basis of the admittance method with arbitrary incidence angles. An expression is found for the characteristic matrix of a conducting surface. Quarter-wavelength dielectric mirrors with boundary losses are investigated, and some simple analytical expressions are found. The possibility of use of the proposed method in the case of boundaries that scatter the light is discussed. Surface radiation conductance is introduced as a characteristic of integral light scattering at a boundary.

© 1998 Optical Society of America

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