Determination of optical constants of absorbing crystalline thin films from reflectance and transmittance measurements with oblique incidence

Optical Constants (at λ = 632.8 nm) and Thickness of the CdS Film, Fitted from the Measured Data of Reflectance and Transmittance versus Incident Angles

Residual Error^a of the Least-Squares Fit for the Optical Constants (at λ = 632.8 nm) and Thickness Shown in Table 1

a The maximal residual errors of the least-squares fits, Δ_max (%), are defined by maximum of the quantities $$\begin{array}{l}\frac{|R^{(\text{calc})}(n)-R^{(\text{meas})}(n)|}{R^{(\text{meas})}(n)}\times 100\%\hspace{0.17em}n=1,2,\dots ,N,\\ \frac{|T^{(\text{calc})}(n)-T^{(\text{meas})}(n)|}{T^{(\text{meas})}(n)}\times 100\%\hspace{0.17em}n=1,2,\dots ,N\end{array}$$for fits of reflectance and transmittance data, respectively. The average fitting errors, 〈δ〉 (%), are defined by $$\begin{array}{l}〈\delta 〉\hspace{0.17em}(\%)=\frac{100\%}{N}\text{∑}_{n=1}^N{\left[1-\frac{R^{(\text{calc})}(n)}{R^{(\text{meas})}(n)}\right]}^2,\\ 〈\delta 〉\hspace{0.17em}(\%)=\frac{100\%}{N}\text{∑}_{n=1}^N{\left[1-\frac{T^{(\text{calc})}(n)}{T^{(\text{meas})}(n)}\right]}^2\end{array}$$for fits of reflectance and transmittance data, respectively, with superscripts calc and meas indicating calculated and measured data.

Table 1

Optical Constants (at λ = 632.8 nm) and Thickness of the CdS Film, Fitted from the Measured Data of Reflectance and Transmittance versus Incident Angles

Table 2

Residual Error^a of the Least-Squares Fit for the Optical Constants (at λ = 632.8 nm) and Thickness Shown in Table 1

a The maximal residual errors of the least-squares fits, Δ_max (%), are defined by maximum of the quantities $$\begin{array}{l}\frac{|R^{(\text{calc})}(n)-R^{(\text{meas})}(n)|}{R^{(\text{meas})}(n)}\times 100\%\hspace{0.17em}n=1,2,\dots ,N,\\ \frac{|T^{(\text{calc})}(n)-T^{(\text{meas})}(n)|}{T^{(\text{meas})}(n)}\times 100\%\hspace{0.17em}n=1,2,\dots ,N\end{array}$$for fits of reflectance and transmittance data, respectively. The average fitting errors, 〈δ〉 (%), are defined by $$\begin{array}{l}〈\delta 〉\hspace{0.17em}(\%)=\frac{100\%}{N}\text{∑}_{n=1}^N{\left[1-\frac{R^{(\text{calc})}(n)}{R^{(\text{meas})}(n)}\right]}^2,\\ 〈\delta 〉\hspace{0.17em}(\%)=\frac{100\%}{N}\text{∑}_{n=1}^N{\left[1-\frac{T^{(\text{calc})}(n)}{T^{(\text{meas})}(n)}\right]}^2\end{array}$$for fits of reflectance and transmittance data, respectively, with superscripts calc and meas indicating calculated and measured data.